Patent application number | Description | Published |
20080209284 | Input/output compression and pin reduction in an integrated circuit - An I/O compression apparatus, for testing a memory array and/or a logic circuit, is comprised of a selectable compression circuit that outputs compressed test data from the memory array/logic circuit. An I/O scan register is coupled to each I/O pad for converting serial data to parallel and parallel data to serial in response to a test mode select signal, a test data input, and a test clock. | 08-28-2008 |
20080212371 | NON-VOLATILE MEMORY COPY BACK - Data move operations in a memory device are described that enable identification of data errors. During a write operation, identified errors are flagged and used to provide an error status during the data move operation. Results of the error detection can be accessed by a memory controller for data repair operations by the controller. | 09-04-2008 |
20080259689 | MIMICKING PROGRAM VERIFY DRAIN RESISTANCE IN A MEMORY DEVICE - A selected word line is biased with a program verify voltage. A predetermined quantity of unselected word lines that are between the selected word line and the bit line are biased with a modified V | 10-23-2008 |
20080304317 | SOLID STATE MEMORY UTILIZING ANALOG COMMUNICATION OF DATA VALUES - Memory devices adapted to process and generate analog data signals representative of data values of two or more bits of information facilitate increases in data transfer rates relative to devices processing and generating only binary data signals indicative of individual bits. Programming of such memory devices includes programming to a target threshold voltage range representative of the desired bit pattern. Reading such memory devices includes generating an analog data signal indicative of a threshold voltage of a target memory cell. This analog signal may then be processed to convert it to a digital representation of the individual bits of the bit pattern represented by the analog signal. Such memory devices may be incorporated into bulk storage devices, and may utilize form factors and communication protocols of hard disk drives (HDDs) and other traditional bulk storage devices for transparent replacement of such traditional bulk storage devices in electronic systems. | 12-11-2008 |
20080310222 | PROGRAMMING RATE IDENTIFICATION AND CONTROL IN A SOLID STATE MEMORY - Memory devices adapted to receive and transmit analog data signals representative of bit patterns of two or more bits facilitate increases in data transfer rates relative to devices communicating data signals indicative of individual bits. Programming of such memory devices includes determining a rate of programming (i.e., rate of movement of the respective threshold voltage) of the memory cells and biasing the corresponding bit line with a programming rate control voltage that is greater than the bit line enable voltage and less than the inhibit voltage. This voltage can be adjusted to change the speed of programming. A capacitor coupled to the bit line stores the programming rate control voltage in order to maintain the proper bit line bias for the duration of the programming operation or until it is desired to change the programming rate. | 12-18-2008 |
20080310224 | Coarse and fine programming in a solid state memory - Memory devices adapted to receive and transmit analog data signals representative of bit patterns of two or more bits facilitate increases in data transfer rates relative to devices communicating data signals indicative of individual bits. Programming of such memory devices includes initially programming a cell with a coarse programming pulse to move its threshold voltage in a large step close to the programmed state. The neighboring cells are then programmed using coarse programming. The algorithm then returns to the initially programmed cells that are then programmed with one or more fine pulses that slowly move the threshold voltage in smaller steps to the final programmed state threshold voltage. | 12-18-2008 |
20080310225 | Programming of a solid state memory utilizing analog communication of bit patterns - Memory devices adapted to receive and transmit analog data signals representative of bit patterns of two or more bits facilitate increases in data transfer rates relative to devices communicating data signals indicative of individual bits. Programming of such memory devices includes preprogramming erased memory cells that are to be programmed to a known V | 12-18-2008 |
20080313493 | PROGRAMMING ERROR CORRECTION CODE INTO A SOLID STATE MEMORY DEVICE WITH VARYING BITS PER CELL - Memory devices that, in a particular embodiment, receive and transmit analog data signals representative of bit patterns of two or more bits such as to facilitate increases in data transfer rates relative to devices communicating data signals indicative of individual bits. Programming error correction code (ECC) and metadata into such memory devices includes storing the ECC and metadata at different bit levels per cell based on an actual error rate of the cells. The ECC and metadata can be stored with the data block at a different bit level than the data block. If the area of memory in which the block of data is stored does not support the desired reliability for the ECC and metadata at a particular bit level, the ECC and metadata can be stored in other areas of the memory array at different bit levels. | 12-18-2008 |
20080316812 | PROGRAMMING A MEMORY WITH VARYING BITS PER CELL - Memory devices adapted to receive and transmit analog data signals representative of two or more bits, such as to facilitate increases in data transfer rates relative to devices communicating data signals indicative of individual bits. A controller and a read/write channel convert the digital bit patterns to analog data signals to be stored in a memory array at a particular bit capacity level in order to achieve a desired level of reliability. | 12-25-2008 |
20090021987 | Analog sensing of memory cells in a solid state memory device - A memory device that includes a sample and hold circuit coupled to a bit line. The sample and hold circuit stores a target threshold voltage for a selected memory cell. The memory cell is programmed and then verified with a ramped read voltage. The read voltage that turns on the memory cell is stored in the sample and hold circuit. The target threshold voltage is compared with the read voltage by a comparator circuit. When the read voltage is at least substantially equal to (i.e., is substantially equal to and/or starts to exceed) the target threshold voltage, the comparator circuit generates an inhibit signal. | 01-22-2009 |
20090024904 | Refresh of non-volatile memory cells based on fatigue conditions - In one or more of the disclosed embodiments, memory cells in a memory device are refreshed upon an indication of a fatigue condition. In one such embodiment, controller monitors behavior parameters of the cells and determines if any of the parameters are outside of a normal range set for each one, thus indicating a fatigue condition. If any cell indicates a fatigue condition, the data from the block of cells indicating the fatigue is moved to another block. In one embodiment, an error detection and correction process is performed on the data prior to being written into another memory block. | 01-22-2009 |
20090027960 | Cell deterioration warning apparatus and method - Memory devices and methods adapted to process and generate analog data signals representative of data values of two or more bits of information facilitate increases in data transfer rates relative to devices processing and generating only binary data signals indicative of individual bits. Programming of such memory devices includes programming to a target threshold voltage range representative of the desired bit pattern. Reading such memory devices includes generating an analog data signal indicative of a threshold voltage of a target memory cell. Warning of cell deterioration can be performed using reference cells programmed in accordance with a known pattern such as to approximate deterioration of non-volatile memory cells of the device. | 01-29-2009 |
20090027962 | MULTIPLE LEVEL CELL MEMORY DEVICE WITH SINGLE BIT PER CELL, RE-MAPPABLE MEMORY BLOCK - A non-volatile memory device has a plurality of memory cells that are organized into memory blocks. Each block can operate in either a multiple level cell mode or a single bit per cell mode. One dedicated memory block is capable of operating only in the single bit per cell mode. If the dedicated memory block is found to be defective, a defect-free block can be remapped to that dedicated memory block location to act only in the single bit per cell mode. | 01-29-2009 |
20090027970 | Programming based on controller performance requirements - Methods and solid state drives are disclosed, for example a solid state drive that is adapted to receive and transmit analog data signals representative of bit patterns of three or more levels (such as to facilitate increases in data transfer rates relative to devices communicating data signals indicative of individual bits). Programming of the solid state drive, comprising an array of non-volatile memory cells, might include adjusting the level of each memory cell being programmed in response to a desired performance level of a controller circuit. | 01-29-2009 |
20090034331 | NAND MEMORY DEVICE COLUMN CHARGING - Embodiments of NAND Flash memory devices and methods recognize that effective column coupling capacitance can be reduced by maintaining a sourced voltage on adjacent columns of an array. Maintaining the columns in a charged state prior to array operations (read, write, and program) reduces current surges and improves data read timing. Devices and methods charge the array columns at pre-charge and following array access operations. | 02-05-2009 |
20090039468 | N WELL IMPLANTS TO SEPARATE BLOCKS IN A FLASH MEMORY DEVICE - A semiconductor memory device that has an isolated area comprised of one conductivity and formed in part by a buried layer of a second conductivity that is implanted in a substrate. The walls of the isolated area are formed by implants that are comprised of the second conductivity and extend down to the buried layer. The isolated region has implanted source lines and is further subdivided by overlay strips of the second conductivity that extend substantially down to the buried layer. Each isolation region can contain one or more blocks of memory cells. | 02-12-2009 |
20090066547 | ANALOG-TO-DIGITAL AND DIGITAL-TO-ANALOG CONVERSION WINDOW ADJUSTMENT BASED ON REFERENCE CELLS IN A MEMORY DEVICE - An analog-to-digital conversion window is defined by reference voltages stored in reference memory cells of a memory device. A first reference voltage is read to define an upper limit of the conversion window and a second reference voltage is read to define a lower limit of the conversion window. An analog voltage representing a digital bit pattern is read from a memory cell and converted to the digital bit pattern by an analog-to-digital conversion process using the conversion window as the limits for the sampling process. This scheme helps in real time tracking of the ADC window with changes in the program window of the memory array. | 03-12-2009 |
20090067240 | PROGRAMMING A MEMORY WITH VARYING BITS PER CELL - Memory devices adapted to receive and transmit analog data signals representative of two or more bits, such as to facilitate increases in data transfer rates relative to devices communicating data signals indicative of individual bits. A controller and a read/write channel convert the digital bit patterns to analog data signals to be stored in a memory array at a particular bit capacity level in order to achieve a desired level of reliability. | 03-12-2009 |
