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Geiler
Martin Geiler, Gutach DE
| Patent application number | Description | Published |
|---|---|---|
| 20090016735 | Optelectronic sensor - An optoelectronic sensor includes at least one light transmitter for the transmission of light signals into a monitored zone, at least one light receiver for the reception of light signals transmitted from the light transmitter and a control device for the generation and/or influencing of the light signals and for the generation of an object detection signal in the case of the presence of an object in the monitored region in dependence on the output signals of the light receiver. In this connection, the light signals transmitted into the monitored zone by the light transmitter are each generated by an output signal modulated in accordance with the spread spectrum method using a random pseudo-noise code. | 01-15-2009 |
Scott Geiler, Belleville, IL US
| Patent application number | Description | Published |
|---|---|---|
| 20090063287 | Method of Processing Orders - A method and apparatus are provided for processing orders by a host of an ordering organization, the orders being placed by the ordering organization with a vendor. The method includes the steps of an agent of the ordering organization accessing an order website and entering a plurality of order items and the host incorporating the order items and a change subroutine into a webpage. The method further includes the steps of an agent of the vendor retrieving the webpage from the host of the ordering organization, the agent of the ordering organization and agent of the vendor negotiating the conditions of the order and the change subroutine tracking and recording the agreed upon conditions. | 03-05-2009 |
Thomas Geiler, Ludwigsburg DE
| Patent application number | Description | Published |
|---|---|---|
| 20090153882 | Measuring Dimensional Parameters of Structures - Dimensional parameters of structures on a substrate are measured by providing a substrate with a structured surface. The structured surface includes a number of juxtaposed structural elements. A radiation source is configured to emit a beam of radiation having a wavelength in the infrared range. The substrate is illuminated with the beam of radiation. A signal corresponding to a part of the beam of radiation being transmitted through the substrate is detected. Dimensional parameters of the structural elements are calculated based on the transmitted beam signal. | 06-18-2009 |