| Patent application number | Description | Published |
|---|
| 20100007349 | METHOD AND APPARATUS FOR FOCUSING IN RESISTIVITY MEASUREMENT TOOLS USING INDEPENDENT ELECTRICAL SOURCES - A system for measuring a resistivity parameter of an earth formation includes: at least one measurement electrode electrically connected to a first electrical source; at least one guard electrode; a shielding electrode interposed between the at least one guard electrode and the at least one measurement electrode, the shielding electrode being electrically connected to a second electrical source independent from the first electrical source, and the guard electrode being electrically connected to a third electrical source independent of the first and second electrical sources; at least one return electrode; insulators positioned between (i) the measurement electrode and the shielding electrode, (ii) the shielding electrode and the guard electrode and (iii) the measurement electrode, the guard electrode and the return electrode; and a processor configured to adjust at least one of the first electrical source and the second electrical source to minimize a current flow through the shielding electrode. | 01-14-2010 |
| 20110025525 | Apparatus and Method for Quality Assessment of Downhole Data - In one aspect, a method for assessing quality of a downhole data is provided. The method, according to one embodiment, may include defining a quality criterion based on one or more parameters of interest, determining a quality assessment value for a first data, determining a quality assessment value for each run of a plurality of runs using the quality criterion, determining a quality factor from the computed quality assessment values of the plurality of runs, and determining a quality level of the first data using the quality assessment value of the first data and the quality factor of the computed quality assessment values. | 02-03-2011 |
| 20110108325 | Integrating Multiple Data Sources for Drilling Applications - A drilling system makes measurements of at least one drilling parameter such as downhole weight on bit, bit torque, bit revolutions, rate of penetration and bit axial acceleration, and at least one measurement responsive to formation properties. One or more processors use the measurements of drilling parameters and formation properties to adjust drilling parameters. | 05-12-2011 |
