| Patent application number | Description | Published |
|---|
| 20090141573 | System and Method for Better Testability of OTP Memory - A system for testing logic circuits for executing writing and reading operations in a one-time programmable (OTP) memory having an array of memory cells is disclosed, the system comprising a column of testing cells having the same number of cells as that of an entire column of the array of memory cells, a row of testing cells having the same number of cells as that of an entire row of the array of memory cells, wherein both the column and row of testing cells are first written to and then read out from during a testing operation, and can never be accessed during non-testing operations of the OTP memory. | 06-04-2009 |
| 20090296448 | DIODE AS VOLTAGE DOWN CONVERTER FOR OTP HIGH PROGRAMMING VOLTAGE APPLICATIONS - A voltage down converter for programming a one-time-programmable (OTP) memory comprising is disclosed, the voltage down converter comprises a bonding pad for coupling to a programming power supply, and at least one forward biased diode coupled between the bonding pad and the OTP memory, wherein a programming voltage received by the OTP memory is lowered from the programming power supply by the voltage drop across the forward biased diode. | 12-03-2009 |
| 20100187656 | Bipolar Junction Transistors and Methods of Fabrication Thereof - Design and methods for fabricating bipolar junction transistors are described. In one embodiment, a semiconductor device includes a first fin comprising a first emitter region, a first base region, and a first collector region. The first emitter region, the first base region, and the first collector region form a bipolar junction transistor. A second fin is disposed adjacent and parallel to the first fin. The second fin includes a first contact to the first base region. | 07-29-2010 |
| 20100320572 | Thin-Body Bipolar Device - A thin-body bipolar device includes: a semiconductor substrate, a semiconductor fin constructed over the semiconductor substrate, a first region of the semiconductor fin having a first conductivity type, the first region serving as a base of the thin-body bipolar device, and a second and third region of the semiconductor fin having a second conductivity type opposite to the first conductivity type, the second and third region being both juxtaposed with and separated by the first region, the second and third region serving as an emitter and collector of the thin-body bipolar device, respectively. | 12-23-2010 |
| 20100327148 | CMOS Image Sensors Formed of Logic Bipolar Transistors - An integrated circuit structure includes an image sensor cell, which further includes a photo transistor configured to sense light and to generate a current from the light. | 12-30-2010 |
| 20110090012 | CIRCUIT AND METHOD FOR RADIO FREQUENCY AMPLIFIER - A radio frequency amplifier circuit includes a substrate that is capable of receiving a substrate bias voltage. The source of a transistor is capable of receiving a source bias voltage. The drain of the transistor is capable of receiving a drain bias voltage. The gate of the transistor is located between the source and the drain. A radio frequency input signal is coupled to the gate. A substrate bias circuit provides the substrate bias voltage. The substrate bias voltage and the source bias voltage forward bias the first diode formed by the source and the substrate. The substrate bias voltage and the drain bias voltage reverse bias the second diode formed by the drain and the substrate. | 04-21-2011 |
| 20110090198 | LCD DRIVER - A method includes outputting a first signal from a first DAC decoder circuit in response to receiving a first number of bits of a digital control signal, outputting a second signal from a second DAC decoder circuit in response to receiving a second number of bits of the digital control signal, and alternately outputting one of the first and second signals to an LCD column from a buffer coupled to the first and second DAC decoder circuits. The first signal has a voltage level equal to one of a first plurality of voltage levels received at one of a first plurality of inputs of the first DAC decoder circuit. The second signal has a voltage level equal to one of a second plurality of voltage levels received at one of a second plurality of inputs of the second DAC decoder circuit. | 04-21-2011 |
| 20110186909 | ESD PROTECTION CIRCUIT FOR RFID TAG - An electrostatic discharge (ESD) protection circuit structure includes a dual directional silicon controlled rectifier (SCR) formed in a substrate. The SCR includes first and second P-wells laterally interposed by an N-well. A deep N-well is disposed underneath the P-wells and the N-well. First and second N-type regions are disposed in the first and second P-wells, respectively, and are coupled to a pair of pads. First and second P-type regions are disposed in the first and second P-wells, respectively, are coupled to the pads, and are disposed closer to the N-well than the first and second N-type regions, respectively. | 08-04-2011 |
