Patent application number | Description | Published |
20080207843 | Method To Manufacture A Compartmentalized Pellet Directly From A Reactor - This specification discloses how to make a compartmentalized pellet from a reactor by not reducing the temperature of the reacted product to below its glass transition temperature. | 08-28-2008 |
20110266704 | Compartmentalized Chips With Similar Polymers of Different Viscosities For Improved Processability - Compartmentalized chips of at least two chemically similar crystallizable thermoplastic polymers each having a different intrinsic viscosity placed in separate zones are disclosed. These compartmentalized chips exhibit thermal characteristics that are different from the traditional technique of homogeneously combining the two materials into the chip. These compartmentalized chips in their amorphous, crystalline and solid phase polymerized forms exhibit a longer crystallization half time than the homogeneous mixture, thus permitting faster injection cycle times when compared to an equivalent homogenous mixture. | 11-03-2011 |
20130224816 | CONTINUOUS PROCESS FOR CONVERSION OF LIGNIN TO USEFUL COMPOUNDS - This specification discloses an operational continuous process to convert lignin as found in ligno-cellulosic biomass before or after converting at least some of the carbohydrates. The continuous process has been demonstrated to create a slurry comprised of lignin, raise the slurry comprised of lignin to ultra-high pressure, deoxygenate the lignin in a lignin conversion reactor over a catalyst which is not a fixed bed without producing char. The conversion products of the carbohydrates or lignin can be further processed into polyester intermediates for use in polyester preforms and bottles. | 08-29-2013 |
20130225853 | CONTINUOUS PROCESS FOR CONVERSION OF LIGNIN TO USEFUL COMPOUNDS - This specification discloses an operational continuous process to convert lignin as found in ligno-cellulosic biomass before or after converting at least some of the carbohydrates. The continuous process has been demonstrated to create a slurry comprised of lignin, raise the slurry comprised of lignin to ultra-high pressure, deoxygenate the lignin in a lignin conversion reactor over a catalyst which is not a fixed bed without producing char. The conversion products of the carbohydrates or lignin can be further processed into polyester intermediates for use in polyester preforms and bottles. | 08-29-2013 |
20130225854 | CONTINUOUS PROCESS FOR CONVERSION OF LIGNIN TO USEFUL COMPOUNDS - This specification discloses an operational continuous process to convert lignin as found in ligno-cellulosic biomass before or after converting at least some of the carbohydrates. The continuous process has been demonstrated to create a slurry comprised of lignin, raise the slurry comprised of lignin to ultra-high pressure, deoxygenate the lignin in a lignin conversion reactor over a catalyst which is not a fixed bed without producing char. The conversion products of the carbohydrates or lignin can be further processed into polyester intermediates for use in polyester preforms and bottles. | 08-29-2013 |
20130225855 | CONTINUOUS PROCESS FOR CONVERSION OF LIGNIN TO USEFUL COMPOUNDS - This specification discloses an operational continuous process to convert lignin as found in ligno-cellulosic biomass before or after converting at least some of the carbohydrates. The continuous process has been demonstrated to create a slurry comprised of lignin, raise the slurry comprised of lignin to ultra-high pressure, deoxygenate the lignin in a lignin conversion reactor over a catalyst which is not a fixed bed without producing char. The conversion products of the carbohydrates or lignin can be further processed into polyester intermediates for use in polyester preforms and bottles. | 08-29-2013 |
20130225856 | CONTINUOUS PROCESS FOR CONVERSION OF LIGNIN TO USEFUL COMPOUNDS - This specification discloses an operational continuous process to convert lignin as found in ligno-cellulosic biomass before or after converting at least some of the carbohydrates. The continuous process has been demonstrated to create a slurry comprised of lignin, raise the slurry comprised of lignin to ultra-high pressure, deoxygenate the lignin in a lignin conversion reactor over a catalyst which is not a fixed bed without producing char. The conversion products of the carbohydrates or lignin can be further processed into polyester intermediates for use in polyester preforms and bottles. | 08-29-2013 |
