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Ebi, JP
Daisuke Ebi, Kanagawa JP
| Patent application number | Description | Published |
|---|---|---|
| 20080311019 | Apparatus for pulling single crystal by CZ method - In a Czochralski (CZ) single crystal puller equipped with a cooler and a thermal insulation member, which are to be disposed in a CZ furnace, smooth recharge and additional charge of material are made possible. Further, elimination of dislocations from a silicon seed crystal by use of the Dash's neck method can be performed smoothly. To these ends, there is provided a CZ single crystal puller, wherein a cooler and a thermal insulation member are immediately moved upward away from a melt surface during recharge or additional charge of material or during elimination of dislocations from a silicon seed crystal by use of the Dash's neck method. | 12-18-2008 |
| 20080311021 | Apparatus for pulling single crystal by CZ method - In a Czochralski (CZ) single crystal puller equipped with a cooler and a thermal insulation member, which are to be disposed in a CZ furnace, smooth recharge and additional charge of material are made possible. Further, elimination of dislocations from a silicon seed crystal by use of the Dash's neck method can be performed smoothly. To these ends, there is provided a CZ single crystal puller, wherein a cooler and a thermal insulation member are immediately moved upward away from a melt surface during recharge or additional charge of material or during elimination of dislocations from a silicon seed crystal by use of the Dash's neck method. | 12-18-2008 |
Daisuke Ebi, Hiratsuka-Shi JP
| Patent application number | Description | Published |
|---|---|---|
| 20090173272 | Apparatus for pulling single crystal by CZ method - In a Czochralski (CZ) single crystal puller equipped with a cooler and a thermal insulation member, which are to be disposed in a CZ furnace, smooth recharge and additional charge of material are made possible. Further, elimination of dislocations from a silicon seed crystal by use of the Dash's neck method can be performed smoothly. To these ends, there is provided a CZ single crystal puller, wherein a cooler and a thermal insulation member are immediately moved upward away from a melt surface during recharge or additional charge of material or during elimination of dislocations from a silicon seed crystal by use of the Dash's neck method. | 07-09-2009 |
Hiroyuki Ebi, Kyoto JP
| Patent application number | Description | Published |
|---|---|---|
| 20090061541 | SEMICONDUCTOR FABRICATION SYSTEM, AND FLOW RATE CORRECTION METHOD AND PROGRAM FOR SEMICONDUCTOR FABRICATION SYSTEM - Zero point shift based on thermal siphon effect occurring actually when a substrate is processed is detected accurately and corrected suitably. The semiconductor fabrication system comprises a gas supply passage ( | 03-05-2009 |
| 20110125445 | THERMAL TYPE MASS FLOW METER, AND THERMAL TYPE MASS FLOW CONTROL DEVICE - The present invention provides a thermal type mass flow meter and a thermal type mass flow control device which can lower a measurement error caused by an influence of a thermal siphon phenomenon so as to intend to improve a flow rate measurement precision while it is possible to construct a whole compactly and inexpensively with a simple structure, without using any flow path converting block. | 05-26-2011 |
Ryuichiro Ebi, Osaka JP
| Patent application number | Description | Published |
|---|---|---|
| 20090074618 | Sample analyzer - A sample analyzer is disclosed that comprises: an analysis section for analyzing a sample by using a reagent; an information receiver for receiving an input of information regarding the reagent; a determination section for determining, whether or not the reagent satisfies a condition to determine that the reagent is a genuine product, based on the information received by the information receiver; and a controller for controlling an operation of the sample analyzer based on a result of the determination by the determination section. | 03-19-2009 |
| 20110014685 | CELL PROCESSING APPARATUS, SAMPLE PREPARATION APPARATUS, AND CELL ANALYZER - A cell processing apparatus | 01-20-2011 |
Ryuichiro Ebi, Osaka-Shi JP
| Patent application number | Description | Published |
|---|---|---|
| 20080206098 | SAMPLE PROCESSING APPARATUS AND SAMPLE PROCESSING SYSTEM - The present invention is to present a sample processing system that is capable of reducing the tasks involved in the connection of the transporting apparatus. The sample processing system comprises: the transporting apparatus | 08-28-2008 |
| 20110076755 | SAMPLE PREPARATION APPARATUS AND CELL ANALYZER - A sample preparation apparatus comprising: a storage chamber that can store therein a liquid sample including an analysis target to be analyzed; a concentrated sample storage chamber that is provided to communicate with the storage chamber and that stores therein concentrated liquid having an analysis target having a higher concentration than that of the liquid sample; and an analysis target transportation section for transporting the analysis target included in the liquid sample stored in the storage chamber to the concentrated sample storage chamber. A cell analyzer is also disclosed. | 03-31-2011 |
Yukari Ebi, Osaka-Shi JP
| Patent application number | Description | Published |
|---|---|---|
