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Fitzi
Andreas Fitzi, Stafa CH
| Patent application number | Description | Published |
|---|---|---|
| 20100085103 | System and Method for Charge Integration - An arrangement for charge integration comprises an input ( | 04-08-2010 |
| 20100164594 | System and Method for Charge Integration - An arrangement for charge integration comprises a charge-generating circuit ( | 07-01-2010 |
Andreas Fitzi, Staefa CH
| Patent application number | Description | Published |
|---|---|---|
| 20100033994 | CONTROL ARRANGEMENT AND CIRCUIT ARRANGEMENT FOR CONVERTING A DC VOLTAGE INTO A RECTIFIED VOLTAGE - Circuitry includes an acquiring circuit to acquire period and phase information of an oscillation. The acquiring circuit includes a first input electrically coupled to a first connection and a second input electrically coupled to a second connection. The first connection and the second connection are for electrically coupling to an oscillating circuit. A control circuit includes a first input electrically coupled to an output of the acquiring circuit. The control circuit includes a second input electrically coupled to a third connection for supply of a voltage that is based on the rectified voltage. A switch includes a controlled segment for electrically coupling a fourth connection to a reference potential connection, and a control connection that is electrically coupled to an output of the control circuit to excite an oscillation in the oscillating circuit via a DC voltage. | 02-11-2010 |
Martin Fitzi, Stafa CH
| Patent application number | Description | Published |
|---|---|---|
| 20100310343 | Method and apparatus for processing individual sensor devices - To process a plurality of sensor devices, such as humidity sensors or gas sensors, the sensor devices are run through a testing station and a turret handler. In order to increase throughput of the testing station, several test cycles are operated simultaneously in a phase-shifted manner. The sensor devices are e.g. sequentially fed onto trays of the test station, on which they are assembled in batches. Each batch is subjected to a test cycle. After the test cycle, the sensor devices of a batch are sequentially fed back to the turret handler. | 12-09-2010 |
