| Patent application number | Description | Published |
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| 20080232185 | Structure and Method of Implementing Power Savings During Addressing of DRAM Architectures - A random access memory device includes an array of individual memory cells arranged into rows and columns, each memory cell having an access device associated therewith. Each row of the array further includes a plurality of N word lines associated therewith, with a wherein N corresponds to a number of independently accessible partitions of the array, wherein each access device in a given row is coupled to only one of the N word lines of the row. Address decoder logic in signal communication with the array is configured to receive a plurality of row address bits and determine, for a requested row identified by the row address bits, which of the N partitions within the requested row are to be accessed, such that access devices within a selected row, but not within a partition to be accessed, are not activated. | 09-25-2008 |
| 20080276214 | METHOD AND COMPUTER PROGRAM FOR AUTOMATED ASSIGNMENT AND INTERCONNECTION OF DIFFERENTIAL PAIRS WITHIN AN ELECTRONIC PACKAGE - Connection assignments of differential signals within an integrated circuit (IC) package are automatically made in the design and manufacturing process of the IC package, for use in automated computing systems. Either predefined pairs of pins at both ends or pairs of pins automatically paired or a combination of both are used in the creation of an imaginary pin or midpoint between the pair. Then the point-to-point connections of the pair are automatically detangled. Once the imaginary midpoint-to-midpoint connections are created, the real differential connections can then be assigned. | 11-06-2008 |
| 20090006706 | Structure for Hub for Supporting High Capacity Memory Subsystem - A design structure is provided for a hub for use in a high-capacity memory subsystem in which memory modules arranged in one or more clusters, each attached to a respective hub which in turn is attached to a memory controller. Within a cluster, data is interleaved so that each data access command accesses all modules of the cluster. The hub communicates with the memory modules at a lower bus frequency, but the distributing of data among multiple modules enables the cluster to maintain the composite data rate of the memory-controller-to-hub bus. Preferably, the memory system employs buffered memory chips having dual-mode operation, one of which supports a cluster configuration in which data is interleaved and the communications buses operate at reduced bus width and/or reduced bus frequency to match the level of interleaving | 01-01-2009 |
| 20090006760 | Structure for Dual-Mode Memory Chip for High Capacity Memory Subsystem - A design structure is provided for a dual-mode memory chip supporting a first operation mode in which received data access commands contain chip select data to identify the chip addressed by the command, and control logic in the memory chip determines whether the command is addressed to the chip, and a second operation mode in which the received data access command addresses a set of multiple chips. Preferably, the first mode supports a daisy-chained configuration of memory chips. Preferably the second mode supports a hierarchical interleaved memory subsystem, in which each addressable set of chips is configured as a tree, command and write data being propagated down the tree, the number of chips increasing at each succeeding level of the tree. | 01-01-2009 |
| 20090006781 | Structure for Memory Chip for High Capacity Memory Subsystem Supporting Multiple Speed Bus - A design structure is provided for a memory module containing an interface for receiving memory access commands from an external source, in which a first portion of the interface receives memory access data at a first bus frequency and a second portion of the interface receives memory access data at a second different bus frequency. Preferably, the memory module contains a second interface for re-transmitting memory access data, also operating at dual frequency. The memory module is preferably used in a high-capacity memory subsystem organized in a tree configuration in which data accesses are interleaved. Preferably, the memory module has multiple-mode operation, one of which supports dual-speed buses for receiving and re-transmitting different parts of data access commands, and another of which supports conventional daisy-chaining. | 01-01-2009 |
| 20090006798 | Structure for Memory Chip for High Capacity Memory Subsystem Supporting Replication of Command Data - A design structure is provided for a memory module containing a first interface for receiving data access commands and a second interface for re-transmitting data access commands to other memory modules, the second interface propagating multiple copies of received data access commands to multiple other memory modules. The memory module is preferably used in a high-capacity memory subsystem organized in a tree configuration in which data accesses are interleaved. Preferably, the memory module has multiple-mode operation, one of which supports multiple replication of commands and another of which supports conventional daisy-chaining | 01-01-2009 |
| 20090031067 | Spider Web Interconnect Topology Utilizing Multiple Port Connection - A data communications apparatus includes a central device and a plurality of communication devices. The central device includes a plurality of central port pairs, in which each central port pair includes an input port and an output port. The plurality of communication devices is arranged in a spoke and ring configuration, in which each communication device is part of a communication spoke. Each communication spoke is in communication with a different central port pair. Each communication device is also a part of a communication ring, so that each communication device in a selected communication ring belongs to a different communication spoke. | 01-29-2009 |
