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Fong, Fremont

Albert Meng Fong, Fremont, CA US

Patent application numberDescriptionPublished
20110225273METHOD AND APPARATUS FOR RE-GENERATING CONFIGURATION COMMANDS OF A NETWORK DEVICE USING AN OBJECT-BASED APPROACH - Embodiments disclose re-generating a configuration command of a network device. A method includes receiving a request to re-generate a configuration command previously issued to a network device, wherein the configuration command has one or more parameters; retrieving a template and a pattern associated with the configuration command, wherein the template represents a syntax for the configuration command, wherein the pattern represents a storage location for the configuration command; based on the pattern, retrieving from an object database all objects containing values for all the particular parameters from the storage location specified by the pattern; and creating a re-generated configuration command by substituting the values of the retrieved objects into the template.09-15-2011

Neric Fong, Fremont, CA US

Patent application numberDescriptionPublished
20090009252RF Variable Gain Amplifier - A RF variable gain amplifier with an extended linear tuning range is disclosed. The variable gain amplifier employs a wide swing cascode mirror formed by two cascode transistors and two gain transistors. The two cascode transistors track each others so are the two gain transistor. The gain transistors operate on the saturation region.01-08-2009

Yupin Fong, Fremont, CA US

Patent application numberDescriptionPublished
20080316832NON-VOLATILE STORAGE SYSTEM WITH INTELLIGENT CONTROL OF PROGRAM PULSE DURATION - To program a set of non-volatile storage elements, a set of programming pulses are applied to the control gates (or other terminals) of the non-volatile storage elements. The programming pulses have a constant pulse width and increasing magnitudes until a maximum voltage is reached. At that point, the magnitude of the programming pulses stops increasing and the programming pulses are applied in a manner to provide varying time duration of the programming signal between verification operations. In one embodiment, for example, after the pulses reach the maximum magnitude the pulse widths are increased. In another embodiment, after the pulses reach the maximum magnitude multiple program pulses are applied between verification operations.12-25-2008
20080316833INTELLIGENT CONTROL OF PROGRAM PULSE DURATION - To program a set of non-volatile storage elements, a set of programming pulses are applied to the control gates (or other terminals) of the non-volatile storage elements. The programming pulses have a constant pulse width and increasing magnitudes until a maximum voltage is reached. At that point, the magnitude of the programming pulses stops increasing and the programming pulses are applied in a manner to provide varying time duration of the programming signal between verification operations. In one embodiment, for example, after the pulses reach the maximum magnitude the pulse widths are increased. In another embodiment, after the pulses reach the maximum magnitude multiple program pulses are applied between verification operations.12-25-2008
20090003052SYSTEM THAT COMPENSATES FOR COUPLING BASED ON SENSING A NEIGHBOR USING COUPLING - Shifts in the apparent charge stored on a floating gate (or other charge storing element) of a non-volatile memory cell can occur because of the coupling of an electric field based on the charge stored in adjacent floating gates (or other adjacent charge storing elements). To compensate for this coupling, the read or programming process for a given memory cell can take into account the programmed state of an adjacent memory cell. To determine whether compensation is needed, a process can be performed that includes sensing information about the programmed state of an adjacent memory cell (e.g., on an adjacent bit line or other location).01-01-2009
20090003053SYSTEM THAT COMPENSATES FOR COUPLING BASED ON SENSING A NEIGHBOR USING COUPLING - Shifts in the apparent charge stored on a floating gate (or other charge storing element) of a non-volatile memory cell can occur because of the coupling of an electric field based on the charge stored in adjacent floating gates (or other adjacent charge storing elements). To compensate for this coupling, the read or programming process for a given memory cell can take into account the programmed state of an adjacent memory cell. To determine whether compensation is needed, a process can be performed that includes sensing information about the programmed state of an adjacent memory cell (e.g., on an adjacent bit line or other location).01-01-2009
20090185416SYSTEM THAT COMPENSATES FOR COUPLING BASED ON SENSING A NEIGHBOR USING COUPLING - Shifts in the apparent charge stored on a floating gate (or other charge storing element) of a non-volatile memory cell can occur because of the coupling of an electric field based on the charge stored in adjacent floating gates (or other adjacent charge storing elements). To compensate for this coupling, the read or programming process for a given memory cell can take into account the programmed state of an adjacent memory cell. To determine whether compensation is needed, a process can be performed that includes sensing information about the programmed state of an adjacent memory cell (e.g., on an adjacent bit line or other location).07-23-2009
20090296475VERIFICATION PROCESS FOR NON-VOLATILE STORAGE - When erasing non-volatile storage, a verification process is used between erase operations to determine whether the non-volatile storage has been successfully erased. The verification process includes separately performing verification for different subsets of the non-volatile storage elements.12-03-2009
20100046301INTELLIGENT CONTROL OF PROGRAM PULSE FOR NON-VOLATILE STORAGE - To program a set of non-volatile storage elements, a set of programming pulses are applied to the control gates (or other terminals) of the non-volatile storage elements. The programming pulses have a constant pulse width and increasing magnitudes until a maximum voltage is reached. At that point, the magnitude of the programming pulses stops increasing and the programming pulses are applied in a manner to provide varying time duration of the programming signal between verification operations. In one embodiment, for example, after the pulses reach the maximum magnitude the pulse widths are increased. In another embodiment, after the pulses reach the maximum magnitude multiple program pulses are applied between verification operations.02-25-2010

