Foutz

Brian Foutz, Silver Spring, MD US

Patent application number	Description	Published
20090119559	DISTRIBUTED TEST COMPRESSION FOR INTEGRATED CIRCUITS - A method for testing integrated circuits is provided. The method provides for incorporating compression and decompression logic into each sub-component of an integrated circuit, developing test modes that target different sub-components of the integrated circuit, selecting one of the test modes, applying a test pattern to one or more sub-components of the integrated circuit targeted by the one test mode, comparing a response from application of the test pattern to a known good response, and diagnosing the response to determine which part of the one or more sub-components targeted by the one test mode failed when the response does not match the known good response.	05-07-2009

Patent application number	Description	Published
20090031492	Timepiece shower head - A modified shower head provides a timepiece imbedded within a shower head insert allowing a person showering to keep track of time and also to monitor water usage. It also provides the person showering with a timing mechanism to determine the length of time for use of hair products, tints, dyes and treatments without having to reference an outside timepiece. The insert comprises a timepiece within an encased water-proof enclosure within the shower head insert.	02-05-2009

Patent application number	Description	Published
20100107473	ENHANCEMENT OF COLD TOLERANCE IN PLANTS - Novel dehydrin promoters isolated from	05-06-2010