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Dudgeon

Dan E. Dudgeon, Acton, MA US

Patent application numberDescriptionPublished
20090124207Protocol Reference Model, Security and Inter-Operability in a Cognitive Communications System - Various cognitive communications system architectures and their corresponding Protocol Reference Models (PRMs) are disclosed. Such PRMs incorporate a Cognitive Plane in addition to conventional Data and Management Planes. The additional Cognitive Plane functionality may include, for example, spectrum sensing, spectrum management, geolocation, and security functions. The Cognitive Plane may further include a Policy Engine and a Learning and Reasoning Module. In some embodiments, Management Plane functions may be effectively combined to form a database of primitives (and their respective values) called a Management Information Base (MIB). In addition, techniques are provided by which various components of cognitive and non-cognitive, as well as mesh-enabled and non-mesh-enabled nodes in a network, inter-operate with each other. The architectures allow a Spectrum Manager (or Signal Space Manager) to combine information from various network layers (e.g., PHY/MAC Layers, Spectrum Sensing Function, Geolocation Function, and/or Security Sublayers), and to make informed decisions on spectrum utilization.05-14-2009
20100302086COMPRESSIVE SENSOR ARRAY SYSTEM AND METHOD - A compressive sensor array (CSA) system and method uses compressive sampling techniques to acquire sensor data from an array of sensors without independently sampling each of the sensor signals. In general, the CSA system and method uses the compressive sampling techniques to combine the analog sensor signals from the array of sensors into a composite sensor signal and to sample the composite sensor signal at a sub-Nyquist sampling rate. At least one embodiment of the CSA system and method allows a single analog-to-digital converter (ADC) and single RF demodulation chain to be used for an arbitrary number of sensors, thereby providing scalability and eliminating redundant data acquisition hardware. By reducing the number of samples, the CSA system and method also facilitates the processing, storage and transmission of the sensor data.12-02-2010

Kyle B. Dudgeon, Vail, AZ US

Patent application numberDescriptionPublished
20110072230ON DEMAND STORAGE GROUP MANAGEMENT WITH RECAPTURE - A method to dynamically adjust the amount of free space in a storage group is disclosed herein. In certain embodiments, such a method may include monitoring the amount of free space in an active storage group. The method may further include maintaining an overflow storage group containing unused volumes. When the free space in the active storage group falls below a lower threshold value, the method may automatically move a volume from the overflow storage group to the active storage group. Conversely, when the free space in the active storage group exceeds an upper threshold value, the method may automatically transfer data from a volume in the active storage group to other volumes in the active storage group, and move the volume from the active storage group to the overflow storage group. A corresponding computer program product and apparatus are also disclosed herein.03-24-2011

Kyle Barret Dudgeon, Vail, AZ US

Patent application numberDescriptionPublished
20100042663APPARATUS AND METHOD TO OPTIMIZE THE AVAILABLE STORAGE CAPACITY OF A PLURALITY OF SEQUENTIAL DATA STORAGE MEDIA DISPOSED IN A DATA STORAGE SYSTEM - A method to optimize use of available storage capacity of a plurality of sequential data storage media, wherein the method provides (M) sequential data storage media each comprising a plurality of blockids, where the (i)th sequential data storage medium comprises an (i)th available storage capacity, and where (M) is greater than or equal to 2, and where (i) is greater than or equal to 1 and less than or equal to (M). The method then receives source data comprising a plurality of segments, determines a quantum of data to store, determines if the quantum of data to store is substantially equal to an (i)th available storage capacity. If the quantum of data to store is substantially equal an (i)th available storage capacity, then the method writes the source data to an (i)th sequential data storage medium.02-18-2010
20100185589DISASTER RECOVERY DATA SYNC - Various embodiments for failure recovery in a computing environment following a data restoration are provided. A catalog locate is performed for each of a plurality of data sets on a base catalog structure (BCS), identifying a plurality of BCS entries. If a first BCS entry is cataloged incorrectly, the first BCS entry is designated to be re-cataloged. The plurality of BCS entries is compared with a plurality of volume table of contents and a plurality of VSAM volume data set (VTOC/VVDS) entries. If a second BCS entry found in the plurality of BCS entries is not found in the plurality of VTOC/VVDS entries, and the second BCS entry indicates that a data set associated with the second BCS entry is located on a volume, an attempt is made to vary on the volume. If the volume cannot be varied on, a request is created to restore the volume.07-22-2010
20100185829EXTENT CONSOLIDATION AND STORAGE GROUP ALLOCATION - Data is added to a data set to cause a growth in size of the data set, wherein the data set belongs to a storage group, and wherein the data set is comprised of extents. The data set is included into a new storage group, in response to determining that the growth in the size of the data set has caused a predetermined threshold for a size limit of the storage group to be exceeded. The extents of the data set are restructured to satisfy a predetermined condition on the extents of the data set, in response to determining that the growth in the size of the data set has caused the predetermined condition on the extents included in the data set to be not satisfied.07-22-2010

Robert G. Dudgeon, Londonderry, NH US

Patent application numberDescriptionPublished
20090236506LIGHT-EMITTING DEVICE ON-WAFER TEST SYSTEMS AND METHODS - On-wafer test systems and methods for light-emitting devices, such as light-emitting diodes (LEDs), are provided. The test system may be designed, for example, to characterize the light output from the LED die (e.g., power in Lumens).09-24-2009