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Guckenberger, US

George B. Guckenberger, Austin, TX US

Patent application numberDescriptionPublished
20080272288Method and apparatus for scaling intensity data in a mass spectrometer - A method includes: accumulating ions having a plurality of m/z values in an ion trap during a time interval; deriving from the accumulated ions a respective intensity value for each of the m/z values; and adjusting each of the intensity values as a function of the time needed by the ion trap to begin collecting ions with the corresponding m/z value. According to a different aspect, an apparatus includes a first portion with an ion trap, and a second portion. The second portion causes the ion trap to accumulate ions with a plurality of m/z values during a time interval, derives from the accumulated ions in the ion trap a respective intensity value for each of the m/z values, and adjusts each of the intensity values as a function of the time needed by the ion trap to begin collecting ions with the corresponding m/z value.11-06-2008
20090032702Method and Apparatus for Selectively Providing Electrons in an Ion Source - An electron source can selectively provide a first stream of electrons that travels in a direction along an imaginary line to a location remote from the electron source, or a second stream of electrons that travels in the direction along the line to the location. The electron source includes a first electron emitter for selectively emitting electrons for the first stream, and a second electron emitter for selectively emitting electrons for the second stream. A different aspect relates to a method for operating an apparatus having an electron source that includes first and second electron emitters. The method includes selectively producing a first stream of electrons that travels from the first electron emitter in a direction along an imaginary line to a location remote from the electron source, or a second stream of electrons that travels from the second electron emitter in the direction along the line to the location.02-05-2009
20090194680Method and Apparatus for Normalizing Performance of an Electron Source - A method for operating a mass spectrometer includes determining a first performance characteristic while operating the mass spectrometer with a first electron emitter, storing first information relating to the first performance characteristic, determining a second performance characteristic while operating the mass spectrometer with a second electron emitter, storing second information relating to the second performance characteristic, and thereafter switching from operation using the first electron emitter to operation using the second electron emitter. The switching includes using the first and second information to normalize performance of the second electron emitter after the switching relative to performance of the first electron emitter before the switching.08-06-2009
20090242747Removable Ion Source that does not Require Venting of the Vacuum Chamber - A method and apparatus of combining an ion volume, a lens stack, and an ion optic that similarly cooperates with a detached multipole ion guide is herein incorporated into a single sub-assembly that can be removed from a mass spectrometer instrument without venting. Such an arrangement allows an operator to clean all parts of the ion path that get contaminated in normal operation, reassemble and reinsert in a timely manner and then pump down to an acceptable vacuum without having to vent the system.10-01-2009

Patent applications by George B. Guckenberger, Austin, TX US

John Guckenberger, San Diego, CA US

Patent application numberDescriptionPublished
20100059822METHOD AND SYSTEM FOR MONOLITHIC INTEGRATION OF PHOTONICS AND ELECTRONICS IN CMOS PROCESSES - Methods and systems for monolithic integration of photonics and electronics in CMOS processes are disclosed and may include fabricating photonic and electronic devices on a single CMOS wafer with different silicon layer thicknesses. The devices may be fabricated on a semiconductor-on-insulator (SOI) wafer utilizing a bulk CMOS process and/or on a SOI wafer utilizing a SOI CMOS process. The different thicknesses may be fabricated utilizing a double SOI process and/or a selective area growth process. Cladding layers may be fabricated utilizing one or more oxygen implants and/or utilizing CMOS trench oxide on the CMOS wafer. Silicon may be deposited on the CMOS trench oxide utilizing epitaxial lateral overgrowth. Cladding layers may be fabricated utilizing selective backside etching. Reflective surfaces may be fabricated by depositing metal on the selectively etched regions. Silicon dioxide or silicon germanium integrated in the CMOS wafer may be utilized as an etch stop layer.03-11-2010

John A. Guckenberger, Carlsbad, CA US

Patent application numberDescriptionPublished
20080205817INTERCONNECTING (MAPPING) A TWO-DIMENSIONAL OPTOELECTRONIC (OE) DEVICE ARRAY TO A ONE-DIMENSIONAL WAVEGUIDE ARRAY - For integrated circuits including circuit packaging and circuit communication technologies provision is made for a method of interconnecting or mapping a two-dimensional optoelectronic (OE) device array to a one-dimensional waveguide array. Also provided is an arrangement for the interconnecting or mapping of a two-dimensional optoelectronic (OE) device array to a one-dimensional waveguide array.08-28-2008

John Andrew Guckenberger, Ithaca, NY US

Patent application numberDescriptionPublished
20100045370TESTING OF TRANSIMPEDANCE AMPLIFIERS - Testing is performed on an amplifier wafer housing a transimpedance amplifier prior to packaging the transimpedance amplifier with an external photodetector, wherein the transimpedance amplifier includes a small, auxiliary, integrated silicon photodetector provided at the input of the transimpedance, in parallel with external photodetector attachment points. To test the transimpedance amplifier, the transimpedance amplifier is stimulated by optically exciting the small auxiliary photodetector, wherein the small auxiliary photodetector is excited using short wavelength light, whereby advantages such as higher efficiency may be obtained. The testing method includes placing the amplifier wafer in a testing system, probing the power and ground connections on the amplifier wafer, illuminating the small auxiliary photodetector on the amplifier wafer, and detecting the output of the transimpedance amplifier housed on the amplifier wafer.02-25-2010

John Andrew Guckenberger, San Diego, CA US

Patent application numberDescriptionPublished
20090097865METHOD AND SYSTEM FOR A NARROWBAND, NON-LINEAR OPTOELECTRONIC RECEIVER - Methods and systems for a narrowband, non-linear optoelectronic receiver are disclosed and may include amplifying a received signal, limiting a bandwidth of the received signal, and restoring the signal utilizing a level restorer, which may include a non-return to zero (NRZ) level restorer. The NRZ level restorer may include a pulse-triggered bistable circuit, which may include two parallel inverters, with one being a feedback path for the other. The inverters may be single-ended or differential. A photogenerated signal may be amplified in the receiver utilizing a transimpedance amplifier and programmable gain amplifiers (PGAs). A received electrical signal may be amplified via PGAs. The bandwidth of the received signal may be limited utilizing one or more of: a low pass filter, a bandpass filter, a high pass filter, a differentiator, or a series capacitance on the chip. The signal may be received from a photodiode integrated on the chip.04-16-2009

Robert C. Guckenberger, Lexington, KY US

Patent application numberDescriptionPublished
20100332973METHODS AND SYSTEMS FOR CREATING, INTERACTING WITH, AND UTILIZING A SUPERACTIVE DOCUMENT - A method of processing an interactive document is enclosed.12-30-2010
20110004820METHODS AND SYSTEMS FOR CREATING, INTERACTING WITH, AND UTILIZING A SUPERACTIVE DOCUMENT - A method of providing a combined interface-and-document includes simultaneously displaying a first instance of a document and an interview pane, wherein the interview pane is displayed via at least one of juxtaposing or superimposing the interview pane relative to the document. The method includes iteratively triggering transformation of the first instance of the document, to produce a second instance of the document, via user interaction received within the interview pane. The document is dynamically reflowed upon each iterative transformation of the document.01-06-2011