20130225872 | CONTINUOUS PROCESS FOR CONVERSION OF LIGNIN TO USEFUL COMPOUNDS - This specification discloses an operational continuous process to convert lignin as found in ligno-cellulosic biomass before or after converting at least some of the carbohydrates. The continuous process has been demonstrated to create a slurry comprised of lignin, raise the slurry comprised of lignin to ultra-high pressure, deoxygenate the lignin in a lignin conversion reactor over a catalyst which is not a fixed bed without producing char. The conversion products of the carbohydrates or lignin can be further processed into polyester intermediates for use in polyester preforms and bottles. | 08-29-2013 |
20140096830 | CONTINUOUS PROCESS FOR CONVERSION OF LIGNIN TO USEFUL COMPOUNDS - This specification discloses an operational continuous process to convert lignin as found in ligno-cellulosic biomass before or after converting at least some of the carbohydrates. The continuous process has been demonstrated to create a slurry comprised of lignin, raise the slurry comprised of lignin to ultra-high pressure, deoxygenate the lignin in a lignin conversion reactor over a catalyst which is not a fixed bed without producing char. The conversion products of the carbohydrates or lignin can be further processed into polyester intermediates for use in polyester preforms and bottles. | 04-10-2014 |
Patent application number | Description | Published |
20090051930 | METHOD FOR DETECTING SURFACE DEFECTS ON A SUBSTRATE AND DEVICE USING SAID METHOD - A method for detecting surface defects, such as slip line type defects, on a substrate designed to be used in electronics, optoelectronics or analogue, including projection of a pattern of light fringes and dark bands onto the substrate, relative displacement of the substrate relative to the pattern, acquisition of a sequence of at least three images of the pattern reflected by the substrate to a sensor, the images corresponding to displacement of the fringes of the pattern, determination of the gradient of the surface of the substrate using displacements of fringes of the pattern, and determination of the presence of a surface defect on the substrate using variations in the gradient of the surface of the substrate. Another embodiment comprises a device using said method. | 02-26-2009 |
20090195786 | DEVICE FOR INSPECTING SEMI-CONDUCTOR WAFERS - Device for inspecting semi-conductor wafers in motion, including a light source for at least one wafer supported by a transfer element, the said light source being configured to transmit two incident beams on to a surface of the wafer, the incident beams being inclined relative to the normal to the surface, the device also including a unit for detecting interference fringes in the beam reflected by the surface of the wafer. | 08-06-2009 |
20110128371 | DEVICE AND METHOD FOR INSPECTING SEMICONDUCTOR WAFERS - Semiconductor wafer inspection device comprising a wager transport arm provided with at least one wafer support element, a wafer gripper, the gripper having two distant branches designed to take hold of the opposed edges of the wafer, the gripper being mounted so as to rotate on a shaft in order to be able to rotate the wafer between an approximately horizontal position and an approximately vertical position, and at least two inspection systems placed on one side of the wafer and on the other, in an approximately vertical position symmetrically with respect to the plane passing through the wafer. | 06-02-2011 |
20120057155 | DEVICE AND METHOD FOR INSPECTING SEMICONDUCTOR WAFERS - The invention relates to a device for inspecting the edge of semiconductor wafers, including a chromatic confocal microscope ( | 03-08-2012 |
20130044316 | DEVICE AND METHOD FOR INSPECTING MOVING SEMICONDUTOR WAFERS - Device for inspecting defects in semiconductor wafers, comprising a member for detecting surface defects using variations in the slope of a surface of the wafer, a member for detecting surface defects using variations in the light intensity reflected by a surface of the wafer, at a plurality of points, a member for detecting light intensity scattered by the surface of the wafer, a light source, and a detecting and classifying mechanism connected upstream of said detecting members. | 02-21-2013 |
20140268121 | DARK-FIELD SEMICONDUCTOR WAFER INSPECTION DEVICE - The invention relates to a dark-field semi-conductor wafer inspection device including, in the following order, a light source for emitting an incident beam to a wafer along a first axis, a concentrator ( | 09-18-2014 |
20140285797 | DEVICE AND METHOD FOR INSPECTING SEMI-CONDUCTOR MATERIALS - A nanotopographic measuring device comprises an input arranged to receive sets of measurement data relating to a semi-conductor wafer ( | 09-25-2014 |