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Heijne
Erik Henricus M. Heijne, Meyrin CH
| Patent application number | Description | Published |
|---|---|---|
| 20090057562 | METHOD, APPARATUS AND COMPUTER PROGRAM FOR MEASURING THE DOSE, DOSE RATE OR COMPOSITION OF RADIATION - A method and an apparatus for measuring the dose, the dose rate and/or the composition of radiation is disclosed. In the method, a detector means is exposed to a radiation environment, the detector means comprising an array of radiation sensing detector elements. The detector means is switched in a sensitive state for the duration of a sensitive time period, and during said sensitive time period, an interaction pattern generated by individual radiation quanta interacting with one or more of the detector elements is recorded. The duration of the sensitive time period can be precisely adapted to the intensity of the radiation that has to be recorded. The interaction pattern is analyzed to distinguish individual radiation quanta received during the sensitive time period, and a radiation category is assigned to each of the distinguished radiation quanta based on its corresponding interaction pattern. A dose, a dose rate and/or a composition of radiation is then computed from the detected and categorized radiation quanta. Weight factors are attributed to each radiation category to take into account the individual degree of damage which the corresponding category can inflict in the irradiated materials. | 03-05-2009 |
| 20110297836 | METHOD, APPARATUS AND COMPUTER PROGRAM FOR MEASURING THE DOSE, DOSE RATE OR COMPOSITION OF RADIATION - A method and an apparatus for measuring the dose, the dose rate and/or the composition of radiation is disclosed. In the method, a detector means is exposed to a radiation environment, the detector means comprising an array of radiation sensing detector elements. The detector means is switched in a sensitive state for the duration of a sensitive time period, and during said sensitive time period, an interaction pattern generated by individual radiation quanta interacting with one or more of the detector elements is recorded. The duration of the sensitive time period can be precisely adapted to the intensity of the radiation that has to be recorded. The interaction pattern is analyzed to distinguish individual radiation quanta received during the sensitive time period, and a radiation category is assigned to each of the distinguished radiation quanta based on its corresponding interaction pattern. A dose, a dose rate and/or a composition of radiation is then computed from the detected and categorized radiation quanta. Weight factors are attributed to each radiation category to take into account the individual degree of damage which the corresponding category can inflict in the irradiated materials. | 12-08-2011 |
Erik Henricus M. Heijne, Val D'Llliez CH
| Patent application number | Description | Published |
|---|---|---|
| 20120006991 | Method, Apparatus and Computer Program for Measuring the Dose, Dose Rate of Composition of Radiation - A method and an apparatus for measuring the dose, the dose rate and/or the composition of radiation is disclosed. In the method, a detector means is exposed to a radiation environment, the detector means comprising an array of radiation sensing detector elements. The detector means is switched in a sensitive state for the duration of a sensitive time period, and during said sensitive time period, an interaction pattern generated by individual radiation quanta interacting with one or more of the detector elements is recorded. The duration of the sensitive time period can be precisely adapted to the intensity of the radiation that has to be recorded. The interaction pattern is analyzed to distinguish individual radiation quanta received during the sensitive time period, and a radiation category is assigned to each of the distinguished radiation quanta based on its corresponding interaction pattern. A dose, a dose rate and/or a composition of radiation is then computed from the detected and categorized radiation quanta. Weight factors are attributed to each radiation category to take into account the individual degree of damage which the corresponding category can inflict in the irradiated materials. | 01-12-2012 |
Henricus M. Heijne, Meyrin CH
| Patent application number | Description | Published |
|---|---|---|
| 20080251730 | Method for Determining a Particle and Sensor Device Therefor - A method for determining a particle impact on a sensor device comprising M sensing areas, each impact causing a variation of at least one physical magnitude of several sensing portions, said method comprising the steps of: determining an impact center sensing area, where the variation of the at least one physical magnitude is substantially maximal, allocating a result of a sum of the physical magnitude variations of a first set of N sensing areas, said set including the impact center area and other sensing areas neighboring said impact center sensing area, where N is at least 2 and is strictly less than M. | 10-16-2008 |
Henrious M Heijne, Meyrin CH
| Patent application number | Description | Published |
|---|---|---|
| 20120126131 | PIXILATED RADIATION SENSING DEVICE - A radiation sensing device subdivided in N*M pixels, comprising: a conversion part to convert an impinging radiation into an electrical signal, a processing part having: for each pixel, at least two counters associated to different regions, so that a ratio of counters to pixels is at least equal to 2, an arbitration circuit which, for each pixel: receives detection information from the pixel and neighbouring pixels, taking into account detection information for the pixel and neighbouring pixels, allocates a detection value to an elected counter. | 05-24-2012 |