Patent applications by Yupin Fong, Fremont, CA US

Yupin K. Fong, Fremont, CA US

Patent application numberDescriptionPublished
20100070681METHOD FOR SCRAMBLING DATA IN WHICH SCRAMBLING DATA AND SCRAMBLED DATA ARE STORED IN CORRESPONDING NON-VOLATILE MEMORY LOCATIONS - A method in which data is randomized before being stored in a non-volatile memory to minimize data pattern-related read failures. Predetermined randomized non-user data is stored in a block or other location of a memory array, and accessed as needed by a memory device controller to randomize user data before it is stored in other blocks of the array. Each portion of the user data which is stored in a block is randomized using a portion of the non-user data which is stored in the same relative location in another block.03-18-2010
20100070682BUILT IN ON-CHIP DATA SCRAMBLER FOR NON-VOLATILE MEMORY - A non-volatile memory in which data is randomized before being stored in the non-volatile memory to minimize data pattern-related read failures. Randomizing is performed using circuitry on the memory die so that the memory die is portable relative to an external, off-chip controller. Circuitry on the memory die scrambles user data based on a key which is generated using a seed which is shifted according to a write address. Corresponding on-chip descrambling is also provided.03-18-2010

Patent applications by Yupin K. Fong, Fremont, CA US

Yupin Kawing Fong, Fremont, CA US

Patent application numberDescriptionPublished
20080212374Novel Multi-State Memory - Maximized multi-state compaction and more tolerance in memory state behavior is achieved through a flexible, self-consistent and self-adapting mode of detection, covering a wide dynamic range. For high density multi-state encoding, this approach borders on full analog treatment, dictating analog techniques including A to D type conversion to reconstruct and process the data. In accordance with the teachings of this invention, the memory array is read with high fidelity, not to provide actual final digital data, but rather to provide raw data accurately reflecting the analog storage state, which information is sent to a memory controller for analysis and detection of the actual final digital data.09-04-2008
20090067244NONVOLATILE MEMORY AND METHOD FOR ON-CHIP PSEUDO-RANDOMIZATION OF DATA WITHIN A PAGE AND BETWEEN PAGES - Features within an integrated-circuit memory chip enables scrambling or randomization of data stored in an array of nonvolatile memory cells. In one embodiment, randomization within each page helps to control source loading errors during sensing and floating gate to floating gate coupling among neighboring cells. Randomization from page to page helps to reduce program disturbs, user read disturbs, and floating gate to floating gate coupling that result from repeated and long term storage of specific data patterns. In another embodiment, randomization is implemented both within a page and between pages. The scrambling or randomization may be predetermined, or code generated pseudo randomization or user driven randomization in different embodiments. These features are accomplished within the limited resource and budget of the integrated-circuit memory chip.03-12-2009
20090268518Novel Multi-State Memory - Maximized multi-state compaction and more tolerance in memory state behavior is achieved through a flexible, self-consistent and self-adapting mode of detection, covering a wide dynamic range. For high density multi-state encoding, this approach borders on full analog treatment, dictating analog techniques including A to D type conversion to reconstruct and process the data. In accordance with the teachings of this invention, the memory array is read with high fidelity, not to provide actual final digital data, but rather to provide raw data accurately reflecting the analog storage state, which information is sent to a memory controller for analysis and detection of the actual final digital data.10-29-2009