20090067251 | REDUCING NOISE IN SEMICONDUCTOR DEVICES - The present disclosure includes methods, devices, modules, and systems for reducing noise in semiconductor devices. One method embodiment includes applying a reset voltage to a control gate of a semiconductor device for a period of time. The method further includes sensing the state of the semiconductor device after applying the reset voltage. | 03-12-2009 |
20090067266 | MEMORY CONTROLLER SELF-CALIBRATION FOR REMOVING SYSTEMIC INFLUENCE - Self-calibration for a memory controller is performed by writing a voltage to a selected cell. Adjacent cells around the selected cell are programmed. After each of the adjacent programming operations, the voltage on the selected cell is read to determine any change in voltage caused by systemic offsets such as, for example, floating gate-to-floating gate coupling. These changes are averaged and stored in a table as an offset for use in adjusting a programming voltage or a read voltage in a particular area of memory represented by the offset. Self calibration method for temperature is determined by writing cells at different temperatures and reading at different temperatures to generate temperature offset tables for the write path and read path. These offset tables are used to adjust for systematic temperature related offsets during programming and during read. | 03-12-2009 |
20090094407 | Non-volatile memory device having assignable network identification - Memory devices and methods disclosed such as memory devices that include a network identification that uniquely identifies the memory device on a network. The memory device can then receive memory commands that include the network identification. The memory device can also generate memory commands, including the network identification, for broadcast over the network. | 04-09-2009 |
20090097311 | NON-EQUAL THRESHOLD VOLTAGE RANGES IN MLC NAND - Memory devices adapted to process and generate analog data signals representative of data values of two or more bits of information facilitate increases in data transfer rates relative to devices processing and generating only binary data signals indicative of individual bits. Programming of such memory devices includes programming to a target threshold voltage range representative of the desired bit pattern. Reading such memory devices includes generating an analog data signal indicative of a threshold voltage of a target memory cell. Threshold voltage ranges of the memory cells have a larger range size for ranges that include lower threshold voltages and a smaller range size for ranges that include higher threshold voltages since program disturb is lower at higher threshold voltages. | 04-16-2009 |
20090097318 | Programming sequence in NAND memory - An analog voltage NAND architecture non-volatile memory device and programming process is described that reduce the effects of NAND string resistance in source follower sensing by programming the cells in NAND memory cell strings to maintain the resistance presented by the unselected cells on the source-side of a given selected memory cell of the NAND string during both the verify and read. In particular, in one embodiment of the present invention, the cells in the NAND string are programmed sequentially in order from the cells closest the bit line to the final cell that is closest the source line in the string. This allows the source follower sensing of the verify and later read operations to read the programmed threshold voltage across the same stable source-side resistance | 04-16-2009 |
20090103365 | Sensing of memory cells in NAND flash - An analog voltage NAND architecture non-volatile memory data read/verify process and circuits is described that senses analog voltages in non-volatile cells utilizing source follower voltage sensing. In a source follower sensing or read operation the programmed threshold voltage of a cell in a NAND string of a NAND architecture Flash memory array is read by applying an elevated voltage to the source line, an elevated pass voltage (Vpass) is placed on the gates of the unselected cells of the string to place them in a pass through mode of operation, and a read gate voltage (Vg) is applied to the gate of the selected cell. The selected memory cell operates as a source follower to set a voltage on the coupled bit line at the read gate voltage minus the threshold voltage of the cell (Vg−Vt), allowing the voltage of the cell to be directly sensed or sampled. | 04-23-2009 |
20090106482 | MEMORY DEVICE PROGRAM WINDOW ADJUSTMENT - In one or more embodiments, a memory device is disclosed as having an adjustable programming window having a plurality of programmable levels. The programming window is moved to compensate for changes in reliable program and erase thresholds achievable as the memory device experiences factors such as erase/program cycles that change the program window. The initial programming window is determined prior to an initial erase/program cycle. The programming levels are then moved as the programming window changes, such that the plurality of programmable levels still remain within the program window and are tracked with the program window changes. | 04-23-2009 |
20090129146 | MITIGATION OF DATA CORRUPTION FROM BACK PATTERN AND PROGRAM DISTURB IN A NON-VOLATILE MEMORY DEVICE - In one of the disclosed embodiments, a write algorithm is used to remove errors due to back pattern effects, cell-to-cell capacitive coupling, and program disturb in memory cells. Original data to be programmed is adjusted prior to an initial programming operation of the memory cells. The original data is then programmed into the memory cells in another programming operation. In an alternate embodiment, a read adjustment weight data value is associated with each series string of memory cells. The weight data value is used to compensate data read during an initial word line read. The weight data value is updated after each read and read adjustment such that the adjusted weight data value is used on the subsequent read operations. | 05-21-2009 |
20090129151 | READ METHOD FOR MLC - Memory devices adapted to process and generate analog data signals representative of data values of two or more bits of information facilitate increases in data transfer rates relative to devices processing and generating only binary data signals indicative of individual bits. Programming of such memory devices includes programming to a target threshold voltage range representative of the desired bit pattern. Reading such memory devices includes generating an analog data signal indicative of a threshold voltage of a target memory cell. Cell reads are performed multiple times and the read threshold voltages averaged to more closely approximate actual threshold voltage and to compensate for random noise. | 05-21-2009 |
20090129152 | PROGRAM AND READ METHOD FOR MLC - Memory devices adapted to process and generate analog data signals representative of data values of two or more bits of information facilitate increases in data transfer rates relative to devices processing and generating only binary data signals indicative of individual bits. Programming of such memory devices includes programming to a target threshold voltage range representative of the desired bit pattern. Reading such memory devices includes generating an analog data signal indicative of a threshold voltage of a target memory cell. Program and read operations are performed in opposite directions to allow for subtraction of impact of subsequently programmed cells on target cells being read. | 05-21-2009 |
20090129153 | M+N BIT PROGRAMMING AND M+L BIT READ FOR M BIT MEMORY CELLS - A memory device and programming and/or reading process is described that programs and/or reads the cells in the memory array with higher threshold voltage resolution than required. In programming non-volatile memory cells, this allows a more accurate threshold voltage placement during programming and enables pre-compensation for program disturb, increasing the accuracy of any subsequent read or verify operation on the cell. In reading/sensing memory cells, the increased threshold voltage resolution allows more accurate interpretations of the programmed state of the memory cell and also enables more effective use of probabilistic data encoding techniques such as convolutional code, partial response maximum likelihood (PRML), low-density parity check (LDPC), Turbo, and Trellis modulation encoding and/or decoding, reducing the overall error rate of the memory. | 05-21-2009 |
20090129177 | SENSING OF MEMORY CELLS IN A SOLID STATE MEMORY DEVICE BY FIXED DISCHARGE OF A BIT LINE - In one or more of the disclosed embodiments, a memory device is provided that reads a target memory cell by first charging the series string of memory cells to which the target memory cell is coupled. A fixed unit of charge is removed from the charged bit line. The bit line is sensed by sense amplifiers to determine the read voltage (i.e., threshold voltage) applied to a word line coupled to the target cell in order to turn on the target cell. The threshold voltage is indicative of the analog voltage stored on the target memory cell. | 05-21-2009 |
20090141558 | Sensing memory cells - The present disclosure includes methods, devices, modules, and systems for operating memory cells. One method embodiment includes applying a ramping voltage to a control gate of a memory cell and to an analog-to-digital converter (ADC). The aforementioned embodiment of a method also includes detecting an output of the ADC at least partially in response to when the ramping voltage causes the memory cell to trip sense circuitry. | 06-04-2009 |
20090147584 | NAND ARCHITECTURE MEMORY DEVICES AND OPERATION - Non-volatile memory devices utilizing a modified NAND architecture where both ends of the NAND string of memory cells are selectively coupled to the same bit line may facilitate increased memory densities, reduced fabrication steps and faster read operations when compared to traditional NAND memory array architectures. Programming and erasing of the memory cells can be accomplished in the same manner as a traditional NAND memory array. However, reading of the memory cells may be accomplished using charge sharing techniques similar to read operations in a DRAM device. | 06-11-2009 |
20090185415 | CELL OPERATION MONITORING - Memory devices adapted to process and generate analog data signals representative of data values of two or more bits of information facilitate increases in data transfer rates relative to devices processing and generating only binary data signals indicative of individual bits. Programming of such memory devices includes programming to a target threshold voltage range representative of the desired bit pattern. Reading such memory devices includes generating an analog data signal indicative of a threshold voltage of a target memory cell. Atypical cell, block, string, column, row, etc. . . . operation is monitored and locations and type of atypical operation stored. Adjustment of operation is performed based upon the atypical cell operation. | 07-23-2009 |
20090187689 | NON-VOLATILE MEMORY WITH LPDRAM - Memory, systems and devices are disclosed where a non-volatile memory device (such as a Flash memory device) is paired with a LPDRAM memory device or array and configures the LPDRAM by utilizing routines stored in the non-volatile memory executing on a controller or state machine of the either the LPDRAM or non-volatile memory. This allows the configuration of the LPDRAM to be self contained and occur under local control of the controller or state machine of the non-volatile memory (or LPDRAM) utilizing these pre-stored LPDRAM configuration routines, eliminating the need for the system designer to have to account for and configure the LPDRAM and its specific configuration and/or routines with the system processor or operating system. | 07-23-2009 |
