| Patent application number | Description | Published |
|---|
| 20080290374 | LAYOUT FOR HIGH DENSITY CONDUCTIVE INTERCONNECTS - In one embodiment of the present invention, a method for connecting a plurality of bit lines to sense circuitry comprises providing a plurality of bit lines extending from a memory array in a first metal layer. The plurality of bit lines are separated from each other by an average spacing x in a first region of the first metal layer. The method further comprises elevating a portion of the plurality of bit lines into a second metal layer overlying the first metal layer. The elevated bit lines are separated from each other by an average spacing y in the second metal layer, with y>x. The method further comprises extending a portion of the plurality of bit lines into a second region of the first metal layer. The extended bit lines are separated from each other by an average spacing z in the second region of the first metal layer, with z>x. The method further comprises connecting a bit line in the second metal layer and a bit line in the first metal layer to the sense circuitry. | 11-27-2008 |
| 20090102522 | POWER ON RESET CIRCUITRY - One or more embodiments of the present disclosure provide methods, devices, and systems for operating power on reset (POR) circuitry. One method embodiment includes providing a voltage to a POR circuit of the system, detecting when the voltage reaches a number of different trip levels, maintaining a count of the number of times an output signal of the POR circuit trips in response to a detected reaching of one of the number of different trip levels, and adjusting the trip level to be detected based at least partially on the count. | 04-23-2009 |
| 20090116283 | Controlling a memory device responsive to degradation - Embodiments of the present invention disclosed herein include devices, systems and methods, such as those directed to non-volatile memory devices and systems capable of determining a degradation parameter associated with one or more memory cells. Disclosed devices and systems according to embodiments of the present invention include those that utilize the degradation parameter to adjust control signals coupled to the memory cells. | 05-07-2009 |
| 20100202217 | NAND FLASH MEMORY PROGRAMMING - A method of charging a floating gate in a nonvolatile memory cell comprises bringing a substrate channel within the memory cell to a first voltage, bringing a control gate to a programming voltage, and floating the substrate channel voltage while the control gate is at the programming voltage. Memory devices include state machines or controllers operable to perform the described method, and operation of such a state machine, memory device, and information handling system are described. | 08-12-2010 |
| 20100315874 | USE OF EMERGING NON-VOLATILE MEMORY ELEMENTS WITH FLASH MEMORY - Memory devices and methods of operating memory devices are provided, such as those that involve a memory architecture that replaces typical static and/or dynamic components with emerging non-volatile memory (NV) elements. The emerging NV memory elements can replace conventional latches, can serve as a high speed interface between a flash memory array and external devices and can also be used as high performance cache memory for a flash memory array. | 12-16-2010 |
| 20110006347 | LAYOUT FOR HIGH DENSITY CONDUCTIVE INTERCONNECTS - In one embodiment of the present invention, a method for connecting a plurality of bit lines to sense circuitry comprises providing a plurality of bit lines extending from a memory array in a first metal layer. The plurality of bit lines are separated from each other by an average spacing x in a first region of the first metal layer. The method further comprises elevating a portion of the plurality of bit lines into a second metal layer overlying the first metal layer. The elevated bit lines are separated from each other by an average spacing y in the second metal layer, with y>x. The method further comprises extending a portion of the plurality of bit lines into a second region of the first metal layer. The extended bit lines are separated from each other by an average spacing z in the second region of the first metal layer, with z>x. The method further comprises connecting a bit line in the second metal layer and a bit line in the first metal layer to the sense circuitry. | 01-13-2011 |
| 20110063923 | TRENCH MEMORY STRUCTURE OPERATION - Memory cells utilizing dielectric charge carrier trapping sites formed in trenches provide for non-volatile storage of data. The memory cells of the various embodiments have two control gates. One control gate is formed adjacent the trench containing the charge carrier trap. The other control gate has a portion formed over the trench, and, for certain embodiments, this control gate may extend into the trench. The charge carrier trapping sites may be discrete formations on a sidewall of a trench, a continuous layer extending from one sidewall to the other, or plugs extending between sidewalls. | 03-17-2011 |
| 20110122699 | CONTROLLING A MEMORY DEVICE RESPONSIVE TO DEGRADATION - Embodiments of the present invention disclosed herein include devices, systems and methods, such as those directed to non-volatile memory devices and systems capable of determining a degradation parameter associated with one or more memory cells. Disclosed devices and systems according to embodiments of the present invention include those that utilize the degradation parameter to adjust control signals coupled to the memory cells. | 05-26-2011 |
| 20110141813 | USE OF EMERGING NON-VOLATILE MEMORY ELEMENTS WITH FLASH MEMORY - Memory devices and methods of operating memory devices are provided, such as those that involve a memory architecture that replaces typical static and/or dynamic components with emerging non-volatile memory (NV) elements. The emerging NV memory elements can replace conventional latches, can serve as a high speed interface between a flash memory array and external devices and can also be used as high performance cache memory for a flash memory array. | 06-16-2011 |
