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Freitag

Bert Freitag, Eindhoven NL

Patent application numberDescriptionPublished
20090133167METHOD FOR OBTAINING A SCANNING TRANSMISSION IMAGE OF A SAMPLE IN A PARTICLE-OPTICAL APPARATUS - A method for improving the resolution of STEM images of thick samples. In STEM, the diameter of the cross-over depends on the opening half-angle α of the beam and can be as low as 0.1 nm. For optimum resolution an opening half-angle is chosen at which the diameter of the cross-over R(α) shows a minimum. For thick samples the resolution is, for those parts of the sample removed from the cross-over plane, limited by the convergence of the beam, resulting in a diameter D of the beam at the surface of the sample. The opening angle is chosen to balance the contribution of convergence and of diameter of the cross-over by choosing an opening half-angle smaller than the optimum opening half-angle. Effectively the sample is then scanned with a beam that has a substantially constant diameter over the length of the sample material through which the electrons have to travel.05-21-2009
20100148064X-RAY DETECTOR FOR ELECTRON MICROSCOPE - Multiple detectors arranged in a ring within a specimen chamber provide a large solid angle of collection. The detectors preferably include a shutter and a cold shield that reduce ice formation on the detector. By providing detectors surrounding the sample, a large solid angle is provided for improved detection and x-rays are detected regardless of the direction of sample tilt.06-17-2010

Bert Henning Freitag, Eindhoven NL

Patent application numberDescriptionPublished
20100032567Method of Machining a Work Piece with a Focused Particle Beam - The invention relates to a method for producing high-quality samples for e.g. TEM inspection. When thinning samples with e.g. a Focused Ion Beam apparatus (FIB), the sample often oxidizes when taken from the FIB due to the exposure to air. This results in low-quality samples, that may be unfit for further analysis. By forming a passivation layer, preferably a hydrogen passivation layer, on the sample in situ, that is: before taking the sample from the FIB, high quality.02-11-2010
20110006208Method for Inspecting a Sample - The invention describes a method for inspecting samples in an electron microscope. A sample carrier 01-13-2011

Patent applications by Bert Henning Freitag, Eindhoven NL

Nicholas Freitag, Orsay FR

Patent application numberDescriptionPublished
20110058904Stabilizing Reinforcement For Use In Reinforced Soil Works - Stabilizing reinforcement (03-10-2011

Nicolas Freitag, Orsay FR

Patent application numberDescriptionPublished
20090123238Stabilizing Strip Intended for Use in Reinforced Earth Structures - Stabilizing strip (05-14-2009
20100092249GROUND REINFORCED STRUCTURE AND REINFORCEMENT MEMBERS FOR THE CONSTRUCTION THEREOF - The invention relates to a ground reinforced structure that comprises a fill (04-15-2010
20100254770Reinforced Stabilising Strip Intended for Use in Reinforced Earth Structures - Reinforced stabilising strip (10-07-2010
20110044771FLEXIBLE STABILIZING STRIP INTENDED TO BE USED IN REINFORCED SOIL CONSTRUCTIONS - Flexible stabilizing strip (02-24-2011

Patent applications by Nicolas Freitag, Orsay FR

Norbert Freitag, Hochst AT

Patent application numberDescriptionPublished
20090173290PROTECTIVE CLOTHING FOR ANIMALS - Protective clothing for animals is formed from an elastic woven, meshed, or knitted fabric, and individual sections (07-09-2009

Thomas Freitag, Leper BE

Patent application numberDescriptionPublished
20090108783Rotor orientation detection in brushless DC motors - In order to determine the orientation of the rotor of a brushless DC motor 04-30-2009