20090190404 | NAND FLASH CONTENT ADDRESSABLE MEMORY - NAND architecture non-volatile content addressable (CAM) memory devices and methods are described that allows for high density, low cost CAM devices. In addition, the NAND architecture non-volatile CAM memory operates with reduced power consumption characteristics for low power and portable applications. In one NAND architecture non-volatile CAM memory embodiment a wired NOR match line array is utilized. In another embodiment a NAND match line array is shown. In yet other embodiments, hierarchal addressing, hash addressing, tree search and algorithmic/hardware engine based search is detailed utilizing both conventional NAND architecture non-volatile Flash memory arrays and dedicated NAND architecture CAM arrays utilizing wired NOR and wired NAND match lines. | 07-30-2009 |
20090201736 | INCREASED NAND FLASH MEMORY READ THROUGHPUT - A method of reading sequential pages of flash memory from alternating memory blocks comprises loading data from a first page into a first primary data cache and a second page into a second primary data cache simultaneously, the first and second pages loaded from different blocks of flash memory. Data from the first primary data cache is stored in a first secondary data cache, and data from the second primary data cache is stored in a second secondary data cache. Data is sequentially provided from the first and second secondary data caches by a multiplexer coupled to the first and second data caches. | 08-13-2009 |
20090213655 | MEMORY SYSTEM WITH USER CONFIGURABLE DENSITY/PERFORMANCE OPTION - The memory system has one or more memory dies coupled to a processor or other system controller. Each die has a separate memory array organized into multiple memory blocks. The different memory blocks of each die can be assigned a different memory density by the end user, depending on the desired memory performance and/or memory density. The user configurable density/performance option can be adjusted with special read/write operations or a configuration register having a memory density configuration bit for each memory block. | 08-27-2009 |
20090231926 | ANALOG SENSING OF MEMORY CELLS WITH A SOURCE FOLLOWER DRIVER IN A SEMICONDUCTOR MEMORY DEVICE - Memory devices, methods, and sample and hold circuits are disclosed, including a memory device that includes a sample and hold circuit coupled to a bit line. One such sample and hold circuit includes a read circuit, a verify circuit, and a reference circuit. The read circuit stores a read threshold voltage that was read from a selected memory cell. The verify circuit stores a target threshold voltage that is compared to the read threshold voltage to generate an inhibit signal when the target and read threshold voltages are substantially equal. The reference circuit stores a reference threshold voltage that can be used to translate the read threshold voltage to compensate for a transistor voltage drop and/or temperature variations. | 09-17-2009 |
20090251969 | ANALOG READ AND WRITE PATHS IN A SOLID STATE MEMORY DEVICE - A memory array in a memory device is coupled to an analog I/O data interface that enables analog voltage levels to be written to the memory array. The I/O interface is comprised of a plurality of analog data paths that each includes a capacitor for storing charge corresponding to a target voltage to which a selected memory cell, coupled to its respective data path, is to be programmed. A plurality of comparators can be included in the I/O interface, with each such comparator coupled to a respective bit line. Such a comparator can compare a threshold voltage of a selected memory cell to its target voltage and inhibits further programming when the threshold voltage equals or exceeds the target voltage. | 10-08-2009 |
20090257279 | MEMORY DEVICE OPERATION - Non-volatile memory devices utilizing a modified NAND architecture where ends of the NAND string of memory cells are selectively coupled to different bit lines may facilitate increased memory densities, reduced fabrication steps and faster read operations when compared to traditional NAND memory array architectures. Programming and erasing of the memory cells can be accomplished in the same manner as a traditional NAND memory array. However, reading of the memory cells may be accomplished using charge sharing techniques similar to read operations in a DRAM device or by using one bit line as a ground node for sensing current flow through the strings. The use of bit lines for virtual grounding is further suitable to other array architectures. | 10-15-2009 |
20090257288 | APPARATUS AND METHOD FOR INCREASING DATA LINE NOISE TOLERANCE - Circuits and methods for improving noise tolerance in memories are disclosed such as those that include biasing a data line above a normal threshold voltage, either by providing a higher data line charge voltage with a voltage source, or by providing a higher data line charge voltage with a current source. | 10-15-2009 |
20090268520 | LEAKAGE COMPENSATION DURING PROGRAM AND READ OPERATIONS - Methods of operating a memory and a memory are disclosed, such as an analog non-volatile memory device and process that reduces the effects of charge leakage from data cache capacitors, maintaining stored charge levels as data. In one embodiment, data values are compensated for leakage that is uniform across the data cache by charging a reference capacitor or initiating another leakage model and uniformly adjusting the ground of the data capacitors by the effect amount or by adjusting an amplifier offset or gain. In another embodiment, held data values are compensated for charge leakage effects that are non-uniform due to data values being sequentially transferred into the data cache by scaling a ground node or adjustment of amplifier offset/gain of each capacitor in the data cache against the leakage reference and the order in which data was transferred into the data cache. | 10-29-2009 |
20090303788 | METHODS AND APPARATUS UTILIZING PREDICTED COUPLING EFFECT IN THE PROGRAMMING OF NON-VOLATILE MEMORY - Methods and memory devices configured to utilize predicted coupling effects of neighboring memory cells in the programming of target memory cells can be utilized to tighten the distribution of threshold voltages for a given bit pattern by compensating for anticipated threshold voltage shift due to capacitive coupling, which can facilitate more discernable Vt ranges, and thus a higher number of bits of data per memory cell. Tightening the distribution of threshold voltages can further facilitate wider margins between Vt ranges, and thus an increased reliability in reading the correct data value of a memory cell. | 12-10-2009 |
20090307542 | MEMORY MEDIA CHARACTERIZATION FOR DEVELOPMENT OF SIGNAL PROCESSORS - Methods and apparatus utilizing media characterization of memory devices facilitate the development of signal processors for analyzing memory device outputs. Models are developed from capturing output of memory devices of the type utilizing analog signals to communicate data values of two or more bits of information. The models are used to generate signals representative of the expected output of a memory device having an input data pattern. Read channels and/or controllers then process those signals to determine an output data pattern. By comparing the output data pattern to the input data pattern, the accuracy of the signal processing can be gauged. | 12-10-2009 |
20090310406 | M+L BIT READ COLUMN ARCHITECTURE FOR M BIT MEMORY CELLS - A memory device and programming and/or reading process is described that programs a row of non-volatile multi-level memory cells (MLC) in a single program operation to minimize disturb within the pages of the row, while verifying each memory cell page of the row separately. In one embodiment of the present invention, the memory device utilizes data latches to program M-bits of data into each cell of the row and then repurposes the data latches during the subsequent page verify operations to read M+L bits from each cell of the selected page at a higher threshold voltage resolution than required. In sensing, the increased threshold voltage resolution/granularity allows interpretations of the actual programmed state of the memory cell and enables more effective use of data encoding and decoding techniques such as convolutional codes where additional granularity of information is used to make soft decisions reducing the overall memory error rate. | 12-17-2009 |
20090310407 | SENSING AGAINST A REFERENCE CELL - Memory devices, bulk storage devices, and methods of operating memory are disclosed, such as those adapted to process and generate analog data signals representative of data values of two or more bits of information. Programming of such memory devices can include programming to a target threshold voltage within a range representative of the desired bit pattern. Reading such memory devices can include generating an analog data signal indicative of a threshold voltage of a target memory cell. The target memory cell can be sensed against a reference cell includes a dummy string of memory cells connected to a target string of memory cells, and, such as by using a differential amplifier to sense a difference between a reference cell and the target cell. This may allow a wider range of voltages to be used for data states. | 12-17-2009 |
20090327594 | APPARATUS AND METHODS FOR PROGRAMMING MULTILEVEL-CELL NAND MEMORY DEVICES - Methods and apparatus are provided. A first data value is read from a first memory cell and is stored. An attempt is made to add a second data value to the first memory cell. If the attempt to add the second data value to the first memory cell is unsuccessful, the first data value and the second data value are written to one or more other memory cells. | 12-31-2009 |
20100017665 | DEFECTIVE MEMORY BLOCK IDENTIFICATION IN A MEMORY DEVICE - During manufacture and testing of a memory device, a memory test is performed to determine which, if any, memory blocks are defective. A memory map of the defective blocks is stored in one of the defect-free memory blocks so that it can be read later by a controller during normal operation of the memory device. In one embodiment, the memory test is for a programmability test to determine if the memory block can be programmed. An indication of programmability is stored in each block in a predetermined location. | 01-21-2010 |
20100039863 | MITIGATION OF RUNAWAY PROGRAMMING OF A MEMORY DEVICE - Methods for mitigating runaway programming in a memory device, methods for program verifying a memory device, a memory device, and a memory system are provided. In one such method, a ramp voltage signal is generated by a digital count signal. A memory cell being program verified is turned on by a particular verify voltage of the ramp voltage signal in response to a digital count of the digital count signal. The memory cell turning on generates a bit line indication that causes the digital count to be compared to a representation of the target data to be programmed in the memory cell. The comparator circuit generates an indication when the digital count is greater than or equal to the target data. | 02-18-2010 |
20100039866 | SENSING OF MEMORY CELLS IN A SOLID STATE MEMORY DEVICE BY FIXED DISCHARGE OF A BIT LINE - In one or more of the disclosed embodiments, a memory device is provided that reads a target memory cell by first charging the series string of memory cells to which the target memory cell is coupled. A fixed unit of charge is removed from the charged bit line. The bit line is sensed by sense amplifiers to determine the read voltage (i.e., threshold voltage) applied to a word line coupled to the target cell in order to turn on the target cell. The threshold voltage is indicative of the analog voltage stored on the target memory cell. | 02-18-2010 |
