| Patent application number | Description | Published |
|---|
| 20090101847 | OPTICAL MEASURING DEVICE, OPTICAL MEASURING APPARATUS AND FINE PARTICLE MEASURING APPARATUS USING OPTICAL MEASURING DEVICE - Disclosed herein is an optical measuring device, including: a plurality of microfluidic channels extending in parallel to each other; and a scanning section configured to scan a plurality of measuring light beams in a scanning direction in which the microfluidic channels are juxtaposed to optically measure fine particles introduced into the microfluidic channels. | 04-23-2009 |
| 20090107262 | PARTICULATE SAMPLING APPARATUS, PARTICULATE SAMPLING SUBSTRATE AND PARTICULATE SAMPLING METHOD - A particulate sampling apparatus configured to control the flow direction of a dispersion solvent for particulates, at a channel branching section of a channel includes an introduction channel capable of introducing the dispersion solvent, and a plurality of branch channels communicating with the introduction channel, so as to disperse desired ones of the particulates into a selected one of the branch channels, wherein the apparatus includes light irradiation means by which a bubble can be generated in the dispersion solvent by irradiation with a laser beam used as a heat source, and the flow direction of the dispersion solvent at the channel branching section is controlled by the bubble. | 04-30-2009 |
| 20090116005 | FINE PARTICLE MEASURING METHOD, SUBSTRATE FOR MEASUREMENT, AND MEASURING APPARATUS - A fine particle measuring method of performing optical measurement of fine particles introduced into a plurality of sample fluidic channels provided at predetermined distances on a substrate by scanning light to the sample fluidic channels is disclosed. The method includes: sequentially irradiating the light to at least two or more reference regions provided together with the sample fluidic channels; detecting a change of optical property occurring in the light due to the reference regions; and controlling timing of emission of the light to the sample fluidic channels. | 05-07-2009 |
| 20090231648 | HOLOGRAM SUBSTRATE, METHOD FOR PRODUCING SAME, AND ELECTRONIC DEVICE - A hologram substrate includes a hologram section arranged on a surface of the hologram substrate, the hologram section having an uneven pattern configured to form a holographic image, in which the uneven pattern is a depth-modulated pattern and has smooth boundaries between projections and depressions. | 09-17-2009 |
| 20090294702 | OPTICAL MEASURING INSTRUMENT, AND WAVELENGTH CALIBRATION METHOD AND OPTICAL MEASURING METHOD FOR LIGHT DETECTOR - An optical measuring instrument includes: a flow channel for allowing a specimen to be circulated therein; a first light source including a light emitting diode for emitting light to be used for optical adjustment and/or image confirmation in the flow channel; a second light source for irradiating light upon the specimen circulated in the flow channel; and a light detector for detecting the spectrum intensity of the light emitted from the first and second light sources. | 12-03-2009 |
| 20100020321 | OPTICAL MEASURING DEVICE - An optical measuring device is provided. The optical measuring device irradiates a sample flowing in a channel with light, and detecting light emitted from the sample, wherein the light is applied while scanned at least from one side wall to another side wall of the channel in a direction of width of the channel, and scattered light at a preset threshold value or higher is detected as scattered light from edge parts in the direction of width of the channel. | 01-28-2010 |
