Guevarra
Dan Guevarra, Norwalk, CA US
Patent application number | Description | Published |
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20140011342 | METHODS AND APPARATUSES FOR FORMING SEMICONDUCTOR FILMS - Described herein are systems and methods method for forming semiconductor films. In some embodiment, the methods comprising depositing the source solution containing a solvent and plurality of types of metal ionic species and a second type on a substrate heated to a temperature at or above the boiling point of the solvent. In some embodiments, methods and apparatus for exposing a substrate to a gas are also provided. | 01-09-2014 |
Dan W. Guevarra, Norwalk, CA US
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20150212036 | SCANNING DROP SENSOR - Electrochemical or electrochemical and photochemical experiments are performed on a collection of samples by suspending a drop of electrolyte solution between an electrochemical experiment probe and one of the samples that serves as a test sample. During the electrochemical experiment, the electrolyte solution is added to the drop and an output solution is removed from the drop. The probe and collection of samples can be moved relative to one another so the probe can be scanned across the samples. | 07-30-2015 |
Nikki Ann G. Guevarra, Chicago, IL US
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20090204382 | SYSTEM FOR ASSEMBLING BEHAVIOR MODELS OF TECHNOLOGY COMPONENTS - A system is described for assembling a behavior model of a technology component. The system may include a memory, and a processor. The memory may store a behavior model of a technology component. The processor may to monitor the technology component over a period of time to determine a plurality of parameter values associated with each state of a plurality of states of the technology component. The processor may process the plurality of parameter values associated with each state to determine a baseline parameter value for each state. The processor may assemble the behavior model for the technology component. The behavior model may include each state, the baseline parameter value for each state, and an association between each state and the baseline parameter value for each state. The processor may store the behavior model of the technology component in the memory. | 08-13-2009 |
20090231152 | SYSTEM FOR MONITORING THE ENERGY EFFICIENCY OF TECHNOLOGY COMPONENTS - A system is described for monitoring the energy efficiency of a technology component. The system may include a memory, an interface, and a processor. The memory may store a baseline power consumption value for a plurality of operating states of a technology component. The interface may communicate with a device of a user. The processor may monitor the technology component to determine a current power consumption value and a current operating state of the technology component. The processor may determine the baseline power consumption value corresponding to the current operating state. The processor may determine whether the current power consumption value is within a threshold of the baseline power consumption value. The processor may provide an alert to a device of the user if the current power consumption value of the technology component is not within the threshold of the baseline power consumption value. | 09-17-2009 |