20100046299 | PROGRAMMING RATE IDENTIFICATION AND CONTROL IN A SOLID STATE MEMORY - Memory devices adapted to receive and transmit analog data signals representative of bit patterns of two or more bits facilitate increases in data transfer rates relative to devices communicating data signals indicative of individual bits. Programming of such memory devices includes determining a rate of programming (i.e., rate of movement of the respective threshold voltage) of the memory cells and biasing the corresponding bit line with a programming rate control voltage that is greater than the bit line enable voltage and less than the inhibit voltage. This voltage can be adjusted to change the speed of programming. A capacitor coupled to the bit line stores the programming rate control voltage in order to maintain the proper bit line bias for the duration of the programming operation or until it is desired to change the programming rate. | 02-25-2010 |
20100046300 | REDUCTION OF QUICK CHARGE LOSS EFFECT IN A MEMORY DEVICE - Methods for reducing quick charge loss effects, methods for programming, memory devices, memory devices, and memory systems are disclosed. In one such method, a programming pulse is applied to the word line to increase the threshold voltage of the memory cells being programmed. A negative voltage pulse is applied to the word line after the programming pulse to force any electrons trapped in the tunnel oxide of memory cells being programmed back into the tunnel region. After the negative pulse, a program verify operation is performed. | 02-25-2010 |
20100074010 | MEMORY DEVICE REFERENCE CELL PROGRAMMING METHOD AND APPARATUS - Memory devices and methods are disclosed, such as those facilitating an assignment scheme of reference cells throughout an array of memory cells. For example, one such assignment scheme assigns reference cells in a staggered pattern by row wherein each column contains a single reference cell. Additional schemes of multiple reference cells assigned in a repeating or a pseudo-random pattern are also disclosed. | 03-25-2010 |
20100074024 | PROGRAMMING A MEMORY DEVICE TO INCREASE DATA RELIABILITY - Methods for programming a memory array, memory devices, and memory systems are disclosed. In one such method, the target reliability of the data to be programmed is determined. The relative reliability of different groups of memory cells of the memory array is determined. The data is programmed into the group of memory cells of the array having a relative reliability corresponding to the target reliability. | 03-25-2010 |
20100085808 | READ METHOD FOR MLC - Memory devices adapted to process and generate analog data signals representative of data values of two or more bits of information facilitate increases in data transfer rates relative to devices processing and generating only binary data signals indicative of individual bits. Programming of such memory devices includes programming to a target threshold voltage range representative of the desired bit pattern. Reading such memory devices includes generating an analog data signal indicative of a threshold voltage of a target memory cell. Cell reads are performed multiple times and the read threshold voltages averaged to more closely approximate actual threshold voltage and to compensate for random noise. | 04-08-2010 |
20100091565 | M+N BIT PROGRAMMING AND M+L BIT READ FOR M BIT MEMORY CELLS - A memory device and programming and/or reading process is described that programs and/or reads the cells in the memory array with higher threshold voltage resolution than required. In programming non-volatile memory cells, this allows a more accurate threshold voltage placement during programming and enables pre-compensation for program disturb, increasing the accuracy of any subsequent read or verify operation on the cell. In reading/sensing memory cells, the increased threshold voltage resolution allows more accurate interpretations of the programmed state of the memory cell and also enables more effective use of probabilistic data encoding techniques such as convolutional code, partial response maximum likelihood (PRML), low-density parity check (LDPC), Turbo, and Trellis modulation encoding and/or decoding, reducing the overall error rate of the memory. | 04-15-2010 |
20100110798 | PROGRAM WINDOW ADJUST FOR MEMORY CELL SIGNAL LINE DELAY - A memory device and programming and/or reading process is described that compensates for memory cell signal line propagation delays, such as to increase the overall threshold voltage range and non-volatile memory cell states available. Memory cell signal line propagation delay compensation can be accomplished by characterizing the memory cell signal line propagation delay, such as determining an amount of error due to the delay, and pre-compensating the programmed threshold voltage of the memory cells based on the amount of error induced by the memory cell signal line propagation delay and cell location on the selected memory cell signal line. Alternatively, memory cell signal line propagation delay can be post-compensated for, or the pre-compensation fine tuned, after sensing the threshold voltages of the selected memory cells based on the amount of error induced by the memory cell signal line propagation delay and cell location on the selected memory cell signal line. Other methods, devices, etc., are also disclosed. | 05-06-2010 |
20100115176 | DATA TRANSFER AND PROGRAMMING IN A MEMORY DEVICE - Methods for data transfer and/or programming a memory device, memory devices and memory systems are provided. According to at least one such method, additional data is appended to original data and the resulting data is programmed in a selected memory cell. The appended data increases the program threshold voltage margin of the original data. The appended data can be a duplicate of the original data or logical zeros. When the selected memory cell is read, the memory control circuitry can read just the original data in the MSB field or the memory control circuitry can read the entire programmed data and ignore the LSB field, for example. | 05-06-2010 |
20100115344 | MACRO AND COMMAND EXECUTION FROM MEMORY ARRAY - Methods and apparatus for executing internal operations of memory devices utilizing instructions stored in the memory array of the memory device are disclosed. Decode blocks adapted to interpret instructions and data stored in the memory device are also disclosed. Methods can be used to perform internal self-test operations of the memory device by executing test procedures stored in the memory array of the memory device performing a self-test operation. | 05-06-2010 |
20100122103 | CONFIGURABLE DIGITAL AND ANALOG INPUT/OUTPUT INTERFACE IN A MEMORY DEVICE - Methods and memory devices are disclosed, for example a memory device that has both an analog path and a digital path that both share the same input/output pad. One of the two paths on each pad is selected in response to command signals that indicate the nature of the signal being either transmitted to the device or read from the device. Each digital path includes a latch for latching digital input data. Each analog path includes a sample/hold circuit for storing either analog data being read from or analog data being written to the memory device. | 05-13-2010 |
20100146329 | CELL DETERIORATION WARNING APPARATUS AND METHOD - Memory devices and methods adapted to process and generate analog data signals representative of data values of two or more bits of information facilitate increases in data transfer rates relative to devices processing and generating only binary data signals indicative of individual bits. Programming of such memory devices includes programming to a target threshold voltage range representative of the desired bit pattern. Reading such memory devices includes generating an analog data signal indicative of a threshold voltage of a target memory cell. Warning of cell deterioration can be performed using reference cells programmed in accordance with a known pattern such as to approximate deterioration of non-volatile memory cells of the device. | 06-10-2010 |
20100202202 | ADJUSTING FOR CHARGE LOSS IN A MEMORY - Memory and methods of operating a memory adjusting an output voltage of an analog storage device, such as a data cache capacitor holding a voltage level representative of data, in response to an estimated charge loss are useful for compensating for the effects of charge leakage from the analog storage devices. | 08-12-2010 |
20100205490 | INPUT/OUTPUT COMPRESSION AND PIN REDUCTION IN AN INTEGRATED CIRCUIT - An I/O compression apparatus, for testing a memory array and/or a logic circuit, is comprised of a selectable compression circuit that outputs compressed test data from the memory array/logic circuit. An I/O scan register is coupled to each I/O pad for converting serial data to parallel and parallel data to serial in response to a test mode select signal, a test data input, and a test clock. | 08-12-2010 |
20100208524 | SOFT LANDING FOR DESIRED PROGRAM THRESHOLD VOLTAGE - Methods of programming memory cells are disclosed. In at least one embodiment, programming is accomplished by applying a first set of programming pulses to program to an initial threshold voltage, and applying a second set of programming pulses to program to a final threshold voltage. | 08-19-2010 |
20100246261 | PROGRAMMING A MEMORY WITH VARYING BITS PER CELL - Memory devices adapted to receive and transmit analog data signals representative of two or more bits, such as to facilitate increases in data transfer rates relative to devices communicating data signals indicative of individual bits. A controller and a read/write channel convert the digital bit patterns to analog data signals to be stored in a memory array at a particular bit capacity level in order to achieve a desired level of reliability. | 09-30-2010 |
20100246271 | ANALOG SENSING OF MEMORY CELLS WITH A SOURCE FOLLOWER DRIVER IN A SEMICONDUCTOR MEMORY DEVICE - Memory devices, methods, and sample and hold circuits are disclosed, including a memory device that includes a sample and hold circuit coupled to a bit line. One such sample and hold circuit includes a read circuit, a verify circuit, and a reference circuit. The read circuit stores a read threshold voltage that was read from a selected memory cell. The verify circuit stores a target threshold voltage that is compared to the read threshold voltage to generate an inhibit signal when the target and read threshold voltages are substantially equal. The reference circuit stores a reference threshold voltage that can be used to translate the read threshold voltage to compensate for a transistor voltage drop and/or temperature variations. | 09-30-2010 |
20100259978 | METHODS AND APPARATUS UTILIZING EXPECTED COUPLING EFFECT IN THE PROGRAMMING OF MEMORY CELLS - Methods and memory devices configured to utilize predicted coupling effects of neighboring memory cells in the programming of target memory cells can be utilized to tighten the distribution of threshold voltages for a given bit pattern by compensating for anticipated threshold voltage shift due to capacitive coupling, which can facilitate more discernable Vt ranges, and thus a higher number of bits of data per memory cell. Tightening the distribution of threshold voltages can further facilitate wider margins between Vt ranges, and thus an increased reliability in reading the correct data value of a memory cell. | 10-14-2010 |
20100259990 | MEMORY ARRAYS, MEMORY DEVICES AND METHODS OF READING MEMORY CELLS - Strings of series-coupled memory cells selectively coupled to the same bit line may facilitate increased memory densities, reduced fabrication steps and faster read operations when compared to traditional memory array architectures. Reading of the memory cells may be accomplished using charge sharing techniques similar to read operations in a DRAM device. | 10-14-2010 |
