Patent application number | Description | Published |
20080309851 | FLAT LIGHT SOURCE UNIT, METHOD FOR MANUFACTURING THE SAME, AND BACKLIGHT ASSEMBLY AND LIQUID CRYSTAL DISPLAY HAVING THE SAME - A flat light source unit includes a discharge tube including discharge channels and partitions formed between the discharge channels, a main electrode portion formed at first and second ends of the discharge channels, a sub-electrode portion connected to the main electrode portion, and a thermistor connected between the main electrode portion and the sub-electrode portion and having a resistance value which changes depending on temperature. There are also provided a method for manufacturing the flat light source unit, and a backlight assembly and a liquid crystal display (“LCD”) having the flat light source unit. | 12-18-2008 |
20090174307 | FLUORESCENT MIXTURE FOR FLUORESCENT LAMP, FLUORESCENT LAMP, BACKLIGHT ASSEMBLY HAVING THE SAME AND DISPLAY DEVICE HAVING THE SAME - A fluorescent lamp includes a lamp body, a fluorescent layer and a discharge electrode. The lamp body has a discharge space in which ultraviolet light is generated. The fluorescent layer is formed on an inner surface of the lamp body to change the ultraviolet light into visible light. The discharge electrode is on an end portion of the lamp body to apply a voltage to the discharge space. A ratio of intensities of the visible light at wavelengths of about 545 nm and about 516 nm is about 1.32:1 to about 1.71:1. Therefore, color reproducibility and luminance may be improved. | 07-09-2009 |
20090284949 | OPTICAL ELEMENT, LIGHT-EMITTING DEVICE HAVING THE SAME AND METHOD OF MANUFACTURING THE SAME - An optical element includes a light-transmitting structure and a first reflection-prevention layer. The light-transmitting structure has a first surface and a second surface facing the first surface. The first reflection-prevention layer includes a plurality of first light-refractive index buffering particles deposited on the first surface such as the concentration of the particles decreases as the distance from the first surface increases. The first reflection-prevention layer decreases the variation of a light-refractive index from the light-transmitting structure to an air layer to decrease the light reflectance of the first surface. Therefore, the light transmittance of the light-transmitting structure is increased due to the reflection-prevention layer formed on a surface of the light-transmitting structure, so that luminance may be enhanced. Moreover, the reflection-prevention layer may enhance the resistance of the light-transmitting structure to external impacts. | 11-19-2009 |
20100201718 | LIGHT EMITTING LAMP, BACKLIGHT ASSEMBLY AND DISPLAY DEVICE HAVING THE SAME - A light emitting lamp, a backlight assembly and a display device including the same are provided. The light emitting lamp includes a lamp tube longitudinally extended along an extension line, and a plurality of set electrodes disposed on a periphery of the lamp tube and along the extension line. The periphery of the lamp tube is divided into a first region and a second region by a plane including the extension line, and each of the set electrodes includes a first electrode disposed on the first region and a second electrode disposed on the second region. | 08-12-2010 |
20100246931 | INSPECTION METHOD - In order to set an inspection area, a measurement target is disposed onto a stage, a reference data of the measurement target is summoned, and a measurement data of the measurement target is acquired. Then, at least one feature object is selected in the measurement data and the reference data of the measurement target, and at least one feature variable for the selected feature object is extracted from each of the reference data and the measurement data. Thereafter, a change amount of the measurement target is produced by using the feature variable and a quantified conversion formula, and the produced change amount is compensated for to set an inspection area. Thus, the distortion of the measurement target is compensated for to correctly set an inspection area. | 09-30-2010 |
20100276686 | THIN FILM TRANSISTOR SUBSTRATE AND METHOD OF FABRICATING THE SAME - A thin film transistor (TFT) substrate and a method of fabricating the same are provided. The thin film transistor substrate may have low resistance characteristics and may have reduced mutual diffusion and contact resistance between an active layer pattern and data wiring. The thin film transistor substrate may include gate wiring formed on an insulating substrate. Oxide active layer patterns may be formed on the gate wiring and may include a first substance. Data wiring may be formed on the oxide active layer patterns to cross the gate wiring and may include a second substance. Barrier layer patterns may be disposed between the oxide active layer patterns and the data wiring and may include a third substance. | 11-04-2010 |
20120127486 | METHOD OF INSPECTING A SUBSTRATE - A method of inspecting a substrate is disclosed. The method of inspecting a substrate, comprises: obtaining phase data per projecting part with regard to a substrate, by projecting pattern beam onto the substrate having a target object formed thereon through a plurality of projecting parts in sequence; obtaining height data per projecting part with regard to the substrate by using the phase data per the projecting part; compensating tilt of the height data by using the height data per projecting part; modifying the tilt-compensated height data per projecting part; and obtaining integrated height data by using the modified height data. | 05-24-2012 |
20130039563 | METHOD OF GENERATING INSPECTION PROGRAM - A method of generating an inspection program that does not have a gerber file is shown. To generate the inspection program, a first image information is acquired by scanning a bare board, a second image information is acquired by scanning a solder-pasted board that solder is pasted on a pad area of the bare board, and by analyzing the first image information and the second image information an inspection program is generated. The first image information and the second image information may include at least one of a two-dimensional image information and a three-dimensional image information. The step for generating an inspection program calculates a difference between the first image information and the second image information, after extracting a position and a size of an area in which the difference occurs, then generates the inspection program by using the extracted information. Therefore, a bare board and a solder-pasted board may be each inspected and the accurate position and size of the solder pasted area may be extracted through analyzing the acquired two-dimensional image information or a three-dimensional image information differences. | 02-14-2013 |