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Fukami, Kanagawa
Ikuo Fukami, Kanagawa JP
| Patent application number | Description | Published |
|---|---|---|
| 20100046123 | Semiconductor switch control device - A semiconductor switch control device includes a current detecting unit that detects a current that flows in a semiconductor switch, a voltage detecting unit that detects a voltage, and a temperature detecting unit that detects a temperature. A transient thermal resistance value providing unit provides a transient thermal resistance value Z | 02-25-2010 |
| 20100321846 | SEMICONDUCTOR APPARATUS AND TEMPERATURE DETECTION CIRCUIT - Provided is a semiconductor apparatus which includes a power transistor that is placed between an input terminal and an output terminal, a temperature detection diode that has a cathode connected to the input terminal and an anode connected to the output terminal, a current amplifier that outputs a detection current generated by amplifying a backward leakage current flowing from the cathode to the anode of the temperature detection diode, a first conversion resistor that outputs an overheat detection signal generated by converting the detection current into a voltage, a gating circuit that performs gating of a control signal according to the overheat detection signal, and a driver circuit that outputs a drive signal to a control terminal of the power transistor based on an output signal of the gating circuit. | 12-23-2010 |
| 20110068818 | SEMICONDUCTOR APPARATUS AND METHOD OF DETECTING CHARACTERISTIC DEGRADATION OF SEMICONDUCTOR APPARATUS - A semiconductor apparatus (IPD) includes a set value storage unit that stores a set value determined based on an initial characteristic value of the IPD, and a detector that detects characteristic degradation of the IPD based on a characteristic value of the IPD at given timing and the set value stored in the set value storage unit. Further, a method of detecting characteristic degradation of a semiconductor apparatus (IPD) includes storing a set value determined based on an initial characteristic value of the IPD, and detecting characteristic degradation of the IPD based on a characteristic value of the IPD at given timing and the stored set value. | 03-24-2011 |
| 20110215783 | SEMICONDUCTOR DEVICE - A semiconductor device of the present invention includes an output transistor connected between a power supply terminal and an output terminal; a detection transistor generating a detection current that is proportional to a current flowing through the output transistor; a detection voltage generation unit generating a detection voltage based on a detection current; a protection transistor drawing a current from a control terminal of the output transistor to the output terminal according to the detection voltage; and a limited current generation circuit that generates a limited current that is obtained by converting a limit setting current that sets a current flowing through the output transistor in a protection state according to a variation of a threshold voltage of the protection transistor and a variation of the detection voltage with respect to the detection current, and supplies the limited current to a first terminal of the protection transistor. | 09-08-2011 |
| 20110215859 | CURRENT SOURCE CIRCUIT AND SEMICONDUCTOR DEVICE - A current source circuit includes a reference current source circuit; a reference voltage source circuit generating a voltage proportional to a thermal voltage based on the reference current; a first transistor connected between the reference voltage source circuit and the second power supply voltage and through which a first current flows; a second transistor which has a gate applied with a voltage as a result of addition of the voltage generated by the reference voltage source circuit and a voltage between a source and a drain of the first transistor and through which a second current flows; a current source supplying a third current of a current value proportional to that of the first current; and a third transistor through which a difference current between the second current and the third current flows. An output current is supplied based on the difference current. | 09-08-2011 |
Tadashi Fukami, Kanagawa JP
| Patent application number | Description | Published |
|---|---|---|
| 20090146796 | COMMUNICATION APPARATUS - A communication apparatus is provided that performs short-range wireless communication in a contactless manner. The communication apparatus includes: a large antenna; a first wireless processing section configured to perform data communication via electromagnetic induction-type using the large antenna; a small antenna placed inside the large antenna; and a second wireless processing section configured to perform data communication using the small antenna. | 06-11-2009 |
| 20090323645 | WIRELESS COMMUNICATION TERMINAL, SEMICONDUCTOR DEVICE, DATA COMMUNICATION METHOD, AND WIRELESS COMMUNICATION SYSTEM - A wireless communication terminal is provided. The wireless communication terminal including a first wireless communication section configured to operate in a first clock system; a second wireless communication section configured to operate in a second clock system different from the first clock system, and perform short-range wireless communication; and an asynchronous interface that mediates between the first wireless communication section and the second wireless communication section. | 12-31-2009 |
| 20100048144 | WIRELESS COMMUNICATION DEVICE AND WIRELESS COMMUNICATION SYSTEM - A wireless communication device is provided and includes: a first data communication unit performing communication by an electromagnetic induction system, a second data communication unit performing communication at higher speed than the first communication unit by using a system and/or a communication frequency band different from the first data communication unit, and a control unit controlling communication operations of the first data communication unit and the second data communication unit. The control unit performs communication by using the second data communication unit while a carrier signal is transmitted from the first data communication unit. | 02-25-2010 |
Takaaki Fukami, Kanagawa JP
| Patent application number | Description | Published |
|---|---|---|
| 20090247524 | HSP90 Inhibitor - Compounds represented by formula (1) shown below, pharmaceutically acceptable salts thereof, and pharmaceutical compositions comprising such compounds are provided. | 10-01-2009 |
Toru Fukami, Kanagawa JP
| Patent application number | Description | Published |
|---|---|---|
| 20100083923 | VALVE OPERATING DEVICE FOR INTERNAL COMBUSTION ENGINE - A valve operating device ( | 04-08-2010 |
| 20110180028 | VARIABLE VALVE CONTROL IN INTERNAL COMBUSTION ENGINE - While an operating angle or a lift of an engine valve ( | 07-28-2011 |
Yukihiro Fukami, Kanagawa JP
| Patent application number | Description | Published |
|---|---|---|
| 20110246675 | DATA PROCESSING APPARATUS, SYSTEM THEREOF, METHOD THEREOF, AND RECORDING MEDIUM IN WHICH THAT PROGRAM HAS BEEN RECORDED - Upon receipt of CEC frame data from a PDP, a first radio unit of an HDMI system refers to the content of a reception-side logical address area and recognizes that the destination of this CEC frame data is a second BDP among a plurality of devices connected to a second radio unit. When the first radio unit recognizes that the second BDP is connected to the second radio unit based on second logical address information of a shared device list, the first radio unit substitutes for the second BDP to give an ACK response for reporting the reception of the CEC frame data by the second BDP, and also sends the CEC frame data to the second BDP. | 10-06-2011 |
Yukiko Fukami, Kanagawa JP
| Patent application number | Description | Published |
|---|---|---|
| 20090148031 | SURFACE INSPECTION APPARATUS - A surface inspection apparatus, which includes a detecting device of scanning a surface of an inspection object with an inspection light and outputting a signal corresponding to a light amount of refection light from the surface, generates a two-dimensional image of the surface of the inspection object on the basis of the output signal of the detecting device (S | 06-11-2009 |