20100265771 | METHOD OF PROGRAMMING MEMORY CELLS OF SERIES STRINGS OF MEMORY CELLS - Method of programming memory cells of series strings of memory cells include programming a target memory cell of a series string of memory cells after programming each memory cell of the string located between the target memory cell and a first end of the string, and verifying the programming of the target memory cell by applying a bias at a second end of the string opposite the first end and sensing a voltage developed at the first end in response to the bias. | 10-21-2010 |
20100265772 | NAND MEMORY DEVICE AND PROGRAMMING METHODS - A NAND Flash memory device is described that can reduce bit line coupling and floating gate coupling during program and verify operations. Consecutive bit lines of an array row are concurrently programmed as a common page. Floating gate coupling during programming can therefore be reduced. Multiple verify operations are performed on separate bit lines of the page. Bit line coupling can therefore be reduced. | 10-21-2010 |
20100271872 | ANALOG READ AND WRITE PATHS IN A SOLID STATE MEMORY DEVICE - A memory array in a memory device is coupled to an analog I/O data interface that enables analog voltage levels to be written to the memory array. The I/O interface comprises a plurality of analog data paths that each includes a capacitor for storing charge corresponding to a target voltage to which a selected memory cell, coupled to its respective data path, is to be programmed. A plurality of comparators can be included in the I/O interface, with each such comparator coupled to a respective bit line. Such a comparator can compare a threshold voltage of a selected memory cell to its target voltage and inhibits further programming when the threshold voltage equals or exceeds the target voltage. | 10-28-2010 |
20100296346 | NAND MEMORY DEVICE COLUMN CHARGING - Embodiments of NAND Flash memory devices and methods recognize that effective column coupling capacitance can be reduced by maintaining a sourced voltage on adjacent columns of an array. Maintaining the columns in a charged state prior to array operations (read, write, and program) reduces current surges and improves data read timing. Devices and methods charge the array columns at pre-charge and following array access operations. | 11-25-2010 |
20100329038 | METHODS OF OPERATING MEMORY DEVICES INCLUDING DIFFERENT SETS OF LOGICAL ERASE BLOCKS - Methods of operating memory devices include storing data of a first type in a first set of logical erase blocks and storing data of a second type in a second set of logical erase blocks. The logical erase blocks of the first set of logical erase blocks each have a first size the logical erase blocks of the second set of logical erase blocks each have a second size different than the first size. | 12-30-2010 |
20110007566 | MEMORY CONTROLLER SELF-CALIBRATION FOR REMOVING SYSTEMIC INFLUENCE - Self-calibration for a memory controller is performed by writing a voltage to a selected cell. Adjacent cells around the selected cell are programmed. After each of the adjacent programming operations, the voltage on the selected cell is read to determine any change in voltage caused by systemic offsets such as, for example, floating gate-to-floating gate coupling. These changes are averaged and stored in a table as an offset for use in adjusting a programming voltage or a read voltage in a particular area of memory represented by the offset. Self calibration method for temperature is determined by writing cells at different temperatures and reading at different temperatures to generate temperature offset tables for the write path and read path. These offset tables are used to adjust for systematic temperature related offsets during programming and during read. | 01-13-2011 |
20110010583 | ERROR DETECTION, DOCUMENTATION, AND CORRECTION IN A FLASH MEMORY DEVICE - A memory device has an error documentation memory array that is separate from the primary memory array. The error documentation memory array stores data relating to over-programmed bits in the primary array. When the over-programmed bits in the primary array are erased, the error documentation memory array is erased as well, deleting the documentation data relating to the over-programmed bits. | 01-13-2011 |
20110019478 | SENSING OF MEMORY CELLS IN NAND FLASH - An analog voltage NAND architecture non-volatile memory data read/verify process and circuits is described that senses analog voltages in non-volatile cells utilizing source follower voltage sensing. In a source follower sensing or read operation the programmed threshold voltage of a cell in a NAND string of a NAND architecture Flash memory array is read by applying an elevated voltage to the source line, an elevated pass voltage (V | 01-27-2011 |
20110058413 | MITIGATION OF DATA CORRUPTION FROM BACK PATTERN AND PROGRAM DISTURB IN A NON-VOLATILE MEMORY DEVICE - In one of the disclosed embodiments, a write algorithm is used to remove errors due to back pattern effects, cell-to-cell capacitive coupling, and program disturb in memory cells. Original data to be programmed is adjusted prior to an initial programming operation of the memory cells. The original data is then programmed into the memory cells in another programming operation. In an alternate embodiment, a read adjustment weight data value is associated with each series string of memory cells. The weight data value is used to compensate data read during an initial word line read. The weight data value is updated after each read and read adjustment such that the adjusted weight data value is used on the subsequent read operations. | 03-10-2011 |
20110063906 | MEMORY ADAPTED TO PROGRAM A NUMBER OF BITS TO A MEMORY CELL AND READ A DIFFERENT NUMBER OF BITS FROM THE MEMORY CELL - A memory has a memory array with a memory cell. The memory is adapted to program a first number of bits into the memory cell. The memory is adapted to sense a second number of bits, different from the first number of bits, from the memory cell. | 03-17-2011 |
20110096607 | PROGRAMMING A MEMORY DEVICE TO INCREASE DATA RELIABILITY - Methods for programming a memory array, memory devices, and memory systems are disclosed. In one such method, the target reliability of the data to be programmed is determined. The relative reliability of different groups of memory cells of the memory array is determined. The data is programmed into the group of memory cells of the array having a relative reliability corresponding to the target reliability. | 04-28-2011 |
20110096608 | MITIGATION OF RUNAWAY PROGRAMMING OF A MEMORY DEVICE - Methods for mitigating runaway programming in a memory device, methods for program verifying a memory device, a memory device, and a memory system are provided. In one such method, a ramp voltage signal is generated by a digital count signal. A memory cell being program verified is turned on by a particular verify voltage of the ramp voltage signal in response to a digital count of the digital count signal. The memory cell turning on generates a bit line indication that causes the digital count to be compared to a representation of the target data to be programmed in the memory cell. The comparator circuit generates an indication when the digital count is greater than or equal to the target data. | 04-28-2011 |
20110134701 | MEMORY KINK COMPENSATION - This disclosure concerns memory kink compensation. One method embodiment includes applying a number of sequentially incrementing programming pulses to a memory cell, with the sequential programming pulses incrementing by a first programming pulse step voltage magnitude. A seeding voltage is applied after applying the number of sequentially incrementing programming pulses. A next programming pulse is applied after applying the seeding voltage, with the next programming pulse being adjusted relative to a preceding one of the sequentially incrementing programming pulses by a second programming pulse step voltage magnitude. The second programming pulse step voltage magnitude can be less than the first programming pulse step voltage magnitude. | 06-09-2011 |
20110161591 | INCREASED NAND FLASH MEMORY READ THROUGHPUT - A method of reading sequential pages of flash memory from alternating memory blocks comprises loading data from a first page into a first primary data cache and a second page into a second primary data cache simultaneously, the first and second pages loaded from different blocks of flash memory. Data from the first primary data cache is stored in a first secondary data cache, and data from the second primary data cache is stored in a second secondary data cache. Data is sequentially provided from the first and second secondary data caches by a multiplexer coupled to the first and second data caches. | 06-30-2011 |
20110199831 | COARSE AND FINE PROGRAMMING IN A SOLID STATE MEMORY - Memory devices adapted to receive and transmit analog data signals representative of bit patterns of two or more bits facilitate increases in data transfer rates relative to devices communicating data signals indicative of individual bits. Programming of such memory devices includes initially programming a cell with a coarse programming pulse to move its threshold voltage in a large step close to the programmed state. The neighboring cells are then programmed using coarse programming. The algorithm then returns to the initially programmed cells that are then programmed with one or more fine pulses that slowly move the threshold voltage in smaller steps to the final programmed state threshold voltage. | 08-18-2011 |
20110205792 | MEMORY DEVICE REFERENCE CELL PROGRAMMING METHOD AND APPARATUS - Memory devices and methods are disclosed, such as those facilitating an assignment scheme of reference cells throughout an array of memory cells. For example, one such assignment scheme assigns reference cells in a staggered pattern by row wherein each column contains a single reference cell. Additional schemes of multiple reference cells assigned in a repeating or a pseudo-random pattern are also disclosed. | 08-25-2011 |
20110216591 | PROGRAMMING RATE IDENTIFICATION AND CONTROL IN A SOLID STATE MEMORY - Memory devices adapted to receive and transmit analog data signals representative of bit patterns of two or more bits facilitate increases in data transfer rates relative to devices communicating data signals indicative of individual bits. Programming of such memory devices includes determining a rate of programming (i.e., rate of movement of the respective threshold voltage) of the memory cells and biasing the corresponding bit line with a programming rate control voltage that is greater than the bit line enable voltage and less than the inhibit voltage. This voltage can be adjusted to change the speed of programming. A capacitor coupled to the bit line stores the programming rate control voltage in order to maintain the proper bit line bias for the duration of the programming operation or until it is desired to change the programming rate. | 09-08-2011 |
20110235422 | APPARATUS HAVING A STRING OF MEMORY CELLS - Apparatus having a string of memory cells are useful in semiconductor memory. Some apparatus have circuitry configured to program memory cells of the string in a particular sequence. Some apparatus have circuitry configured to program a threshold voltage of a selected memory cell in the string to match a target voltage compensating, at least in part, for a voltage drop across any unselected memory cells in the string on a source side of the selected memory cell during a sensing operation. Some apparatus have circuitry configured to maintain a resistance presented by source-side unselected memory cells of the string the same between a program verify operation and a later read operation. | 09-29-2011 |
