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Hachiya, JP
Akira Hachiya, Haga-Gun JP
| Patent application number | Description | Published |
|---|---|---|
| 20100323347 | Method for Evaluating or Selecting Agent for Preventing or Curing Photodamage of Skin - A method for evaluating or selecting a substance capable of preventing or curing photodamage of skin is provided. Provided is a method for evaluating or selecting an agent for preventing or curing photodamage of skin, the method including: (A) contacting cells that are capable of expressing TIMP-1 gene or TIMP-1 protein, with a test substance; (B) measuring the expression level of the TIMP-1 gene or the TIMP-1 protein in the cells; (C) comparing the expression level obtained in (B), with the expression level of TIMP-1 gene or TIMP-1 protein in a control group in which the cells capable of expressing TIMP-1 gene or TIMP-1 protein have not been contacted with the test substance; and (D) evaluating or selecting the test substance which increases the expression level of TIMP-1 gene or TIMP-1 protein, as an agent for preventing or curing photodamage of skin, based on the results of (C). | 12-23-2010 |
Akira Hachiya, Tochigi JP
| Patent application number | Description | Published |
|---|---|---|
| 20080263686 | ANIMAL MODEL FOR PIGMENT SPOTS - An animal model for pigment spots in which the formation of pigment spots in human skin is faithfully simulated is provided. An animal model for pigment spots, wherein a black person's skin is grafted onto a non-human animal, is provided. | 10-23-2008 |
Hidetoshi Hachiya, Osaka JP
| Patent application number | Description | Published |
|---|---|---|
| 20100197355 | Mobile Terminal, Display Switching Method and Display Switching Program - A mobile terminal is a transformable terminal such as a sliding mobile telephone and a folding mobile telephone. The mobile terminal includes a sensor for detecting whether or not the mobile terminal is in a predetermined form. When keys for entering characters are exposed and the sensor detects that the mobile terminal is in the predetermined form, the mobile terminal displays a reply mail. When the sensor detects that the mobile terminal is not in the predetermined form, the mobile terminal displays the received mail. Thus, the mobile terminal can switch display content between the reply mail and the received mail by a simple operation of changing a form of the mobile terminal. | 08-05-2010 |
Hiroshi Hachiya, Okayama-Ken JP
| Patent application number | Description | Published |
|---|---|---|
| 20080234444 | Method for Efficiently Producing an Aromatic Polycarbonate - It is a task of the present invention to provide a method which enables the production of a high quality, high performance aromatic polycarbonate (which is colorless and has excellent mechanical properties) from a molten aromatic polycarbonate prepolymer obtained from an aromatic dihydroxy compound and a diaryl carbonate, wherein the polycarbonate can be stably produced on a commercial scale at 1 to 50 t/hr for a long time without the need for a large amount of an inert gas. In the present invention, this task has been accomplished by a method for producing an aromatic polycarbonate by the melt transesterification process, in which the prepolymer is caused to absorb a specific amount of an inert gas, followed by polymerization using a guide-wetting fall polymerizer device having a specific structure, whereby a high quality, high performance aromatic polycarbonate as mentioned above can be stably produced on a commercial scale at 1 to 50 t/hr for a long time (more than several thousand hours, e.g., as long as 5,000 hours) without fluctuation of the molecular weight thereof. | 09-25-2008 |
| 20080255324 | Method For Stably Producing an Aromatic Polycarbonate - A method for stably producing an aromatic polycarbonate, which comprises continuously reacting an aromatic dihydroxy compound with a diaryl carbonate in a closed, reactor-pipeline system, the closed, reactor-pipeline system comprising: a plurality of reactors which are liquid-tightly connected through a pipeline toward an outlet for a final aromatic polycarbonate product, the pipeline comprising one or more pipes, wherein the plurality of reactors include at least two reactors connected in series, and at least one filter secured in the pipe or pipes of the reactor-pipeline system, wherein the or each filter is simultaneously or separately taken out to the outside of the reactor-pipeline system and subjected to washing in the outside of the reactor-pipeline system, followed by returning of the resultant washed filter into the inside of the pipe or pipes of the reactor-pipeline system, the washing being performed with the below-mentioned washing agents used in the following order: an aqueous solution of a basic compound, an aromatic monohydroxy compound, and a molten mixture of an aromatic dihydroxy compound and a diaryl carbonate, the molten mixture containing a basic compound. | 10-16-2008 |
Kimiko Hachiya, Tokorozawa JP
| Patent application number | Description | Published |
|---|---|---|
