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Eng, Singapore

Chew Say Eng, Singapore SG

Patent application numberDescriptionPublished
20090152351Detecting An Encoder Material Reading Error - In a method for detecting an encoder material reading error, at least one of a sensor and an encoder material is slewed with respect to each other. Markers on the encoder material are detected with the sensor as at least one of the sensor and the encoder material is slewed with respect to each other to obtain position vs. time data of the sensor with respect to the encoder material. The position vs. time data is analyzed to determine whether a speed at which at least one of the sensor and the encoder material travels with respect to each other fell below a predetermined threshold. In addition, a determination that an encoder material reading error has occurred is made in response to a determination that the speed fell below the predetermined threshold.06-18-2009

How Lung Eng, Singapore SG

Patent application numberDescriptionPublished
20120086802SYSTEM AND METHOD FOR MONITORING WATER QUALITY - A system and system for monitoring water quality. The system comprises a container for receiving a flow of water to be monitored, the container containing a plurality of fish and configured such that a substantially 3-dimensional group behaviour of the fish is accommodated; a first imaging device disposed above the container for obtaining top view video data of the fish; and means for identifying individual fish based on foreground object detection.04-12-2012

Kian Teng Eng, Singapore SG

Patent application numberDescriptionPublished
20090008796COPPER ON ORGANIC SOLDERABILITY PRESERVATIVE (OSP) INTERCONNECT - Provided is a semiconductor package, and a method for constructing the same, including a first substrate, a first semiconductor chip attached to the first substrate, and a first copper wire. At least one of the first substrate and the first semiconductor chip has an Organic Solderability Preservative (OSP) material coated on at least a portion of one surface, and the first copper wire is wire bonded through the OSP material to the first substrate and the first semiconductor chip.01-08-2009
20090165815AVOIDING ELECTRICAL SHORTS IN PACKAGING - A plasma clean tool that includes a cleaning chamber for cleaning an article by plasma cleaning and a charge shield for surrounding an article to be cleaned is presented. The charge shield prevents charged components of plasma from passing therethrough to charge the article during plasma cleaning of the article.07-02-2009
20090194871SEMICONDUCTOR PACKAGE AND METHOD OF ATTACHING SEMICONDUCTOR DIES TO SUBSTRATES - A method of mounting a semiconductor die on a substrate with a solder mask on a first surface includes placing a die on the solder mask, and mounting the die to the substrate by applying pressure and heat. The applied pressure ranges from a bond force of approximately 5 to 10 Kg, the heat has a temperature range from approximately 150 to 200° C. and the pressure is applied for a range of approximately 1 to 10 seconds.08-06-2009
20100025849COPPER ON ORGANIC SOLDERABILITY PRESERVATIVE (OSP) INTERCONNECT AND ENHANCED WIRE BONDING PROCESS - A semiconductor package and a method for constructing the package are disclosed. The package includes a substrate and a die attached thereto. A first contact region is disposed on the substrate and a second contact region is disposed on the die. The first contact region, for example, comprises copper coated with an OSP material. A copper wire bond electrically couples the first and second contact regions. Wire bonding includes forming a ball bump on the first contact region having a flat top surface. Providing the flat top surface is achieved with a smoothing process. A ball bond is formed on the second contact region, followed by stitching the wire onto the flat top surface of the ball bump on the first contact region.02-04-2010
20100102436SHRINK PACKAGE ON BOARD - A method of forming a device is disclosed. The method includes providing a printed circuit board substrate having a die attach region on a first surface of the substrate. The method also includes attaching a die to a die attach region. The die is electrically coupled to first land pads disposed on the first surface at the periphery of the die attach region. A cap is formed in a target area by a top gate process to produce a cap with an even surface. The cap covers the die and leaves at least the first land pads exposed.04-29-2010
20120001306SEMICONDUCTOR PACKAGES AND METHODS OF PACKAGING SEMICONDUCTOR DEVICES - A device is disclosed. The device includes a carrier substrate having first and second major surfaces. The first surface includes a die region and contact pads and the second surface includes package contacts. The carrier substrate includes a patterned lead frame which defines a line level with conductive traces and a via level with via contacts. The patterned lead frame provides interconnections between the contact pads and package contacts. The carrier substrate further includes a dielectric layer isolating the conductive traces and via contacts. The device includes a die mounted on the die region of the first surface.01-05-2012
20120034738SEMICONDUCTOR PACKAGE AND METHOD OF ATTACHING SEMICONDUCTOR DIES TO SUBSTRATES - A method of mounting a semiconductor die on a substrate with a solder mask on a first surface includes placing a die on the solder mask, and mounting the die to the substrate by applying pressure and heat. The applied pressure ranges from a bond force of approximately 5 to 10 Kg, the heat has a temperature range from approximately 150 to 200° C. and the pressure is applied for a range of approximately 1 to 10 seconds.02-09-2012