20110249507 | SENSING MEMORY CELLS - The present disclosure includes methods, devices, modules, and systems for operating memory cells. One method embodiment includes applying a ramping voltage to a control gate of a memory cell and to an analog-to-digital converter (ADC). The aforementioned embodiment of a method also includes detecting an output of the ADC at least partially in response to when the ramping voltage causes the memory cell to trip sense circuitry. | 10-13-2011 |
20110273933 | ANALOG-TO-DIGITAL AND DIGITAL-TO-ANALOG CONVERSION WINDOW ADJUSTMENT BASED ON REFERENCE CELLS IN A MEMORY DEVICE - An analog-to-digital conversion window is defined by reference voltages stored in reference memory cells of a memory device. A first reference voltage is read to define an upper limit of the conversion window and a second reference voltage is read to define a lower limit of the conversion window. An analog voltage representing a digital bit pattern is read from a memory cell and converted to the digital bit pattern by an analog-to-digital conversion process using the conversion window as the limits for the sampling process. This scheme helps in real time tracking of the ADC window with changes in the program window of the memory array. | 11-10-2011 |
20110286272 | MEMORY DEVICES AND THEIR OPERATION WITH DIFFERENT SETS OF LOGICAL ERASE BLOCKS - Methods of operating memory devices include storing data of a first type in a first set of logical erase blocks and storing data of a second type in a second set of logical erase blocks. The logical erase blocks of the first set of logical erase blocks each have a first size the logical erase blocks of the second set of logical erase blocks each have a second size different than the first size. | 11-24-2011 |
20110289387 | PROGRAMMING ERROR CORRECTION CODE INTO A SOLID STATE MEMORY DEVICE WITH VARYING BITS PER CELL - Memory devices that, in a particular embodiment, receive and transmit analog data signals representative of bit patterns of two or more bits such as to facilitate increases in data transfer rates relative to devices communicating data signals indicative of individual bits. Programming error correction code (ECC) and metadata into such memory devices includes storing the ECC and metadata at different bit levels per cell based on an actual error rate of the cells. The ECC and metadata can be stored with the data block at a different bit level than the data block. If the area of memory in which the block of data is stored does not support the desired reliability for the ECC and metadata at a particular bit level, the ECC and metadata can be stored in other areas of the memory array at different bit levels. | 11-24-2011 |
20110305090 | MEMORY CONTROLLER SELF-CALIBRATION FOR REMOVING SYSTEMIC INFLUENCE - Self-calibration for a memory controller is performed by writing a voltage to a selected cell. Adjacent cells around the selected cell are programmed. After each of the adjacent programming operations, the voltage on the selected cell is read to determine any change in voltage caused by systemic offsets such as, for example, floating gate-to-floating gate coupling. These changes are averaged and stored in a table as an offset for use in adjusting a programming voltage or a read voltage in a particular area of memory represented by the offset. Self calibration method for temperature is determined by writing cells at different temperatures and reading at different temperatures to generate temperature offset tables for the write path and read path. These offset tables are used to adjust for systematic temperature related offsets during programming and during read. | 12-15-2011 |
20110307649 | MULTIPLE LEVEL CELL MEMORY DEVICE WITH SINGLE BIT PER CELL, RE-MAPPABLE MEMORY BLOCK - A system having a non-volatile memory device has a plurality of memory cells that are organized into memory blocks. Blocks can operate in either a multiple bit per cell mode or a single bit per cell mode. A processor controls the system and selects blocks to operate in the multiple bit per cell mode and single bit per cell mode. One dedicated memory block is capable of operating only in the single bit per cell mode. If the dedicated memory block is found to be defective, a defect-free block can be remapped to that dedicated memory block location to act only in the single bit per cell mode. | 12-15-2011 |
20120002468 | CELL DETERIORATION WARNING APPARATUS AND METHOD - Memory devices and methods adapted to process and generate analog data signals representative of data values of two or more bits of information facilitate increases in data transfer rates relative to devices processing and generating only binary data signals indicative of individual bits. Programming of such memory devices includes programming to a target threshold voltage range representative of the desired bit pattern. Reading such memory devices includes generating an analog data signal indicative of a threshold voltage of a target memory cell. Warning of cell deterioration can be performed using reference cells programmed in accordance with a known pattern such as to approximate deterioration of non-volatile memory cells of the device. | 01-05-2012 |
20120008399 | METHODS OF OPERATING MEMORIES INCLUDING CHARACTERIZING MEMORY CELL SIGNAL LINES - Methods of operating memories facilitate compensating for memory cell signal line propagation delays, such as to increase the overall threshold voltage range and non-volatile memory cell states available. Methods include selecting a memory cell signal line of a memory and characterizing the memory cell signal line by determining an RC time constant of the memory cell signal line. | 01-12-2012 |
20120008409 | REDUCTION OF QUICK CHARGE LOSS EFFECT IN A MEMORY DEVICE - Methods for reducing quick charge loss effects, methods for programming, memory devices, memory devices, and memory systems are disclosed. In one such method, a programming pulse is applied to the word line to increase the threshold voltage of the memory cells being programmed. A negative voltage pulse is applied to the word line after the programming pulse to force any electrons trapped in the tunnel oxide of memory cells being programmed back into the tunnel region. After the negative pulse, a program verify operation is performed. | 01-12-2012 |
20120026816 | DEFECTIVE MEMORY BLOCK IDENTIFICATION IN A MEMORY DEVICE - During manufacture and testing of a memory device, a memory test is performed to determine which, if any, memory blocks are defective. A memory map of the defective blocks is stored in one of the defect-free memory blocks so that it can be read later by a controller during normal operation of the memory device. In one embodiment, the memory test is for a programmability test to determine if the memory block can be programmed. An indication of programmability is stored in each block in a predetermined location. | 02-02-2012 |
20120030529 | REFRESH OF NON-VOLATILE MEMORY CELLS BASED ON FATIGUE CONDITIONS - In one or more of the disclosed embodiments, memory cells in a memory device are refreshed upon an indication of a fatigue condition. In one such embodiment, controller monitors behavior parameters of the cells and determines if any of the parameters are outside of a normal range set for each one, thus indicating a fatigue condition. If any cell indicates a fatigue condition, the data from the block of cells indicating the fatigue is moved to another block. In one embodiment, an error detection and correction process is performed on the data prior to being written into another memory block. | 02-02-2012 |
20120069675 | REDUCING NOISE IN SEMICONDUCTOR DEVICES - The present disclosure includes methods, devices, modules, and systems for reducing noise in semiconductor devices. One method embodiment includes applying a reset voltage to a control gate of a semiconductor device for a period of time. The method further includes sensing the state of the semiconductor device after applying the reset voltage. | 03-22-2012 |
20120072653 | MEMORY DEVICE WITH USER CONFIGURABLE DENSITY/PERFORMANCE - The memory device is comprised of a memory array having a plurality of memory cells that are organized into memory blocks. Each memory cell is capable of storing a selectable quantity of data bits (e.g., multiple level cells or a single bit per cell). Control circuitry controls the density configuration of read or write operations to the memory blocks in response to a configuration command. In one embodiment, the configuration command is part of the read or write command. In another embodiment, the configuration command is read from a configuration register. | 03-22-2012 |
20120075929 | SENSING OF MEMORY CELLS IN NAND FLASH - An analog voltage NAND architecture non-volatile memory data read/verify process and circuits is described that senses analog voltages in non-volatile cells utilizing source follower voltage sensing. In a source follower sensing or read operation the programmed threshold voltage of a cell in a NAND string of a NAND architecture Flash memory array is read by applying an elevated voltage to the source line, an elevated pass voltage (V | 03-29-2012 |
20120081968 | N WELL IMPLANTS TO SEPARATE BLOCKS IN A FLASH MEMORY DEVICE - A semiconductor memory device that has an isolated area formed from one conductivity and formed in part by a buried layer of a second conductivity that is implanted in a substrate. The walls of the isolated area are formed by implants that are formed from the second conductivity and extend down to the buried layer. The isolated region has implanted source lines and is further subdivided by overlay strips of the second conductivity that extend substantially down to the buried layer. Each isolation region can contain one or more blocks of memory cells. | 04-05-2012 |
20120084493 | NON-VOLATILE MEMORY DEVICE HAVING ASSIGNABLE NETWORK IDENTIFICATION - Memory devices and methods disclosed such as a memory device having a plurality of memory dies where each die includes a network identification that uniquely identifies the memory die on a bus. Access for each memory die to the bus can be scheduled by a bus controller. | 04-05-2012 |
20120106249 | PROGRAMMING ERROR CORRECTION CODE INTO A SOLID STATE MEMORY DEVICE WITH VARYING BITS PER CELL - Memory devices that, in a particular embodiment, receive and transmit analog data signals representative of bit patterns of two or more bits such as to facilitate increases in data transfer rates relative to devices communicating data signals indicative of individual bits. Programming error correction code (ECC) and metadata into such memory devices includes storing the ECC and metadata at different bit levels per cell based on an actual error rate of the cells. The ECC and metadata can be stored with the data block at a different bit level than the data block. If the area of memory in which the block of data is stored does not support the desired reliability for the ECC and metadata at a particular bit level, the ECC and metadata can be stored in other areas of the memory array at different bit levels. | 05-03-2012 |
20120113723 | MITIGATION OF DATA CORRUPTION FROM BACK PATTERN AND PROGRAM DISTURB IN A NON-VOLATILE MEMORY DEVICE - In one of the disclosed embodiments, a write algorithm is used to remove errors due to back pattern effects, cell-to-cell capacitive coupling, and program disturb in memory cells. Original data to be programmed is adjusted prior to an initial programming operation of the memory cells. The original data is then programmed into the memory cells in another programming operation. In an alternate embodiment, a read adjustment weight data value is associated with each series string of memory cells. The weight data value is used to compensate data read during an initial word line read. The weight data value is updated after each read and read adjustment such that the adjusted weight data value is used on the subsequent read operations. | 05-10-2012 |