| 20090187354 | INSPECTION APPARATUS AND INSPECTION METHOD - The invention is directed to detect a warp amount in a real-time manner in a wafer rotating at high speed under inspection. An inspection apparatus includes: a first light irradiating unit for irradiating an object to be inspected with light; a first detector for detecting scattered light from the object to be inspected; a second light irradiating unit for irradiating the object to be inspected with light; a second detector for detecting light reflected from the object to be inspected, of light of the second light irradiating unit; a stage for moving an object to be inspected, which moves the object to be inspected so as to change irradiation positions on the object to be inspected, of the light of the first light irradiating unit and the light of the second light irradiating unit; an inspection coordinate detector for outputting information of coordinates of a position irradiated with light; an elevation control circuit for outputting height information of the object to be inspected on the basis of a detection signal from the second detector; and a data processing unit for calculating a warp amount of the object to be inspected on the basis of the information of the position coordinates from the inspection coordinate detector and the height information from the elevation control circuit. | 07-23-2009 |
Masaaki Hachiya, Aichi JP
| Patent application number | Description | Published |
|---|---|---|
| 20110151254 | ELECTRO-CONDUCTIVE FIBERS WITH CARBON NANOTUBES ADHERED THERETO, ELECTRO-CONDUCTIVE YARN, FIBERS STRUCTURAL OBJECT, AND PRODUCTION PROCESSES THEREOF - Electro-conductive fibers comprise synthetic fibers and an electro-conductive layer containing carbon nanotubes and covering a surface of the synthetic fibers, and the coverage of the electro-conductive layer relative to the whole surface of the synthetic fibers is not less than 60% (particularly not less than 90%). The electric resistance value of the electro-conductive fibers ranges from 1×10 | 06-23-2011 |
Masayuki Hachiya, Tokorozawa JP
| Patent application number | Description | Published |
|---|---|---|
| 20080297781 | WAFER SURFACE INSPECTION APPARATUS AND WAFER SURFACE INSPECTION METHOD - A wafer surface inspection method and apparatus of high sensitivity, and free from performance degradation in terms of cleanliness, coordinate repeatability of foreign particles and the like. Gas for cooling is sprayed onto a laser irradiation position on the wafer surface to prevent an increase in temperature of the foreign particles and to suppress break-down of the foreign particles. | 12-04-2008 |
| 20080297782 | WAFER SURFACE INSPECTION APPARATUS AND WAFER SURFACE INSPECTION METHOD - A wafer surface inspection method and apparatus of high sensitivity, and free from performance degradation in terms of cleanliness, coordinate repeatability of foreign particles and the like. Gas for cooling is sprayed onto a laser irradiation position on the wafer surface to prevent an increase in temperature of the foreign particles and to suppress break-down of the foreign particles. | 12-04-2008 |
| 20090187354 | INSPECTION APPARATUS AND INSPECTION METHOD - The invention is directed to detect a warp amount in a real-time manner in a wafer rotating at high speed under inspection. An inspection apparatus includes: a first light irradiating unit for irradiating an object to be inspected with light; a first detector for detecting scattered light from the object to be inspected; a second light irradiating unit for irradiating the object to be inspected with light; a second detector for detecting light reflected from the object to be inspected, of light of the second light irradiating unit; a stage for moving an object to be inspected, which moves the object to be inspected so as to change irradiation positions on the object to be inspected, of the light of the first light irradiating unit and the light of the second light irradiating unit; an inspection coordinate detector for outputting information of coordinates of a position irradiated with light; an elevation control circuit for outputting height information of the object to be inspected on the basis of a detection signal from the second detector; and a data processing unit for calculating a warp amount of the object to be inspected on the basis of the information of the position coordinates from the inspection coordinate detector and the height information from the elevation control circuit. | 07-23-2009 |
| 20100188656 | Surface Inspection Method and Surface Inspection Apparatus - Light from a light source becomes two illumination beams by a beam splitter. The beams are irradiated onto a semiconductor wafer from two mutually substantially orthogonal azimuthal angles having substantially equal elevation angles to form illumination spots. When the sum of scattered, diffracted, and reflected lights due to the illumination beams is detected, influence of the anisotropy which a contaminant particle and a defect existing in the wafer itself or thereon have with respect to an illumination direction, can be eliminated. | 07-29-2010 |
| 20110141461 | Surface Inspection Method and Surface Inspection Apparatus - Light from a light source becomes two illumination beams by a beam splitter. The beams are irradiated onto a semiconductor wafer from two mutually substantially orthogonal azimuthal angles having substantially equal elevation angles to form illumination spots. When the sum of scattered, diffracted, and reflected lights due to the illumination beams is detected, influence of the anisotropy which a contaminant particle and a defect existing in the wafer itself or thereon have with respect to an illumination direction, can be eliminated. | 06-16-2011 |
