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Fukuda, Fujisawa-Shi

Akira Fukuda, Fujisawa-Shi JP

Patent application numberDescriptionPublished
20100076588POLISHING APPARATUS AND POLISHING METHOD - A polishing apparatus is provided for polishing wafers at a high yield rate even if roll-off exists. The polishing apparatus polishes a wafer W by applying a pressure between a polishing member (polishing pad) 03-25-2010
20110014851POLISHING APPARATUS AND POLISHING METHOD - A polishing apparatus is provided for polishing wafers at a high yield rate even if roll-off exists. The polishing apparatus polishes a wafer by applying a pressure between a polishing member (polishing pad) 01-20-2011

Patent applications by Akira Fukuda, Fujisawa-Shi JP

Kazunori Fukuda, Fujisawa-Shi JP

Patent application numberDescriptionPublished
20110064196X-RAY IMAGING APPARATUS AND METHOD OF X-RAY IMAGING - Provided is an X-ray imaging apparatus and a method of X-ray imaging, with which the apparatus can be reduced in size and a with which differential phase image or a phase image with consideration of an X-ray absorption effect of an object can be obtained.03-17-2011
20110103549X-RAY IMAGING APPARATUS AND METHOD OF X-RAY IMAGING - Provided is an X-ray imaging apparatus and a method of X-ray imaging, with which the apparatus can be reduced in size and a differential phase image or a phase image with consideration of an X-ray absorption effect of an object can be obtained.05-05-2011
20110158389X-RAY IMAGING APPARATUS AND X-RAY IMAGING METHOD - An X-ray imaging apparatus for obtaining information on a phase shift of an X-ray caused by an object comprises: an splitting element for splitting spatially an X-ray emitted from an X-ray generator unit into X-ray beams; an attenuator unit having an arrangement of attenuating elements for receiving the X-ray beams split by the splitting element; and an intensity detector unit for detecting intensities of X-ray beams attenuated by the attenuator unit; and the attenuating element changing continuously the transmission amount of the X-ray depending on the X-ray incident position on the element.06-30-2011
20110168905X-RAY DETECTOR AND METHOD FOR MANUFACTURING THE SAME - An X-ray detector includes an X-ray photoelectric conversion layer configured to produce electric charges in proportion to X-ray irradiation incident on the layer, a collecting electrode configured to collect the electric charges produced by the X-ray photoelectric conversion layer, a common electrode disposed on a surface of the X-ray photoelectric conversion layer opposite to the collecting electrode, a storage capacitor configured to store the electric charges collected by the collecting electrode, and a readout unit configured to read out the electric charges stored in the storage capacitor. A voltage is to be applied between the collecting electrode and the common electrode. The X-ray photoelectric conversion layer is formed of a polycrystalline oxide.07-14-2011
20110176662X-RAY IMAGING APPARATUS AND X-RAY IMAGING METHOD - An X-ray imaging apparatus and an X-ray imaging method for use in the X-ray imaging apparatus are provided. The X-ray imaging apparatus includes a separating element configured to spatially separate an X-ray generated by an X-ray generator unit and a scintillator array including a plurality of first scintillators arranged therein, where the separated X-rays are made incident on the first scintillators. Each of the first scintillators is configured to vary an intensity of fluorescence induced by the X-ray in accordance with an incident position of the X-ray. The X-ray imaging apparatus further includes a detector configured to detect the intensity of fluorescence emitted from the scintillator array.07-21-2011
20110194674X-Ray Imaging Apparatus and X-Ray Imaging Method - An X-ray imaging apparatus and an X-ray imaging method can alleviate the influence of scattered X-rays relative to the obtained image. A differential phase contrast image or a phase contrast image of a detection object is computed by using a splitting element and an exposure control unit that synchronizes the X-ray scanning speed and the image acquisition speed of a detecting unit.08-11-2011