20120113727 | CONFIGURATION FINALIZATION ON FIRST VALID NAND COMMAND - A startup method and circuit to allow high current consumption for startup processes of a low operating voltage memory device such as a NAND device until the receipt of a valid command to the memory device. Upon receipt of a valid command, startup functions are ceased at the high current consumption, and normal operation begins without the need for using an unreliable low voltage power on reset circuit. | 05-10-2012 |
20120117313 | MEMORY DEVICE PROGRAM WINDOW ADJUSTMENT - In one or more embodiments, a memory device is disclosed as having an adjustable programming window having a plurality of programmable levels. The programming window is moved to compensate for changes in reliable program and erase thresholds achievable as the memory device experiences factors such as erase/program cycles that change the program window. The initial programming window is determined prior to an initial erase/program cycle. The programming levels are then moved as the programming window changes, such that the plurality of programmable levels still remain within the program window and are tracked with the program window changes. | 05-10-2012 |
20120144101 | PROGRAMMING MEMORY CELLS WITH ADDITIONAL DATA FOR INCREASED THRESHOLD VOLTAGE RESOLUTION - Methods for programming memory and memory devices are provided. According to at least one such method, additional data is appended to original data and the resulting data is programmed in a selected memory cell. The appended data increases the program threshold voltage margin of the original data. The appended data can be a duplicate of the original data or logical zeros. When the selected memory cell is read, the memory control circuitry can read just the original data in the MSB field or the memory control circuitry can read the entire programmed data and ignore the LSB field, for example. | 06-07-2012 |
20120166720 | PROCESSORS FOR PROGRAMMING MULTILEVEL-CELL NAND MEMORY DEVICES - In an embodiment, a processor includes a storage device. The processor is configured to request first data from a first location of a memory device. The storage device is configured to receive and to store the first data from the memory device. The processor is configured to attempt to write second data to the first location of the memory device. The processor is configured to write the first data stored in the storage device and the second data to one or more other locations of the memory device if the attempt to write second data to the first location of the memory device fails. | 06-28-2012 |
20120195126 | CELL OPERATION MONITORING - Memory devices adapted to process and generate analog data signals representative of data values of two or more bits of information facilitate increases in data transfer rates relative to devices processing and generating only binary data signals indicative of individual bits. Programming of such memory devices includes programming to a target threshold voltage range representative of the desired bit pattern. Reading such memory devices includes generating an analog data signal indicative of a threshold voltage of a target memory cell. Atypical cell, block, string, column, row, etc. . . . operation is monitored and locations and type of atypical operation stored. Adjustment of operation is performed based upon the atypical cell operation. | 08-02-2012 |
20120206964 | PROGRAMMING RATE IDENTIFICATION AND CONTROL IN A SOLID STATE MEMORY - Memory devices adapted to receive and transmit analog data signals representative of bit patterns of two or more bits facilitate increases in data transfer rates relative to devices communicating data signals indicative of individual bits. Programming of such memory devices includes determining a rate of programming (i.e., rate of movement of the respective threshold voltage) of the memory cells and biasing the corresponding bit line with a programming rate control voltage that is greater than the bit line enable voltage and less than the inhibit voltage. This voltage can be adjusted to change the speed of programming. A capacitor coupled to the bit line stores the programming rate control voltage in order to maintain the proper bit line bias for the duration of the programming operation or until it is desired to change the programming rate. | 08-16-2012 |
20120218822 | CONTENT ADDRESSABLE MEMORY - NAND architecture non-volatile content addressable (CAM) memory devices and methods are described that allows for high density, low cost CAM devices. In addition, the NAND architecture non-volatile CAM memory operates with reduced power consumption characteristics for low power and portable applications. In one NAND architecture non-volatile CAM memory embodiment a wired NOR match line array is utilized. In another embodiment a NAND match line array is shown. In yet other embodiments, hierarchal addressing, hash addressing, tree search and algorithmic/hardware engine based search is detailed utilizing both conventional NAND architecture non-volatile Flash memory arrays and dedicated NAND architecture CAM arrays utilizing wired NOR and wired NAND match lines. | 08-30-2012 |
20120221780 | INCREASED NAND FLASH MEMORY READ THROUGHPUT - A method of reading sequential pages of flash memory from alternating memory blocks comprises loading data from a first page into a first primary data cache and a second page into a second primary data cache simultaneously, the first and second pages loaded from different blocks of flash memory. Data from the first primary data cache is stored in a first secondary data cache, and data from the second primary data cache is stored in a second secondary data cache. Data is sequentially provided from the first and second secondary data caches by a multiplexer coupled to the first and second data caches. | 08-30-2012 |
20120243316 | MEMORY DEVICES AND THEIR OPERATION WITH DIFFERENT SETS OF LOGICAL ERASE BLOCKS - Methods of operating memory devices include storing data of a first type in a first set of logical erase blocks and storing data of a second type in a second set of logical erase blocks. The logical erase blocks of the first set of logical erase blocks each have a first size the logical erase blocks of the second set of logical erase blocks each have a second size different than the first size. | 09-27-2012 |
20120246396 | NON-VOLATILE MEMORY DEVICE HAVING ASSIGNABLE NETWORK IDENTIFICATION - Memory devices and methods disclosed such as a memory device having a plurality of memory dies where each die includes a network identification that uniquely identifies the memory die on a bus. Access for each memory die to the bus can be scheduled by a bus controller. | 09-27-2012 |
20120275233 | SOFT LANDING FOR DESIRED PROGRAM THRESHOLD VOLTAGE - Methods of programming memory cells are disclosed. In at least one embodiment, programming is accomplished by applying a first set of programming pulses to program to an initial threshold voltage, and applying a second set of programming pulses to program to a final threshold voltage. | 11-01-2012 |
20120307564 | METHOD FOR KINK COMPENSATION IN A MEMORY - This disclosure concerns memory kink compensation. One method embodiment includes applying a number of sequentially incrementing programming pulses to a memory cell, with the sequential programming pulses incrementing by a first programming pulse step voltage magnitude. A seeding voltage is applied after applying the number of sequentially incrementing programming pulses. A next programming pulse is applied after applying the seeding voltage, with the next programming pulse being adjusted relative to a preceding one of the sequentially incrementing programming pulses by a second programming pulse step voltage magnitude. The second programming pulse step voltage magnitude can be less than the first programming pulse step voltage magnitude. | 12-06-2012 |
20120307576 | ANALOG SENSING OF MEMORY CELLS WITH A SOURCE FOLLOWER DRIVER IN A SEMICONDUCTOR MEMORY DEVICE - Memory devices, methods, and sample and hold circuits are disclosed, including a memory device that includes a sample and hold circuit coupled to a bit line. One such sample and hold circuit includes a read circuit, a verify circuit, and a reference circuit. The read circuit stores a read threshold voltage that was read from a selected memory cell. The verify circuit stores a target threshold voltage that is compared to the read threshold voltage to generate an inhibit signal when the target and read threshold voltages are substantially equal. The reference circuit stores a reference threshold voltage that can be used to translate the read threshold voltage to compensate for a transistor voltage drop and/or temperature variations. | 12-06-2012 |
20120314503 | COARSE AND FINE PROGRAMMING IN A SOLID STATE MEMORY - Memory devices adapted to receive and transmit analog data signals representative of bit patterns of two or more bits facilitate increases in data transfer rates relative to devices communicating data signals indicative of individual bits. Programming of such memory devices includes initially programming a cell with a coarse programming pulse to move its threshold voltage in a large step close to the programmed state. The neighboring cells are then programmed using coarse programming. The algorithm then returns to the initially programmed cells that are then programmed with one or more fine pulses that slowly move the threshold voltage in smaller steps to the final programmed state threshold voltage. | 12-13-2012 |
20120331217 | MEMORY DEVICE PROGRAM WINDOW ADJUSTMENT - In one or more embodiments, a memory device has an adjustable programming window with a plurality of programmable levels. The programming window is moved to compensate for changes in reliable program and erase thresholds achievable as the memory device experiences factors such as erase/program cycles that change the program window. The initial programming window is determined prior to an initial erase/program cycle. The programming levels are then moved as the programming window changes, such that the plurality of programmable levels still remain within the program window and are tracked with the program window changes. | 12-27-2012 |
20130010542 | PROGRAMMING METHODS AND MEMORIES - Methods of programming a memory and memories are disclosed. In at least one embodiment, a memory is programmed by determining a pretarget threshold voltage for a selected cell, wherein the pretarget threshold voltage is determined using pretarget threshold voltage values for at least one neighbor cell of the selected cell. | 01-10-2013 |
20130024736 | PROGRAMMING ERROR CORRECTION CODE INTO A SOLID STATE MEMORY DEVICE WITH VARYING BITS PER CELL - Memory devices that, in a particular embodiment, receive and transmit analog data signals representative of bit patterns of two or more bits such as to facilitate increases in data transfer rates relative to devices communicating data signals indicative of individual bits. Programming error correction code (ECC) and metadata into such memory devices includes storing the ECC and metadata at different bit levels per cell based on an actual error rate of the cells. The ECC and metadata can be stored with the data block at a different bit level than the data block. If the area of memory in which the block of data is stored does not support the desired reliability for the ECC and metadata at a particular bit level, the ECC and metadata can be stored in other areas of the memory array at different bit levels. | 01-24-2013 |