Rieko Hachiya, Tokorozawa JP
| Patent application number | Description | Published |
|---|---|---|
| 20090187354 | INSPECTION APPARATUS AND INSPECTION METHOD - The invention is directed to detect a warp amount in a real-time manner in a wafer rotating at high speed under inspection. An inspection apparatus includes: a first light irradiating unit for irradiating an object to be inspected with light; a first detector for detecting scattered light from the object to be inspected; a second light irradiating unit for irradiating the object to be inspected with light; a second detector for detecting light reflected from the object to be inspected, of light of the second light irradiating unit; a stage for moving an object to be inspected, which moves the object to be inspected so as to change irradiation positions on the object to be inspected, of the light of the first light irradiating unit and the light of the second light irradiating unit; an inspection coordinate detector for outputting information of coordinates of a position irradiated with light; an elevation control circuit for outputting height information of the object to be inspected on the basis of a detection signal from the second detector; and a data processing unit for calculating a warp amount of the object to be inspected on the basis of the information of the position coordinates from the inspection coordinate detector and the height information from the elevation control circuit. | 07-23-2009 |
Shogo Hachiya, Fukuoka JP
| Patent application number | Description | Published |
|---|---|---|
| 20090039858 | DIRECT CURRENT POWER SUPPLY DEVICE - A direct-current power supply apparatus outputs a predetermined output voltage by lowering an input voltage. The apparatus includes a control element to which the input voltage is inputted, a first resistive element, provided in series with the control element, which outputs the output voltage, and second and third resistive elements, connected in series with each other, which are provided in parallel with the first resistive element. A voltage at a midpoint between the second resistive element and the third resistive element is fed back so as to control the control element. | 02-12-2009 |
Shogo Hachiya, Tokyo JP
| Patent application number | Description | Published |
|---|---|---|
| 20090160414 | COMPARATOR-SYSTEM DC-DC CONVERTER - The comparator-system DC-DC converter | 06-25-2009 |
| 20090237049 | COMPARATOR TYPE DC-DC CONVERTER - A comparator-system DC-DC converter | 09-24-2009 |
Shunichiro Hachiya, Tokyo JP
| Patent application number | Description | Published |
|---|---|---|
| 20090062366 | Pyrrolidine derivative or salt thereof - [Problem] To provide a compound which may be used in treating diseases in which a calcium sensing receptor (CaSR) is concerned, particularly hyperparathyroidism. | 03-05-2009 |
| 20100029687 | PIPERIDINE DERIVATIVE OR SALT THEREOF - [Problem] To provide a compound which can be used for treating diseases in which a calcium sensing receptor (CaSR) participates, particularly hyperparathyroidism. | 02-04-2010 |
Takashi Hachiya, Tokyo JP
| Patent application number | Description | Published |
|---|---|---|
| 20080262426 | Controller - A controller which can be kept clean easily and has no influence on magnetism is provided. | 10-23-2008 |
Toru Hachiya, Kurokawa-Gun JP
| Patent application number | Description | Published |
|---|---|---|
| 20080283726 | BACKSIDE ILLUMINATED IMAGING DEVICE, SEMICONDUCTOR SUBSTRATE, IMAGING APPARATUS AND METHOD FOR MANUFACTURING BACKSIDE ILLUMINATED IMAGING DEVICE - A backside illuminated imaging device performs imaging by illuminating light from a back side of a p substrate to generate electric charges in the substrate based on the light and reading out the electric charges from a front side of the substrate. The device includes n layers located in the substrate and on an identical plane near a front side surface of the substrate and accumulating the electric charges; n+ layers between the respective n layers and the front side of the substrate, the n+ layers having an exposed surface exposed on the front side surface of the substrate and functioning as overflow drains for discharging unnecessary electric charges accumulated in the n layers; p+ layers between the respective n+ layers and the n layers and functioning as overflow barriers of the overflow drains; and an electrode connected to the exposed surface of each of the n+ layers. | 11-20-2008 |
| 20100291730 | BACKSIDE ILLUMINATED IMAGING DEVICE, SEMICONDUCTOR SUBSTRATE, IMAGING APPARATUS AND METHOD FOR MANUFACTURING BACKSIDE ILLUMINATED IMAGING DEVICE - A backside illuminated imaging device performs imaging by illuminating light from a back side of a p substrate to generate electric charges in the substrate based on the light and reading out the electric charges from a front side of the substrate. The device includes n layers located in the substrate and on an identical plane near a front side surface of the substrate and accumulating the electric charges; n+ layers between the respective n layers and the front side of the substrate, the n+ layers having an exposed surface exposed on the front side surface of the substrate and functioning as overflow drains for discharging unnecessary electric charges accumulated in the n layers; p+ layers between the respective n+ layers and the n layers and functioning as overflow barriers of the overflow drains; and an electrode connected to the exposed surface of each of the n+ layers. | 11-18-2010 |
