Patent application number | Description | Published |
20080296509 | Phase-shifting element and particle beam device having a phase-shifting element - A phase-shifting element for shifting a phase of at least a portion of a particle beam is described, as well as a particle beam device having a phase-shifting element of this type. In the phase-shifting element and the particle beam device having a phase-shifting element, components shadowing the particle beam are avoided, so that proper information content is achieved and in which the phase contrast is essentially spatial frequency-independent. The phase-shifting element may have at least one means for generating a non-homogeneous or anisotropic potential. The particle beam device according to the system described herein may be provided with the phase-shifting element. | 12-04-2008 |
20090039257 | Electron beam device - An electron beam device has an electron gun for generating an electron beam, an objective lens for focusing the electron beam on an object and at least one detector for detecting electrons emitted by the object or electrons backscattered by the object. Detection of electrons emitted by or backscattered by an object may be simplified and improved using quadrupole devices and certain configurations of these devices provided in the electron beam device. | 02-12-2009 |
20100038537 | Particle beam apparatus having an annularly-shaped illumination aperture - A particle beam apparatus has an optical axis (OA), an illuminating system ( | 02-18-2010 |
20100181481 | Phase contrast electron microscope - A phase contrast electron microscope has an objective ( | 07-22-2010 |
20100258719 | PARTICLE-BEAM MICROSCOPE - A particle beam microscope includes an illumination system generating a particle beam having a ring-shaped conical configuration. A selective detection system is configured to selectively detect one of two groups of particles having traversed the object region. The first group of particles includes the particles that traversed the object region un-scattered or scattered by a small scattering amount. The second group of particles includes particles scattered in the object region by a greater scattering amount. | 10-14-2010 |
20110210249 | Transmission Electron Microscope - A transmission electron microscope in which a sample is positioned in a sample plane | 09-01-2011 |
20110233402 | Phase-shifting element and particle beam device having a phase-shifting element - A phase-shifting element for shifting a phase of at least a portion of a particle beam is described, as well as a particle beam device having a phase-shifting element of this type. In the phase-shifting element and the particle beam device having a phase-shifting element, components shadowing the particle beam are avoided, so that proper information content is achieved and in which the phase contrast is essentially spatial frequency-independent. The phase-shifting element may have at least one means for generating a non-homogeneous or anisotropic potential. The particle beam device according to the system described herein may be provided with the phase-shifting element. | 09-29-2011 |
20120025094 | CHARGED PARTICLE BEAM SYSTEM - A charged particle beam system for performing precession diffraction includes a lens | 02-02-2012 |
20120326030 | Particle Beam Microscope - A particle beam microscope comprises a magnetic lens | 12-27-2012 |
20120326032 | Particle Beam Microscope - A particle beam microscope comprises a magnetic lens | 12-27-2012 |
20130001445 | PHASE-SHIFTING ELEMENT AND PARTICLE BEAM DEVICE HAVING A PHASE-SHIFTING ELEMENT - A phase-shifting element for shifting a phase of at least a portion of a particle beam is described, as well as a particle beam device having a phase-shifting element of this type. In the phase-shifting element and the particle beam device having a phase-shifting element, components shadowing the particle beam are avoided, so that proper information content is achieved and in which the phase contrast is essentially spatial frequency-independent. The phase-shifting element may have at least one means for generating a non-homogeneous or anisotropic potential. The particle beam device according to the system described herein may be provided with the phase-shifting element. | 01-03-2013 |
20130256558 | APPARATUS FOR CONTAMINANTS BEING DEPOSITED THEREON - An apparatus for contaminants being deposited thereon in a particle beam device, and also the particle beam device including the apparatus, are provided. This apparatus may be an anticontaminator. The apparatus according to the system described herein may include at least one cooling unit. The cooling unit may provide at least one cooled surface on which contaminants in a particle beam device are deposited. The apparatus according to the system described herein may further include at least one aperture unit. The aperture unit may be arranged at a motion device for moving the aperture unit relative to the cooling unit. Furthermore, the aperture unit may have at least one aperture opening. The cooling unit may be connected to the aperture unit by at least one first flexible thermal conductor. | 10-03-2013 |
20130292566 | Transmission Electron Microscopy System and Method of Operating a Transmission Electron Microscopy System - A transmission electron microscopy system comprises: an illumination system ( | 11-07-2013 |
20150069235 | Particle Optical System - A particle optical system comprises a beam generating system ( | 03-12-2015 |