| Patent application number | Description | Published |
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| 20080253953 | Silicate Producing Method - The present invention relates to a process for the preparation of a silicate comprising at least silicon and oxygen, comprising
| 10-16-2008 |
| 20110197762 | Template-Free Clathrasils And Clathrasil Membranes - The present invention relates to template-free clathraslls whose framework comprises essentially SO | 08-18-2011 |
| 20110312486 | Alkali-Free Synthesis of Zeolitic Materials of the LEV-Type Structure - Described is a process for the production of a zeolitic material having an LEV-type framework structure comprising YO | 12-22-2011 |
| 20110313226 | Zeolitic Materials of the LEV-Type Structure And Methods For Their Production - Described is a process for the production of a zeolitic material having an LEV-type framework structure comprising YO | 12-22-2011 |
| 20110319250 | Process For The Preparation Of Pillared Silicates - The present invention relates to a process for the preparation of a silicate compound, comprising (1) providing at least one layered silicate; and (2) mixing said layered silicate with water and at least one silicon containing compound according to formula R | 12-29-2011 |
| 20120004332 | Metal-Bridged Pillared Silicate Compounds And Process For Their Production - The present invention relates to a pillared silicate compound comprising a layered silicate structure, and bridging metal atoms located between adjacent silicate layers of the silicate structure, wherein said bridging metal atoms form at least one covalent bond to each of the adjacent silicate layers, as well as a process for the preparation of a pillared silicate compound, and further includes a pillared silicate compound obtainable and or obtained according to said process, as well as a method of catalyzing a chemical reaction comprising the step of contacting one or more chemical compounds with the any of the aforementioned pillared silicate compounds. | 01-05-2012 |
| 20120004465 | Process For The Preparation Of An Isomorphously Substituted Silicate - A process for the preparation of an isomorphously substituted layered silicate comprising (1) providing a mixture containing silica or a precursor thereof, at least one structure directing agent (SDA) allowing for the crystallization of the layered silicate, and water; (2) heating the mixture obtained according to (1) under hydrothermal conditions; (3) adding at least one source at least one element suitable for isomorphous substitution; (4) heating the mixture obtained according to (3) under hydrothermal conditions. | 01-05-2012 |
| 20120016045 | Process For The Preparation Of Layered Silicates - The present invention relates to a process for the preparation of a layered silicate containing at least silicon and oxygen, comprising (1) providing a mixture containing silica and/or at least one silica precursor, water, at least one tetraalkylammonium compound selected from the group consisting of diethyldimethylammonium compound, a triethylmethylammonium compound, and a mixture of a diethyldimethylammonium and a triethylmethylammonium compound, and at least one base, and optionally at least one suitable seeding material; and (2) heating of the mixture obtained according to (1) under autogenous pressure (hydrothermal conditions) to a temperature in the range of from to 120 to 160° C. for a period in the range of from 5 to 10 days to give a suspension containing the layered silicate. | 01-19-2012 |
| Patent application number | Description | Published |
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| 20100207620 | INSPECTION APPARATUS AND METHOD - An apparatus and method are disclosed for detecting flaws in electrically conductive materials by observing properties of the back-EMF of the eddy current field generated by driving magnetic flux through the object to be examined. The input signal may include sweeps at several frequencies, and may do so at one time under the principle of wave superposition. The sectorial observations of eddy currents summations may be compared to a known datum for a defect free material, the presence of anomalies in eddy field back EMF divergence tending to provide an indication of an irregularity in the underlying eddy field, and hence in the underlying material itself. The portable unit may have a number of different configurations depending on the nature of the object to be examined, be it a flat or large radius plate, a flange, a rail, or some other structural element. | 08-19-2010 |
| 20100305864 | DRILL BIT TRACKING APPARATUS AND METHOD - An apparatus is provided for assessing the location of a drill bit underground. The apparatus includes an acoustic sound generator that is driven by the drilling mud supplied to the drill bit. The sound generator a characteristic string of pulses, which may be termed a signature or key. The key is repeated over and over. Monitors (i.e., sensors) at the surface listen for this key. The key is distorted by the inconstant angular velocity of the drill bit. Thus the observed data do not precisely match the key. On the basis of numerical algorithms, a digitally revised reference signal or key, is identified to map the known reference key onto the best fitting observed data. The correction factors are then applied to map the modified reference key onto the data observed at other sensors of an array of sensors mounted on the surface. By determining the phase shift and travel time of the signals at the various sensors, and having determined the speed of wave propagation in the geological media, the position of the bit, or a fairly close approximation thereof, may be obtained. The correction factors applied to the reference key may also tend to permit the actual rotational speed of the drill bit to be determined. | 12-02-2010 |
| 20120038354 | LINEAR STRUCTURE INSPECTION APPARATUS AND METHOD - An apparatus is provided for sensing anomalies in a long electrically conductive object to be inspected. The object may be a pipeline, or other hollow tube. The apparatus may have a magnetic field generator, and an array of sensors spaced about the field generator. As relative motion in the longitudinal direction occurs between the apparatus and the object to be inspected, the moving magnetic field, or flux, passed from the field generator into the object to be inspected may tend to cause eddy currents to flow in the object. The sensors may be spaced both axially and circumferentially to permit variation in magnetic flux, or eddy current divergence, to be sensed as a function of either or both of axial position relative to the wave front of the magnetic field (or, effectively equivalently any other known datum such as the radial plane of the midpoint of the field generator), and circumferential position about the periphery of the apparatus as measured from an angular datum. Post processing calculation may then tend to permit inferences to be drawn about the location, size, size, shape, and perhaps nature, of anomalies in the object. The sensors, and possibly the entire field generator, may be maintained at a standoff distance from the object to be inspected, as by a sealed housing such as may protect the sensors and reduce the need for and cost of maintenance. The field generator may include two primary poles of like nature held in a non-touching back to back orientation, and may include secondary magnetic circuits placed to bias the flux of the primary magnetic circuit into a more focussed shape with respect to the object to be inspected. | 02-16-2012 |