| 20090055134 | System and Method for Implementing Optimized Creation of Openings for De-Gassing in an Electronic Package - System and method for designing an electronic package. A placement manager receives a physical design of an electronic package from a packaging design tool. The placement manager receives design constraints regarding the physical design for the electronic package. The placement manager inserts specifications for at least one de-gassing opening in the physical design for the electronic package, wherein the specification for at least one de-gassing opening are created in accordance with said design constraints regarding said physical design of said electronic package. The placement manager outputs an updated physical design of the electronic package. | 02-26-2009 |
| 20090058425 | METHOD AND APPARATUS TO TEST ELECTRICAL CONTINUITY AND REDUCE LOADING PARASITICS ON HIGH-SPEED SIGNALS - An apparatus for testing electrical continuity of a surface mounted (SMT) electrical board includes: a printed wiring board having a first surface and an opposite second surface; a conductive signal line disposed on each of the first and second surfaces of the printed wiring board; an electrical component disposed on and electrically connected to the conductive signal line on the first surface; and a through hole extending through the printed wiring board and the conductive signal line on the second surface of the printed wiring board exposing a surface side of the conductive signal line facing the first surface of the printed wiring board. The through hole is unplated in an inside bore defining the through hole and the through hole allows direct access to the conductive signal line on the first surface to test continuity of the conductive signal line on the first surface connected to the electrical component from the second surface of the printed wiring board. | 03-05-2009 |
| 20090079060 | METHOD AND STRUCTURE FOR DISPENSING CHIP UNDERFILL THROUGH AN OPENING IN THE CHIP - A method of making an integrated circuit package includes forming a through hole in an integrated circuit and assembling a die containing the integrated circuit on a carrier so that the die is mechanically and electrically connected to the carrier. Thereafter, an underfill material is dispensed between the die and the carrier via the through hole. | 03-26-2009 |
| 20090183364 | METHOD OF CONNECTING A SERIES OF INTEGRATED DEVICES UTILIZING FLEXIBLE CIRCUITS IN A SEMI-STACKING CONFIGURATION - A method of serially connecting devices utilizing flexible circuits in a semi-stacking configuration includes positioning a first flexible circuit on a carrier, the first flexible circuit includes a bottom surface and a top surface, a portion of the bottom surface is mounted to the carrier while another portion of the bottom surface is elevated at a first angle with respect to the carrier; coupling a first device on a portion of the top surface of the first flexible circuit, the first device being elevated at the first angle; positioning a second flexible circuit on the carrier, the second flexible circuit having an upper surface and a lower surface, a portion of the lower surface is mounted to the carrier while another portion of the lower surface is elevated at a second angle with respect to the carrier and overlapped over a top surface portion of the first device; and coupling a second device on a portion of the upper surface of the second flexible circuit, the second device being elevated at the second angle. | 07-23-2009 |
| 20090196118 | Design Structure Of Implementing Power Savings During Addressing Of DRAM Architectures - A design structure embodied in a machine readable medium used in a design process includes random access memory device having an array of individual memory cells arranged into rows and columns, each memory cell having an access device associated therewith. Each row of the array further includes a plurality of N word lines associated therewith, with a wherein N corresponds to a number of independently accessible partitions of the array, wherein each access device in a given row is coupled to only one of the N word lines of the row. Logic in signal communication with the array receives a plurality of row address bits and determine, for a requested row identified by the row address bits, which of the N partitions within the requested row are to be accessed, such that access devices within a selected row, but not within a partition to be accessed, are not activated. | 08-06-2009 |
| 20090268422 | SCALABLE ELECTRONIC PACKAGE ASSEMBLY FOR MEMORY DEVICES AND OTHER TERMINATED BUS STRUCTURES - A scalable electronic package assembly for memory devices and other terminated bus structures is disclosed. The scalable electronic package assembly includes a first electronic carrier and a second electronic carrier. The first electronic carrier includes a first set of electronic devices controlled by a controller. The second electronic carrier includes a second set of electronic devices that are also controlled by the controller on the first electronic carrier. The second electronic carrier is electrically connected to the first electronic carrier via multiple solder columns. The second electronic carrier is physically stacked on top of the first electronic carrier via an insulator. | 10-29-2009 |
| 20090305463 | System and Method for Thermal Optimized Chip Stacking - A method for thermal optimization comprising the steps of stacking a first chip layer and a second chip layer wherein the second chip layer is rotated in relation to the first chip layer wherein a first hot spot on the first chip layer and a second hot spot on the second chip layer are not spatially aligned; routing a signal input through the first chip layer from a first chip pad on the first chip layer to a first silicon via so as to form a physical input to output twist and a first signal output; and routing the first signal output from the first chip layer through a second chip layer from a second chip pad on the second chip layer to a second silicon via so as to form a second signal output. | 12-10-2009 |
| 20100025479 | Doped Implant Monitoring for Microchip Tamper Detection - A method and apparatus include conductive material doped within a microchip that accumulates a detectable charge in the presence of ions. Such ions may result from a focused ion beam or other unwelcome technology exploitation effort. Circuitry sensing the charge buildup in the embedded, doped material may initiate a defensive action intended to defeat the tampering operation. | 02-04-2010 |
