Inventors list |
Assignees list |
Classification tree browser |
Top 100 Inventors |
Top 100 Assignees |
Fettig
David Fettig, Fremont, CA US
| Patent application number | Description | Published |
|---|---|---|
| 20110177778 | Radio and Public Address Accessory System with Wireless Interface - A communications system for a vehicle user is provided. The system comprises a portable transceiver which the vehicle user can easily carry on his or her person and a vehicle-mounted transceiver. The portable transceiver is capable of communicating with the vehicle-mounted transceiver. Audio information contained in a transmission from the portable transceiver may be retransmitted by the vehicle-mounted transceiver either to a public address system or a second vehicle-mounted transceiver. | 07-21-2011 |
Matthew Fettig, Austin, TX US
| Patent application number | Description | Published |
|---|---|---|
| 20080228467 | NATURAL LANGUAGE PARSING METHOD TO PROVIDE CONCEPTUAL FLOW - A method for parsing the flow of natural human language to convert a flow of machine recognizable language into a conceptual flow includes, first, recognizing the lexical structure and then, a basic semantic grouping is determined for the language flow in the lexical structure. The basic semantic grouping is then determined that denotes the main action, occurrence or state of being for the language flow. The responsibility of the main action, occurrence or state of being for the language flow is then determined within the lexical structure followed by semantically parsing the lexical structure. Thereafter, any ambiguities in the responsibilities are resolved in a recursive manner by applying a predetermined set of rules thereto. | 09-18-2008 |
Paul M. Fettig, Oakdale, MN US
| Patent application number | Description | Published |
|---|---|---|
| 20100276061 | CANTILEVERED BAR GAP ADJUSTMENT FOR AN ULTRASONIC WELDING SYSTEM - A method for adjusting the gap between a horn and an anvil in an ultrasonic welding system includes the act of positioning a horn proximal to an anvil, so that a gap is established between the horn and the anvil. A force is applied to the horn, so as to urge the horn toward the anvil. A deformable stop is positioned at a location, such that application of the urging force causes a member operatively connected to the horn to abut the deformable stop, and to deform the stop. The urging force is iteratively adjusted during operation of the horn, so as to adjust the extent of the deformation of the deformable stop, and to maintain the gap between the horn and the anvil substantially constant. | 11-04-2010 |
| 20100276086 | METHOD AND SYSTEM FOR DETERMINING A GAP BETWEEN A VIBRATIONAL BODY AND FIXED POINT - A system for applying ultrasonic energy to a workpiece, the system including a horn stack; a mounting system upon which the horn stack is mounted; a source of energy coupled to the horn stack; an anvil having a surface for supporting the workpiece; and a controller configured to receive a resonant frequency of the horn stack, and to determine a quantity standing in known relation to a change in gap between the horn stack and the anvil. | 11-04-2010 |
Rabi Fettig, Somerville, MA US
| Patent application number | Description | Published |
|---|---|---|
| 20080262751 | Curvature-based edge bump quantification - Evaluating irregularities in surfaces of objects such as semiconductor wafers using a thickness profile of a surface section and analyzing the profile to obtain information of an irregularity start position, magnitude, and span along with surface slope and height information. | 10-23-2008 |
| 20110112796 | Curvature-Based Edge Bump Quantification - Evaluating irregularities in surfaces of objects such as semiconductor wafers using a thickness profile of a surface section and analyzing the profile to obtain information of an irregularity start position, magnitude, and span along with surface slope and height information. | 05-12-2011 |
| 20110144943 | Localized Substrate Geometry Characterization - A system for evaluating the metrological characteristics of a surface of a substrate, the system including an optical substrate measurement system, a data analyzing system for analyzing data in an evaluation area on the substrate, applying feature-specific filters to characterize the surface of the substrate, and produce surface-specific metrics for characterizing and quantifying a feature of interest, the surface-specific metrics including a range metric for quantifying maximum and minimum deviations in the evaluation area, a deviation metric for quantifying a point deviation having a largest magnitude in a set of point deviations, where the point deviations are an amount of deviation from a reference plane fit to the evaluation area, and a root mean square metric calculated from power spectral density. | 06-16-2011 |