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Fukamizu
Shingo Fukamizu, Osaka JP
| Patent application number | Description | Published |
|---|---|---|
| 20080203577 | SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND FABRICATION METHOD FOR THE SAME - The semiconductor integrated circuit device includes: an active element, an interlayer insulting film, first and second metal patterns made of a first metal layer formed right above the active element, first and second buses made of a second metal layer formed right above the first metal layer, and contact pads provided on the first and second buses. The contact pad has a probe testing region and a bonding region. | 08-28-2008 |
Tomohiro Fukamizu, Osaka JP
| Patent application number | Description | Published |
|---|---|---|
| 20090079984 | Optical characteristic measuring apparatus - An optical characteristic measuring apparatus of the invention is configured in such a manner that a specular reflection light component in reflection light from an object to be measured is received, and shake of the apparatus is detected based on the amount of the received light. The optical characteristic measuring apparatus having the above arrangement enables to precisely measure an optical characteristic of the object to be measured, without the need of providing a mechanical switch or a like device, and without depending on the shape of the object to be measured. | 03-26-2009 |
Yuji Fukamizu, Kyoto-Shi JP
| Patent application number | Description | Published |
|---|---|---|
| 20100190754 | AZOLYLMETHYLIDENEHYDRAZINE DERIVATIVE AND USE THEREOF - An azolylmethylidenehydrazine derivative represented by the formula (I) | 07-29-2010 |