Patent application number | Description | Published |
20090080767 | METHOD FOR DETERMINING A DEPTH MAP FROM IMAGES, DEVICE FOR DETERMINING A DEPTH MAP - Window based matching is used for determining a depth map from images obtained from different orientations. A set of fixed matching windows is used for points of the image for which the depth is to be determined. The set of matching windows covers a footprint of pixels around the point of the image, and the average number (0) of matching windows that a pixel of the footprint (FP) belongs to is less than one plus the number of pixels in the footprint divided by 15 (003-26-2009 | |
20090316994 | METHOD AND FILTER FOR RECOVERY OF DISPARITIES IN A VIDEO STREAM - The invention concerns a method for recovery, through a digital filtering processing, of the disparities (di,k) in the digital images ( | 12-24-2009 |
20110266440 | SEM Imaging Method - A method of investigating a sample using Scanning Electron Microscopy (SEM), comprising the following steps:
| 11-03-2011 |
20120292503 | CHARGED-PARTICLE MICROSCOPY WITH OCCLUSION DETECTION - This invention relates to a method of examining a sample using a charged-particle microscope. This invention solves the problem of occlusion effects, whereby a given line-of-sight behind a particular region on a sample and a given detector is blocked by a topographical feature on the sample, thus hampering detection of the emitted radiation emanating from the occluded region. This problem is solved by using at least a first and second detector configuration to detect each portion of the emitted radiation and to produce at least a first and second corresponding image based thereupon; and using computer processing apparatus to automatically compare different members of the set of corresponding images and mathematically identify on the sample at least one occlusion region with an occluded line-of-sight relative to at least one of the detector configurations. | 11-22-2012 |
20130037714 | Charged-Particle Microscopy Imaging Method - Charged-particle microscopy includes
| 02-14-2013 |
20130037715 | CHARGED-PARTICLE MICROSCOPE PROVIDING DEPTH-RESOLVED IMAGERY - A method of examining a sample using a charged-particle microscope, comprising the following steps:
| 02-14-2013 |
20130228683 | Charged-Particle Microscope Providing Depth-Resolved Imagery - A method of examining a sample using a charged-particle microscope, comprising mounting the sample on a sample holder; using a particle-optical column to direct at least one beam of particulate radiation onto a surface S of the sample, thereby producing an interaction that causes emitted radiation to emanate from the sample; using a detector arrangement to detect at least a portion of said emitted radiation, the method of which comprises embodying the detector arrangement to detect electrons in the emitted radiation; recording an output O | 09-05-2013 |
20140312226 | CHARGED-PARTICLE MICROSCOPE PROVIDING DEPTH-RESOLVED IMAGERY - A method of examining a sample using a charged-particle microscope, comprising mounting the sample on a sample holder; using a particle-optical column to direct at least one beam of particulate radiation onto a surface S of the sample, thereby producing an interaction that causes emitted radiation to emanate from the sample; using a detector arrangement to detect at least a portion of said emitted radiation, the method of which comprises embodying the detector arrangement to detect electrons in the emitted radiation; recording an output O | 10-23-2014 |