20130039140 | MACRO AND COMMAND EXECUTION FROM MEMORY ARRAY - Methods and apparatus for executing internal operations of memory devices utilizing instructions stored in the memory array of the memory device are disclosed. Decode blocks adapted to interpret instructions and data stored in the memory device are also disclosed. Methods can be used to perform internal self-test operations of the memory device by executing test procedures stored in the memory array of the memory device performing a self-test operation. | 02-14-2013 |
20130103894 | PROGRAMMING A MEMORY DEVICE TO INCREASE DATA RELIABILITY - Methods for programming a memory array, memory devices, and memory systems are disclosed. In one such method, the target reliability of the data to be programmed is determined The relative reliability of different groups of memory cells of the memory array is determined. The data is programmed into the group of memory cells of the array having a relative reliability corresponding to the target reliability. | 04-25-2013 |
20130135926 | APPARATUS HAVING INDICATIONS OF MEMORY CELL DENSITY AND METHODS OF THEIR DETERMINATION AND USE - Methods and apparatus utilizing indications of memory cell density facilitate management of memory density of a memory device. By permitting each of a plurality of portions of a memory array of the memory device to be assigned a corresponding memory cell density determined through an evaluation of those portions of the memory array, better performing portions of the memory array may not be hindered by lesser performing portions of the memory array. | 05-30-2013 |
20130135936 | MEMORY CONTROLLER SELF-CALIBRATION FOR REMOVING SYSTEMIC INFLUENCE - Self-calibration for a memory controller is performed by writing a voltage to a selected cell. Adjacent cells around the selected cell are programmed. After each of the adjacent programming operations, the voltage on the selected cell is read to determine any change in voltage caused by systemic offsets such as, for example, floating gate-to-floating gate coupling. These changes are averaged and stored in a table as an offset for use in adjusting a programming voltage or a read voltage in a particular area of memory represented by the offset. Self calibration method for temperature is determined by writing cells at different temperatures and reading at different temperatures to generate temperature offset tables for the write path and read path. These offset tables are used to adjust for systematic temperature related offsets during programming and during read. | 05-30-2013 |
20130166815 | Memory controllers to output data signals of a number of bits and to receive data signals of a different number of bits - A memory controller has a digital signal processor. The digital signal processor is configured to output a digital data signal of M+N bits of program data intended for programming a memory cell of a memory device. The digital signal processor is configured to receive a digital data signal of M+L bits read from the memory cell of the memory device and to retrieve from the received digital data signal M bits of data that were stored in the memory cell. | 06-27-2013 |
20130201759 | COARSE AND FINE PROGRAMMING IN A SOLID STATE MEMORY - Memory devices adapted to receive and transmit analog data signals representative of bit patterns of two or more bits facilitate increases in data transfer rates relative to devices communicating data signals indicative of individual bits. Programming of such memory devices includes initially programming a cell with a coarse programming pulse to move its threshold voltage in a large step close to the programmed state. The neighboring cells are then programmed using coarse programming. The algorithm then returns to the initially programmed cells that are then programmed with one or more fine pulses that slowly move the threshold voltage in smaller steps to the final programmed state threshold voltage. | 08-08-2013 |
20130223145 | APPARATUS CONFIGURED TO PROGRAM A MEMORY CELL TO A TARGET THRESHOLD VOLTAGE REPRESENTING A DATA PATTERN OF MORE THAN ONE BIT - Memory devices and bulk storage devices configured to program a memory cell to a target threshold voltage representing a data pattern of more than one bit and read the data pattern of more than one bit of the memory cell in a single read operation by generating a signal that is representative of an actual threshold voltage of the memory cell. | 08-29-2013 |
20130256831 | N WELL IMPLANTS TO SEPARATE BLOCKS IN A FLASH MEMORY DEVICE - A semiconductor memory device that has an isolated area formed from one conductivity and formed in part by a buried layer of a second conductivity that is implanted in a substrate. The walls of the isolated area are formed by implants that are formed from the second conductivity and extend down to the buried layer. The isolated region has implanted source lines and is further subdivided by overlay strips of the second conductivity that extend substantially down to the buried layer. Each isolation region can contain one or more blocks of memory cells. | 10-03-2013 |
20130286739 | METHODS OF READING MEMORY CELLS - Strings of series-coupled memory cells selectively coupled to the same bit line may facilitate increased memory densities, reduced fabrication steps and faster read operations when compared to traditional memory array architectures. Reading of the memory cells may be accomplished using charge sharing techniques similar to read operations in a DRAM device. | 10-31-2013 |
20130314993 | PROGRAMMING RATE IDENTIFICATION AND CONTROL IN A SOLID STATE MEMORY - Memory devices adapted to receive and transmit analog data signals representative of bit patterns of two or more bits facilitate increases in data transfer rates relative to devices communicating data signals indicative of individual bits. Programming of such memory devices includes determining a rate of programming (i.e., rate of movement of the respective threshold voltage) of the memory cells and biasing the corresponding bit line with a programming rate control voltage that is greater than the bit line enable voltage and less than the inhibit voltage. This voltage can be adjusted to change the speed of programming. A capacitor coupled to the bit line stores the programming rate control voltage in order to maintain the proper bit line bias for the duration of the programming operation or until it is desired to change the programming rate. | 11-28-2013 |
20140026005 | MACRO AND COMMAND EXECUTION FROM MEMORY ARRAY - Methods and apparatus for executing internal operations of memory devices utilizing instructions stored in the memory array of the memory device are disclosed. Decode blocks adapted to interpret instructions and data stored in the memory device are also disclosed. Methods can be used to perform internal self-test operations of the memory device by executing test procedures stored in the memory array of the memory device performing a self-test operation. | 01-23-2014 |
20140040683 | REFRESH OF NON-VOLATILE MEMORY CELLS BASED ON FATIGUE CONDITIONS - In one or more of the disclosed embodiments, memory cells in a memory device are refreshed upon an indication of a fatigue condition. In one such embodiment, controller monitors behavior parameters of the cells and determines if any of the parameters are outside of a normal range set for each one, thus indicating a fatigue condition. If any cell indicates a fatigue condition, the data from the block of cells indicating the fatigue is moved to another block. In one embodiment, an error detection and correction process is performed on the data prior to being written into another memory block. | 02-06-2014 |
20140053033 | PROGRAMMING ERROR CORRECTION CODE INTO A SOLID STATE MEMORY DEVICE WITH VARYING BITS PER CELL - Memory devices that, in a particular embodiment, receive and transmit analog data signals representative of bit patterns of two or more bits such as to facilitate increases in data transfer rates relative to devices communicating data signals indicative of individual bits. Programming error correction code (ECC) and metadata into such memory devices includes storing the ECC and metadata at different bit levels per cell based on an actual error rate of the cells. The ECC and metadata can be stored with the data block at a different bit level than the data block. If the area of memory in which the block of data is stored does not support the desired reliability for the ECC and metadata at a particular bit level, the ECC and metadata can be stored in other areas of the memory array at different bit levels. | 02-20-2014 |
20140085980 | MEMORY DEVICES AND THEIR OPERATION WITH DIFFERENT SETS OF LOGICAL ERASE BLOCKS - Systems comprising an array of memory cells organized into a plurality of erasable physical blocks, the address of physical block associated with an array of memory cells having a predetermined logical erase block size, wherein at least of the logical erase block size is smaller than another logical erase block size and a processor that selects the storage of data among different logical erase blocks in the array of memory cells based upon programmable and predetermined criteria. | 03-27-2014 |
20140104944 | PROGRAMMING BASED ON CONTROLLER PERFORMANCE REQUIREMENTS - Methods and solid state drives are disclosed, for example a solid state drive that is adapted to receive and transmit analog data signals representative of bit patterns of three or more levels (such as to facilitate increases in data transfer rates relative to devices communicating data signals indicative of individual bits). Programming of the solid state drive, comprising an array of non-volatile memory cells, might include adjusting the level of each memory cell being programmed in response to a desired performance level of a controller circuit. | 04-17-2014 |
20140104958 | PROGRAMMING METHODS AND MEMORIES - Methods of programming a memory and memories are disclosed. In at least one embodiment, a memory is programmed by determining a pretarget threshold voltage for a selected cell, wherein the pretarget threshold voltage is determined using pretarget threshold voltage values for at least one neighbor cell of the selected cell. | 04-17-2014 |
20140115383 | MULTIPLE LEVEL CELL MEMORY DEVICE WITH SINGLE BIT PER CELL, RE-MAPPABLE MEMORY BLOCK - A system having a non-volatile memory device has a plurality of memory cells that are organized into memory blocks. Blocks can operate in either a multiple bit per cell mode or a single bit per cell mode. A processor controls the system and selects blocks to operate in the multiple bit per cell mode and single bit per cell mode. One dedicated memory block is capable of operating only in the single bit per cell mode. If the dedicated memory block is found to be defective, a defect-free block can be remapped to that dedicated memory block location to act only in the single bit per cell mode. | 04-24-2014 |
20140149648 | MEMORY SYSTEM WITH USER CONFIGURABLE DENSITY/PERFORMANCE OPTION - The memory system has one or more memory dies coupled to a processor or other system controller. Each die has a separate memory array organized into multiple memory blocks. The different memory blocks of each die can be assigned a different memory density by the end user, depending on the desired memory performance and/or memory density. The user configurable density/performance option can be adjusted with special read/write operations or a configuration register having a memory density configuration bit for each memory block. | 05-29-2014 |
20140156922 | NON-VOLATILE MEMORY DEVICE ADAPTED TO IDENTIFY ITSELF AS A BOOT MEMORY - Non-volatile memory devices and methods of their operation are provided. One such non-volatile memory device has an interface and a control circuit. The non-volatile memory device is adapted to identify itself as a boot memory in response to receiving an interrogation request on the interface. | 06-05-2014 |