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Fusegawa
Izumi Fusegawa, Fukushima JP
| Patent application number | Description | Published |
|---|---|---|
| 20090232359 | METHOD FOR DETERMINING DISTANCE BETWEEN REFERENCE MEMBER AND MELT SURFACE, METHOD FOR CONTROLLING LOCATION OF MELT SURFACE USING THE SAME, AND APPARATUS FOR PRODUCING SILICON SINGLE CRYSTAL - The present invention is a method for determining a relative distance between a reference member placed above a melt surface and the melt surface upon pulling a silicon single crystal out of a raw material melt in a crucible by a CZ method characterized by at least: pulling the silicon single crystal applying a magnetic field; taking a picture of a real image of the reference member and a mirror image of the reference member reflected on the melt surface with a detector; processing the picture taken of the real image and the mirror image of the reference member as different pictures by separating the picture taken; and calculating the relative distance between the real image and the mirror image of the reference member from the processed pictures to determine the relative distance between the reference member and the melt surface. | 09-17-2009 |
| 20100126409 | Method of Manufacturing Single Crystal - This invention provides a process for producing a single crystal by a Chokralsky method in which a horizontal magnetic field is applied, characterized in that a single crystal is pulled up so that the radial magnetic field strength gradient ΔBr/ΔRc in such a direction that centers of magnetic field generation coils ( | 05-27-2010 |
| 20100139549 | Quartz Glass Crucible for Pulling Silicon Single Crystal and Method of Manufacturing Quartz Glass Crucible for Pulling Silicon Single Crystal - The present invention is a quartz glass crucible | 06-10-2010 |
Shuichi Fusegawa, Kiryu-Shi JP
| Patent application number | Description | Published |
|---|---|---|
| 20090066183 | Motor, rotary electric machine and its stator, and method for manufacturing the stator - A laminated core segment | 03-12-2009 |
Yujiro Fusegawa, Kawasaki JP
| Patent application number | Description | Published |
|---|---|---|
| 20090138860 | PROGRAM ANALYSIS METHOD AMD APPARATUS - A program analysis method includes: analyzing, for each program, correlation between plural property values of properties including a property concerning a cost and the accumulated number of failures; calculating a failure forecast value for each program, based on the analysis result and the plural property values of the properties including the property concerning the cost; calculating a latent risk value for each program based on the accumulated number of failures, the failure forecast value, an assumed damage degree per one failure; and selecting a program to be processed based on the latent risk values. Thus, it becomes possible to identify a program for which the maintenance should be carried out, based on the latent risk. | 05-28-2009 |