| 20100025864 | SHIELDED WIREBOND - A wirebond interconnect structure, having ground pads and signal pads, to which wirebonds are electrically coupled, disposed on a component, is provided and includes a first coating to insulate at least the wirebonds and the signal pads with at least the ground pads exposed, and a second coating, surrounding the first coating, in electrical communication with the ground pads. The first coating is sufficiently thick to achieve a consistent characteristic impedance when the second coating is applied. | 02-04-2010 |
| 20100026313 | Capacitance Structures for Defeating Microchip Tampering - Apparatus, method and program product may detect an attempt to tamper with a microchip by detecting an unacceptable alteration in a measured capacitance associated with capacitance structures proximate the backside of a microchip. The capacitance structures typically comprise metallic shapes and may connect using through-silicon vias to active sensing circuitry within the microchip. In response to the sensed change, a shutdown, spoofing, self-destruct or other defensive action may be initiated to protect security sensitive circuitry of the microchip. | 02-04-2010 |
| 20100026326 | Resistance Sensing for Defeating Microchip Exploitation - A method, program product and apparatus include resistance structures positioned proximate security sensitive microchip circuitry. Alteration in the position, makeup or arrangement of the resistance structures may be detected and initiate an action for defending against a reverse engineering or other exploitation effort. The resistance structures may be automatically and selectively designated for monitoring. Some of the resistance structures may have different resistivities. The sensed resistance may be compared to an expected resistance, ratio or other resistance-related value. The structures may be intermingled with false structures, and may be overlapped or otherwise arranged relative to one another to further complicate unwelcome analysis. | 02-04-2010 |
| 20100026336 | FALSE CONNECTION FOR DEFEATING MICROCHIP EXPLOITATION - An integrated circuit assembly and associated method of detecting microchip tampering may include multiple connections in electrical communication with a conductive layer. Defensive circuitry may inhibit analysis of the microchip where a connection no longer connects to the conductive layer. The defensive circuitry may similarly be initiated where a connection unintended to be in electrical communication with the conductive layer is nonetheless connected. | 02-04-2010 |
| 20100026337 | Interdependent Microchip Functionality for Defeating Exploitation Attempts - An integrated circuit assembly comprising a microchip that shares an interdependent function with a second, stacked microchip. Alternation of the physical arrangement or functionality of the microchips may initiate a defense action intended to protect security sensitive circuitry associated with one of the microchips. The microchips may communicate using through-silicon vias or other interconnects. | 02-04-2010 |
| 20100026506 | Capacitance-Based Microchip Exploitation Detection - An apparatus and method detect microchip tampering by including a capacitance circuit that comprises a protective cover. Dielectric material may be sandwiched between the cover and a backside metal layer, which may be proximate a protected surface of the microchip. Changes in the capacitance of the above circuit caused by alteration of the cover or other component of the capacitance circuit may be sensed and prompt defensive action. | 02-04-2010 |
| 20100031375 | Signal Quality Monitoring to Defeat Microchip Exploitation - Method and apparatus and associated method of detecting microchip tampering may include a conductive element in electrical communication with multiple sensors for verifying that signal degradation occurs at an expected region of the conductive element. A detected variance from the expected region may automatically trigger an action for impeding an integrated circuit exploitation process. | 02-04-2010 |
| 20100031376 | Continuity Check Monitoring for Microchip Exploitation Detection - Apparatus, method and program product detect an attempt to tamper with a microchip by determining that an electrical path comprising one or more connections and a metal plate attached to the backside of a microchip has become disconnected or otherwise altered. A tampering attempt may also be detected in response to the presence of an electrical path that should not be present, as may result from the microchip being incorrectly reconstituted. Actual and/or deceptive paths may be automatically selected and monitored to further confound a reverse engineering attempt. | 02-04-2010 |
| 20100185410 | THREE DIMENSIONAL CHIP FABRICATION - A three-dimensional (3D) chip is fabricated from components that have been cut out of a two-dimensional (2D) chip to create the layers of the 3D chip. By testing the 2D chip first, the layers of the 3D chip have been pre-tested, thus reducing testing and production costs. | 07-22-2010 |
| 20100271071 | Universal Inter-Layer Interconnect for Multi-Layer Semiconductor Stacks - A circuit arrangement and method utilize a universal, standardized inter-layer interconnect in a multi-layer semiconductor stack to facilitate interconnection and communication between functional units disposed on a stack of semiconductor dies. Each circuit layer in the multi-layer semiconductor stack is required to include an inter-layer interface region that is disposed at substantially the same topographic location such that when the semiconductor dies upon which such circuit layers are disposed are arranged together in a stack, electrical conductors disposed within each semiconductor die are aligned with one another to provide an inter-layer bus that is oriented vertically, or transversely, with respect to the individual circuit layers. Based upon a standardized placement of the inter-layer interface region in each circuit layer, and a standardized arrangement of electrical conductors associated with the inter-layer bus, each circuit layer may designed using a standardized template upon which the design features necessary to implement the inter-layer bus are already provided, thereby simplifying circuit layer design and the interconnection of functional units to the inter-layer bus. In addition, vertically-oriented supernodes may be defined within a semiconductor stack to provide multiple independently-operating nodes having functional units disposed in multiple circuit layers of the stack. | 10-28-2010 |