Toshikatsu Hachiya, Nagoya-Shi JP
| Patent application number | Description | Published |
|---|---|---|
| 20080314569 | EGR cooler - To provide an EGR cooler which has a small number of parts and achieves compact design with low cost. A plurality of flat tubes, each having a bottom to close an end thereof, is arranged in parallel. An opening of each of the flat tubes penetrates through a tube plate. Corrugated fins are placed in each of the flat tubes, thus forming a core. A casing encloses the outer circumferential surface of the core. The tube plate closes the opening of a tank body equipped with a partition. The edge of the partition is placed at an intermediate position in the width direction of the opening of the flat tube. | 12-25-2008 |
Toshinori Hachiya, Tokyo JP
| Patent application number | Description | Published |
|---|---|---|
| 20110089027 | CATHODE FOR HYDROGEN GENERATION AND METHOD FOR PRODUCING THE SAME - The present invention provides an excellent durable cathode for hydrogen generation, which has a low hydrogen overvoltage and reduced dropping-off of a catalyst layer against the reverse current generated when an electrolyzer is stopped, and a method for producing the same. The present invention provides a cathode for hydrogen generation having a conductive base material and a catalyst layer formed on the conductive base material, wherein the catalyst layer includes crystalline iridium oxide, platinum and iridium-platinum alloy. | 04-21-2011 |
Yoshiaki Hachiya, Shiga JP
| Patent application number | Description | Published |
|---|---|---|
| 20080278981 | SWITCHING CONTROL DEVICE - The present invention reduces switching noise generated in a switching control device having a switching element such as a switching power supply in linear linkage with the state of a load of the output and without increasing the control circuit scale which is a factor of cost increase. The present invention adopts a configuration of a control circuit having an ON/OFF circuit that controls the switching element such that one or both of two specified values (upper limit and lower limit) that specify triangular waves of a triangular wave generation circuit that specifies a drive oscillating frequency of the switching element is/are changed in linear linkage with the output load state. | 11-13-2008 |
| 20090153116 | SWITCHING CONTROLLER AND SEMICONDUCTOR DEVICE USED IN THE SAME - According to the present invention, in a switching power supply, a feedback signal from an output voltage detection circuit | 06-18-2009 |
| 20100033992 | SWITCHING POWER SUPPLY CONTROLLER AND SEMICONDUCTOR DEVICE USED FOR THE SAME - In the present invention, according to a time from when a switching element | 02-11-2010 |
| 20100073964 | SWITCHING CONTROL CIRCUIT AND SWITCHING POWER SUPPLY - A switching element controls supply of a primary current to a transformer in a switching power supply. An amplifier circuit amplifies an output ripple of an auxiliary winding of a transformer. A fluctuation generator circuit generates a fluctuating signal, based on an output of the amplifier circuit. A basic signal generator circuit generates a PWM basic signal whose frequency fluctuates according to the fluctuating signal. A control circuit ON controls the switching element when receiving the PWM basic signal, and OFF controls the switching element when receiving an OFF signal based on output feedback of the switching power supply. | 03-25-2010 |
| 20100073967 | SWITCHING CONTROL CIRCUIT AND SWITCHING POWER SUPPLY - A switching element controls supply of a primary current to a transformer. A basic signal generator circuit generates a PWM basic signal regardless of a control condition of the switching element. A timer circuit measures an elapsed, predetermined longer time than one cycle of the PWM basic signal since a start of ON control of the switching element. A control circuit ON controls the switching element when receiving the PWM basic signal, and OFF controls the switching element when receiving either one of a first OFF signal based on output feedback of a switching power supply and a second OFF signal based on completion of time measuring by the timer circuit. | 03-25-2010 |
Yosuke Hachiya, Nirasaki JP
| Patent application number | Description | Published |
|---|---|---|
| 20110277793 | LIQUID PROCESSING APPARATUS, LIQUID PROCESSING METHOD AND COMPUTER-READABLE STORAGE MEDIUM STORING LIQUID PROCESSING PROGRAM - There is provided a liquid processing method for performing a liquid process on a front surface of a substrate by using a processing solution and then performing a rinse process on the front surface of the substrate by using a rinse solution having a temperature lower than a temperature of the processing solution. The liquid processing method includes performing an intermediate process between the liquid process and the rinse process, for adjusting a temperature of the front surface of the substrate to a temperature higher than the temperature of the rinse solution and lower than the temperature of the processing solution. | 11-17-2011 |