| 20110096348 | IMAGE FORMING APPARATUS AND METHOD, AND APPARATUS FOR SETTING OPERATION CONDITIONS OF FUNCTIONAL UNIT - An image forming apparatus includes: an image forming unit forming an image on a medium based on image data; a first storage storing image forming conditions; an input device storing image forming conditions set by a user input setting the image forming conditions in the first storage; a second storage storing a history of input operations by the user; a registering device registering, if the history stored in the second storage satisfies a predetermined condition, the image forming conditions stored in the first storage as image forming conditions that can be called by a unique identifier; and a calling device, responsive to a user input designating an identifier, the corresponding image forming conditions from the registering device and storing in the first storage. | 04-28-2011 |
Yukari Ebi, Osaka JP
| Patent application number | Description | Published |
|---|---|---|
| 20100027059 | IMAGE PROCESSING APPARATUS AND PREVIEW DISPLAY METHOD - The image processing apparatus is provided with a preview image generating portion for generating a preview image of image data to be output in the unit of an output job, and an image display portion such as a touch panel for displaying the generated preview image. The image display portion displays a generation stop key for stopping generation of the preview image during the generation of the preview image so as to be selectable by a user, and displays a different screen in accordance with a generation state of the preview image when the generation stop key is selected by a user operation. | 02-04-2010 |
| 20100281476 | Image forming apparatus and image forming system - Provided is an image forming apparatus which makes input of an initial setting value of driver software such as a printer driver easier and capable of preventing erroneous input. A MFP is connected through a network to an administrator PC in which driver software is installed, and controlled by the driver software. The MFP includes an initial setting value input portion for inputting an initial setting value of the driver software and a setting value table that stores a setting value of an image forming function included in the MFP. The initial setting value input portion sets the setting value stored in the setting value table on an initial setting value input screen of the driver software as the initial setting value of the driver software so that a user can change the initial setting value set on the initial setting value input screen. | 11-04-2010 |
| 20100309499 | IMAGE FORMING APPARATUS AND IMAGE FORMING SYSTEM - An MFP is connected with an administrator PC having a printer driver installed thereon through a network to be controlled by the printer driver. The MFP is provided with an image reading portion for optically reading predetermined printed matter to input image data, a printing set value judging portion for judging printing set values when printed matter is printed from input image data, and an initial set value input portion for inputting the judged printing set values as initial set values of a printer driver. The initial set value input portion set printing set values obtained by reading printed matter on an initial set value input screen of a printer driver as the initial set values of the printer driver, and initial set values set to the initial set value input screen are changeable by a user. | 12-09-2010 |
Yusuke Ebi, Tokyo JP
| Patent application number | Description | Published |
|---|---|---|
| 20090236170 | OPTICAL AXIS ORIENTATION MEASURING DEVICE, OPTICAL AXIS ORIENTATION MEASURING METHOD, SPHERICAL SURFACE WAVE DEVICE MANUFACTURING DEVICE, AND SPHERICAL SURFACE WAVE DEVICE MANUFACTURING METHOD - The optical axis orientation measuring device according to the present invention is a reflective optical axis orientation measuring device for a spherical member made from a single crystal of an optically uniaxial crystal having birefringence, comprising: illuminating means for illuminating the spherical member through a polarizer; and isogyre observing means for observing the isogyre that is structured by the light that is reflected from the bottom surface of the spherical member and emitted from the spherical member through an analyzer that has a cross-nicol relationship with the polarizer. | 09-24-2009 |
| 20090237663 | METHOD FOR DETECTING EQUATORIAL PLANE - To provide a method for detecting the equatorial plane, capable of detecting directly an equatorial plane that has the optical axis as the axis thereof, in a spherical optically uniaxial crystal. The method for detecting the equatorial plane as set forth in a first form of the present invention is a method for detecting an equatorial plane of a spherical member made from a single crystal of an optically uniaxial crystal having birefringence, comprising: a step for causing light to be incident on the spherical member through a polarizer; and a step for observing the isogyre that is structured by the light that is emitted from the spherical member through an analyzer that has a cross-nicol relationship with the polarizer; wherein the isogyre is an isogyre that is observed when the oscillating direction of the polarizer or the analyzer is near to parallel with the optical axis of the spherical member. | 09-24-2009 |