| Patent application number | Description | Published |
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| 20080284837 | METHODS AND SYSTEMS FOR THERMA-BASED LASER PROCESSING A MULTI-MATERIAL DEVICE - A method and system for locally processing a predetermined microstructure formed on a substrate without causing undesirable changes in electrical or physical characteristics of the substrate or other structures formed on the substrate are provided. The method includes providing information based on a model of laser pulse interactions with the predetermined microstructure, the substrate and the other structures. At least one characteristic of at least one pulse is determined based on the information. A pulsed laser beam is generated including the at least one pulse. The method further includes irradiating the at least one pulse having the at least one determined characteristic into a spot on the predetermined microstructure. The at least one determined characteristic and other characteristics of the at least one pulse are sufficient to locally process the predetermined microstructure without causing the undesirable changes. | 11-20-2008 |
| 20090095722 | LINK PROCESSING WITH HIGH SPEED BEAM DEFLECTION - The present invention relates to the field of laser processing methods and systems, and specifically, to laser processing methods and systems for laser processing multi-material devices. Systems and methods may utilize high speed deflectors to improve processing energy window and/or improve processing speed. In some embodiments, a deflector is used for non-orthogonal scanning of beam spots. In some embodiment, a deflector is used to implement non-synchronous processing of target structures. | 04-16-2009 |
| 20090321396 | Method And System For High-Speed Precise Laser Trimming And Scan Lens For Use Therein - A method, system and scan lens for use therein are provided for high-speed, laser-based, precise laser trimming at least one electrical element along a trim path. The method includes generating a pulsed laser output with a laser, the output having one or more laser pulses at a repetition rate. A fast rise/fall time, pulse-shaped q-switched laser or an ultra-fast laser may be used. Beam shaping optics may be used to generate a flat-top beam profile. Each laser pulse has a pulse energy, a laser wavelength within a range of laser wavelengths, and a pulse duration. The wavelength is short enough to produce desired short-wavelength benefits of small spot size, tight tolerance, high absorption and reduced or eliminated heat-affected zone (HAZ) along the trim path, but not so short so as to cause microcracking. In this way, resistance drift after the trimming process is reduced. | 12-31-2009 |
| 20100140239 | METHOD AND SYSTEM FOR HIGH-SPEED, PRECISE MICROMACHINING AN ARRAY OF DEVICES - A method and system for high-speed, precise micromachining an array of devices are disclosed wherein improved process throughput and accuracy, such as resistor trimming accuracy, are provided. Beam scanning and deflection are both used to distribute beam spots to elements of an array of elements for selective processing. The deflection can be performed with a solid state deflector. | 06-10-2010 |
| 20110062127 | LASER-BASED METHOD AND SYSTEM FOR REMOVING ONE OR MORE TARGET LINK STRUCTURES - Laser-based methods and systems for removing one or more target link structures of a circuit fabricated on a substrate includes generating a pulsed laser output at a predetermined wavelength less than an absorption edge of the substrate are provided. The laser output includes at least one pulse having a pulse duration in the range of about 10 picoseconds to less than 1 nanosecond, the pulse duration being within a thermal laser processing range. The method also includes delivering and focusing the laser output onto the target link structure. The focused laser output has sufficient power density at a location within the target link structure to reduce the reflectivity of the target link structure and efficiently couple the focused laser output into the target link structure to remove the target link structure without damaging the substrate. | 03-17-2011 |
| 20110108534 | METHOD AND SYSTEM FOR HIGH-SPEED, PRECISE MICROMACHINING AN ARRAY OF DEVICES - A method and system for high-speed, precise micromachining an array of devices are disclosed wherein improved process throughput and accuracy, such as resistor trimming accuracy, are provided. Beam scanning and deflection are both used to distribute beam spots to elements of an array of elements for selective processing. The deflection can be performed with a solid state deflector. | 05-12-2011 |
| 20110210105 | LINK PROCESSING WITH HIGH SPEED BEAM DEFLECTION - Link processing systems and methods use controlled two dimensional deflection of a beam along an optical axis trajectory to process links positioned along and transverse to the trajectory during a pass of the optical axis along the trajectory. Predictive position calculations allow link blowing accuracy during constant velocity and accelerating trajectories. | 09-01-2011 |
| 20110297851 | LASER PROCESSING WITH ORIENTED SUB-ARRAYS - In a system for severing conductive links by laser irradiation to repair electronic devices, multiple laser beams are deflected at high-speed to target selected links for processing by positioning laser spots in a two dimensional pattern during relative motion of a substrate and a beam delivery system. As link targeting flexibility is increased, selection may be required from a large number of addressable link pairs. Various embodiments advantageously use beam deflection and beam splitting to improve memory repair processing rates. | 12-08-2011 |
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| 20100225883 | CHARACTERISING EYE-RELATED OPTICAL SYSTEMS - An instrument and method for characterising eye-related optical systems, including the live human eye involves scanning an illuminating light beam from a light source and light detector unit from element to element of a beam deflector array of elements arranged laterally across the optical axis of eye. At each successive element the illuminating beam is deflected to form an interrogating beam that is directed into the eye at a peripheral angle that depends upon the lateral location of the deflector element. A return beam is reflected or back-scattered from the cornea and returned via the same deflector element to the light source and detector unit. This allows the interrogating beams to be scanned sufficiently rapidly into the eye to greatly reduce the variation of eye fixation and gaze that accompany other methods of measuring peripheral refraction or aberration of a natural eye. In addition to or instead of scanning the illuminating beam over each element of the array, all or multiple elements of the array can be illuminated simultaneously and the multiple interrogating rays thus generated can be gated by the use of an LCD aperture plate. Alternatively, an LCD aperture plate can be interposed between a wide illuminating beam and operated to selectively illuminate the beam deflector | 09-09-2010 |
| 20100296058 | DETERMINATION OF OPTICAL ADJUSTMENTS FOR RETARDING MYOPIA PROGRESSION - A method or process for providing an anti-myopia lens or treatment for a patient's eye with progressive myopia, which involves (in one form) generating biometric data relating to the central and peripheral refractive errors of the eye, optionally together with data relating to the patient's visual or lifestyle needs and the patient's predisposition to progressive myopia. This data is input to a processor or algorithm that generates a basic lens design, a customised design or a program for reshaping the cornea of the eye. The selected modality is applied to the patient and its suitability is assessed with the result of the assessment feedback to the algorithm to generate a refined output design, which is applied to the patient. The process is repeated at intervals to check continued myopia progression and adjust the design of the selected modality after further measurement. | 11-25-2010 |
| 20110170059 | PHYSICAL MODEL EYE SYSTEMS AND METHODS - An optically realistic model eye is described. The optically realistic eye model has an optical axis and includes: an anterior replaceable module comprising a model cornea, model iris and model lens rotatably mounted for rotation about said axis, said module being representative of an emmetropic or pathological natural eye; an enclosure located posterior to said module and adapted to enclose a retinal area within which an image of an external object is brought to focus by said module; and a photoactive device movable within said enclosure and retinal area and adapted to detect or reflect a portion of the image for inspection, processing or analysis. | 07-14-2011 |
