Patent application number | Description | Published |
20110063712 | DISPLAY DEVICE WITH AT LEAST ONE MOVABLE STOP ELEMENT - In certain embodiments, a device is provided including a substrate and a plurality of supports over the substrate. The device may further include a mechanical layer having a movable portion and a stationary portion. The stationary portion may disposed over the supports. In certain embodiments, the device further includes a reflective surface positioned over the substrate and mechanically coupled to the movable portion. The device of certain embodiments further includes at least one movable stop element displaced from and mechanically coupled to the movable portion. In certain embodiments, the at least a portion of the stop element may be positioned over the stationary portion. | 03-17-2011 |
20120014683 | CAMERA FLASH SYSTEM CONTROLLED VIA MEMS ARRAY - A camera flash system may include a light source and an array that includes MEMS-based light-modulating devices disposed in front the light source. The camera flash system may control the array to transmit light through, or substantially prevent the transmission of light through, predetermined areas of the array. In some embodiments, the array may be controlled in response to input from a user, in response to detected ambient light conditions and/or in response to the proximity of a detected subject or other detected features. For example, the camera flash system may control the array to substantially prevent the transmission of light through an area of the array that is between the light source and the eyes of a detected subject. | 01-19-2012 |
20120019713 | MEMS-BASED APERTURE AND SHUTTER - Some embodiments comprise at least one array that includes microelectromechanical systems (“MEMS”)-based light-modulating devices. Elements of the array(s) may be configured to absorb and/or reflect light when in a first configuration and to transmit light when in a second position. Such an array may be controlled to function as a camera aperture and/or as a camera shutter. For example, a controller may cause the array to function as a shutter by causing the MEMS devices to open for a predetermined period of time. The predetermined period of time may be based, at least in part, on input received from a user, the intensity of ambient light, the intensity of a flash, the size of the camera aperture, etc. Some embodiments provide a variable aperture device that does not add significant thickness or cost to a camera module. Such embodiments may enable a camera to function well in both bright and dark light, to control depth of field, etc. | 01-26-2012 |
20120069209 | LENSLESS CAMERA CONTROLLED VIA MEMS ARRAY - A lensless camera may include an array of MEMS-based light-modulating devices. A camera controller may control the MEMS-based light-modulating devices to transmit visible light through, or substantially prevent the transmission of visible light through, predetermined areas of the array. The array may be controlled in response to input from a user and/or in response to the location of a detected subject. The viewing direction of a lensless camera having such an array can be rapidly changed by changing the transmittance of different regions of the array. | 03-22-2012 |
20120169743 | MICROELECTROMECHANICAL DEVICE WITH THERMAL EXPANSION BALANCING LAYER OR STIFFENING LAYER - An interferometric modulating device is provided with a thermal expansion balancing layer on a side of the movable flexible layer opposite the movable reflector such that when temperature changes the distance between the movable reflector and the optical stack does not change significantly, thereby leading to stable color. Additionally, an interferometric modulating device is provided with a stiffening layer between the movable flexible layer and the movable reflector and at least one hollow void exists on the surface where the movable reflector and the stiffening layer contact each other so that the movable reflector is more rigid to bending, thereby reducing the temperature sensitivity of the movable reflector. | 07-05-2012 |
Patent application number | Description | Published |
20090051369 | SYSTEM AND METHOD FOR MEASURING ADHESION FORCES IN MEMS DEVICES - A MEMS test device comprises a flexible beam spaced apart from an optical stack. The MEMS test device includes a reflective layer and a partially reflective layer, such that a change in the position of the MEMS test device can be observed without the use of an external interferometer. The flexible beam may be cantilevered or fixed at each end. The flexible beam may include a shoe suspended from the side of the beam facing the optical stack, to provide a fixed contact area. An array of MEMS test devices may be used to determine compliance, or to calculate adhesion forces. | 02-26-2009 |
20090195856 | METHODS OF REDUCING CD LOSS IN A MICROELECTROMECHANICAL DEVICE - Methods of fabricating an electromechanical systems device that minimize critical dimension (CD) loss in the device are described. The methods provide electromechanical systems devices with improved properties, including high reflectivity. | 08-06-2009 |
20090231666 | Microelectromechanical device with thermal expansion balancing layer or stiffening layer - An interferometric modulating device is provided with a thermal expansion balancing layer on a side of the movable flexible layer opposite the movable reflector such that when temperature changes the distance between the movable reflector and the optical stack does not change significantly, thereby leading to stable color. Additionally, an interferometric modulating device is provided with a stiffening layer between the movable flexible layer and the movable reflector and at least one hollow void exists on the surface where the movable reflector and the stiffening layer contact each other so that the movable reflector is more rigid to bending, thereby reducing the temperature sensitivity of the movable reflector. | 09-17-2009 |
20110273701 | METHODS FOR CHARACTERIZATION OF THE MECHANICAL PROPERTIES OF THIN FILMS AND TEST STRUCTURES FOR PERFORMING THE SAME - A test structure allows one or more deposited thin film layers to be moved such that mechanical properties of the thin film layer or layers may be determined. Methods for characterizing the mechanical properties of the deposited thin film layer include the determination of a transition voltage of the movable thin film layer in the test structure, or the mechanical stiffness of the movable layer, and/or a determination of residual stress within the movable layer. Methods may also include the determination of creep rate or fatigue, as well as the variance in mechanical properties of the movable layer at various temperatures. Test structures used with the testing methods may include structures which interferometrically modulate incident light, enabling electrical or optical determination of the state of the test structures. | 11-10-2011 |