| Patent application number | Description | Published |
|---|
| 20090063085 | PMU TESTING VIA A PE STAGE - An apparatus for use in testing a device includes a parametric measurement unit to measure a first signal from the device, and pin electronics to provide a second signal to the device. The pin electronics includes circuitry along a path to the device. The parametric measurement unit is electrically connected to the device via the circuitry to receive the first signal via the circuitry. | 03-05-2009 |
| 20090112548 | A METHOD FOR TESTING IN A RECONFIGURABLE TESTER - In some implementations, a method for testing is provided, which includes simulating a functional operational environment for a first type device-under-test with a tester. This includes recognizing a non-deterministic response signal having a predetermined protocol, receiving the non-deterministic response signal from the first type device-under-test, ascertaining an expected stimulus signal to be transferred to the first type device-under-test from the non-deterministic response signal based on the predetermined protocol, and initiating transmission of the expected stimulus signal to the first type device-under-test. The method further includes simulating a functional operational environment for a second type device-under-test with the tester after testing the first type device-under-test. | 04-30-2009 |
| 20090113245 | PROTOCOL AWARE DIGITAL CHANNEL APPARATUS - In one embodiment, provided is a protocol specific circuit for simulating a functional operational environment into which a device-under-test is placed for functional testing. The protocol specific circuit includes a protocol aware circuit constructed to receive a non-deterministic signal communicated by a device-under-test and to control a transfer of the test stimulus signal to the device-under-test in response to the a non-deterministic signal. | 04-30-2009 |
| 20100002819 | TRACKER CIRCUIT AND METHOD FOR AUTOMATED TEST EQUIPMENT SYSTEMS - A digital data signal capture circuit for synchronization of received digital data signals includes a transition detector for determining a state transition of the received digital data signal. The transition detector samples the received digital data signal at a first time, a second time and a third time and determines whether the transition occurs between the first time and the second time and whether it occurs between the first time and third time and generates an increment/decrement signal indicating a position for the transition. A strobe adjust circuit generates a strobe signal based on the increment/decrement signal. A capture circuit captures the received digital data signal using the strobe signal. | 01-07-2010 |
| 20100235135 | General Purpose Protocol Engine - In one embodiment, a protocol aware circuit for automatic test equipment, which includes a protocol generation circuit constructed to retrieve protocol unique data and format the protocol unique data with a selected protocol definition corresponding to a device under test for testing the device under test. The protocol generation circuit may be constructed to retrieve the selected protocol definition from a protocol definition table. | 09-16-2010 |
| 20100312516 | PROTOCOL AWARE DIGITAL CHANNEL APPARATUS - In one embodiment, provided is a protocol specific circuit for simulating a functional operational environment into which a device-under-test is placed for functional testing. The protocol specific circuit includes a protocol aware circuit constructed to receive a non-deterministic signal communicated by a device-under-test and to control a transfer of the test stimulus signal to the device-under-test in response to the a non-deterministic signal. | 12-09-2010 |
| 20110087942 | Programmable Protocol Generator - A semiconductor device tester includes programmable hardware configured to test a semiconductor device under test. The programmable hardware is programmed with two or more pattern generators to control a flow of data to and from the semiconductor device under test. | 04-14-2011 |