Patent applications by Kian Teng Eng, Singapore SG

Meow Koon Eng, Singapore SG

Patent application numberDescriptionPublished
20090014858PACKAGED SEMICONDUCTOR ASSEMBLIES AND METHODS FOR MANUFACTURING SUCH ASSEMBLIES - Packaged semiconductor assemblies including interconnect structures and methods for forming such interconnect structures are disclosed herein. One embodiment of a packaged semiconductor assembly includes a support member having a first bond-site and a die carried by the support member having a second bond-site. An interconnect structure is connected between the first and second bond-sites and includes a wire that is coupled to at least one of the first and second bond-sites. The interconnect structure also includes a third bond-site coupled to the wire between the first and second bond-sites.01-15-2009
20100072603SEMICONDUCTOR DEVICE ASSEMBLIES AND PACKAGES WITH EDGE CONTACTS AND SACRIFICIAL SUBSTRATES AND OTHER INTERMEDIATE STRUCTURES USED OR FORMED IN FABRICATING THE ASSEMBLIES OR PACKAGES - A sacrificial substrate for fabricating semiconductor device assemblies and packages with edge contacts includes conductive elements on a surface thereof, which are located so as to align along a street between each adjacent pair of semiconductor devices on the device substrate. A semiconductor device assembly or package includes a semiconductor device, a redistribution layer over an active surface of the semiconductor device, and dielectric material coating at least portions of an outer periphery of the semiconductor device. Peripheral sections of contacts are located on the peripheral edge and electrically isolated therefrom by the dielectric coating. The contacts may also include upper sections that extend partially over the active surface of the semiconductor device. The assembly or package may include any type of semiconductor device, including a processor, a memory device, and emitter, or an optically sensitive device.03-25-2010
20110215453MICROELECTRONIC DIE PACKAGES WITH LEADFRAMES, INCLUDING LEADFRAME-BASED INTERPOSER FOR STACKED DIE PACKAGES, AND ASSOCIATED SYSTEMS AND METHODS - Microelectronic die packages, stacked systems of die packages, and methods of manufacturing thereof are disclosed herein. In one embodiment, a method of manufacturing a microelectronic device includes stacking a first die package having a first dielectric casing on top of a second die package having a second dielectric casing, aligning first metal leads at a lateral surface of the first casing with second metal leads at a second lateral surface of the second casing, and forming metal solder connectors that couple individual first leads to individual second leads. In another embodiment, the method of manufacturing the microelectronic device may further include forming the connectors by applying metal solder to a portion of the first lateral surface, to a portion of the second lateral surface, and across a gap between the first die package and the second die package so that the connectors are formed by the metal solder wetting to the individual first leads and the individual second leads.09-08-2011

Patent applications by Meow Koon Eng, Singapore SG

Yew Soo Eng, Singapore SG

Patent application numberDescriptionPublished
20090110128SYNCHRONIZATION ACQUIRING DEVICE AND SYNCHRONIZATION ACQUIRING METHOD - A synchronization acquiring device and method for realizing synchronization acquisition at high speed equivalent to that of parallel search with a simple constitution similar to that of series search. A synchronization acquiring device (04-30-2009
20090290670METHOD OF ACQUIRING INITIAL SYNCHRONIZATION IN IMPULSE WIRELESS COMMUNICATION AND RECEIVER - A receiver in an impulse wireless communication. The receiver (11-26-2009
20100020864PULSE TRANSMITTING DEVICE, PULSE RECEIVING DEVICE, PULSE COMMUNICATION SYSTEM, AND PULSE COMMUNICATION METHOD - A pulse transmitting device is provided to avoid interference between pulses due to multipath influence even in a high speed pulse transmission that is typical of a UWB by making use of a relatively simple method and to improve receiving quality. In the device, a pulse adjusting unit (01-28-2010
20100208846RADIO RECEIVING APPARATUS AND RADIO RECEIVING METHOD - A radio receiving apparatus and a radio receiving method wherein synchronization is established at a high speed with high reliability. An IR receiver (08-19-2010