| Patent application number | Description | Published |
|---|
| 20080294955 | Dynamically Reconfigurable Shared Scan-In Test Architecture - A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time. | 11-27-2008 |
| 20080301510 | Dynamically Reconfigurable Shared Scan-In Test Architecture - A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time. | 12-04-2008 |
| 20080313513 | Method and Apparatus for Synthesis of Multimode X-Tolerant Compressor - Methods and apparatuses for synthesizing a multimode x-tolerant compressor are described. | 12-18-2008 |
| 20090083596 | Method and Apparatus for Synthesis of Augmented Multimode Compactors - Methods and apparatuses for synthesizing and/or implementing an augmented multimode compactor are described. | 03-26-2009 |
| 20090083597 | Method and Apparatus for Synthesis of Augmented Multimode Compactors - Methods and apparatuses for synthesizing and/or implementing an augmented multimode compactor are described. | 03-26-2009 |
| 20090271673 | Dynamically Reconfigurable Shared Scan-In Test Architecture - A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time. | 10-29-2009 |
| 20090313514 | Dynamically Reconfigurable Shared Scan-In Test Architecture - A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time. | 12-17-2009 |
| 20100031101 | Dynamically Reconfigurable Shared Scan-In Test Architecture - A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time. | 02-04-2010 |
| 20100223516 | Dynamically Reconfigurable Shared Scan-In Test Architecture - A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time. | 09-02-2010 |
| 20110093752 | Method and Apparatus for Synthesis of Augmented Multimode Compactors - Methods and apparatuses for synthesizing and/or implementing an augmented multimode compactor are described. | 04-21-2011 |