20100047979METHOD OF REDUCING COUPLING BETWEEN FLOATING GATES IN NONVOLATILE MEMORY - A nonvolatile memory array includes floating gates that have an inverted-T shape in cross section along a plane that is perpendicular to the direction along which floating cells are connected together to form a string. Adjacent strings are isolated by shallow trench isolation structures.02-25-2010
20100091568Nonvolatile Memory and Method With Reduced Program Verify by Ignoring Fastest and/or Slowest Programming Bits - A group of non-volatile memory cells are programmed in a programming pass by a series of incremental programming pulses where each pulse is followed by a program-verify and possibly program-inhibition step. Performance is improved during the programming pass by delayed starting and prematurely terminating the various verify levels that demarcate the multiple memory states. This amounts to skipping the verifying and inhibiting steps of the fastest and slowest programming (fringe) cells of the group. A reference pulse is established when the fastest cells have all been program-verified relative to a first verify level. The starting of what verify level at what pulse will then be delayed relative to the reference pulse. Verifying stops for a given verify level when only a predetermined number of cells remain unverified relative to that given level. Any errors arising from over- or under-programming of the fringe cells are corrected by an error correction code.04-15-2010
20100091573Nonvolatile Memory And Method With Reduced Program Verify By Ignoring Fastest And/Or Slowest Programming Bits - A group of non-volatile memory cells are programmed in a programming pass by a series of incremental programming pulses where each pulse is followed by a program-verify and possibly program-inhibition step. Performance is improved during the programming pass by delayed starting and prematurely terminating the various verify levels that demarcate the multiple memory states. This amounts to skipping the verifying and inhibiting steps of the fastest and slowest programming (fringe) cells of the group. A reference pulse is established when the fastest cells have all been program-verified relative to a first verify level. The starting of what verify level at what pulse will then be delayed relative to the reference pulse. Verifying stops for a given verify level when only a predetermined number of cells remain unverified relative to that given level. Any errors arising from over- or under-programming of the fringe cells are corrected by an error correction code.04-15-2010
20110111583METHOD OF REDUCING COUPLING BETWEEN FLOATING GATES IN NONVOLATILE MEMORY - A nonvolatile memory array includes floating gates that have an inverted-T shape in cross section along a plane that is perpendicular to the direction along which floating cells are connected together to form a string. Adjacent strings are isolated by shallow trench isolation structures.05-12-2011
20110134703Nonvolatile Memory and Method With Reduced Program Verify by Ignoring Fastest And/Or Slowest Programming Bits - A group of non-volatile memory cells are programmed in a programming pass by a series of incremental programming pulses where each pulse is followed by a program-verify and possibly program-inhibition step. Performance is improved during the programming pass by delayed starting and prematurely terminating the various verify levels that demarcate the multiple memory states. This amounts to skipping the verifying and inhibiting steps of the fastest and slowest programming (fringe) cells of the group. A reference pulse is established when the fastest cells have all been program-verified relative to a first verify level. The starting of what verify level at what pulse will then be delayed relative to the reference pulse. Verifying stops for a given verify level when only a predetermined number of cells remain unverified relative to that given level. Any errors arising from over- or under-programming of the fringe cells are corrected by an error correction code.06-09-2011

Patent applications by Yupin Kawing Fong, Fremont, CA US