Patent application number | Description | Published |
20080252315 | ELECTRICAL COMPONENT HANDLER HAVING SELF-CLEANING LOWER CONTACT - An electrical component handler that tests electrical circuit components and includes a self-cleaning lower contact offers reduced yield loss and mean time between assists. A preferred embodiment of the electrical component handler includes multiple sets of upper and lower contacts, each set of which is spatially aligned to electrically contact a single device-under-test (DUT). Each DUT is seated in a test plate that transports the DUT to and from a test measurement position between the upper and lower contacts. The lower contact includes a contact tip that a biasing mechanism urges against the electrical component as it undergoes a test process and against a surface of the test plate as it transports the electrical component. The lower contact rubs against the test plate, thereby contributing to removal of contaminant material acquired by the contact tip during component handler operation. | 10-16-2008 |
20100206769 | HIGH STRENGTH, HIGH DENSITY CARRIER PLATE - A carrier plate for supporting electronic components during processing includes hexagonally-arranged holes for supporting the components. Walls of the holes comprise a gripping resilient material. The hexagonal arrangement provides a strong carrier that improves production yield through an increase in per batch processing and improved locational accuracy over conventional carriers. | 08-19-2010 |
20110220595 | High Strength, High Density Carrier Plate - A carrier plate for supporting electronic components during processing includes hexagonally-arranged holes for supporting the components. Walls of the holes comprise a gripping resilient material. The hexagonal arrangement provides a strong carrier that improves production yield through an increase in per batch processing and improved locational accuracy over conventional carriers. | 09-15-2011 |
20120249175 | CONVEYOR-MOUNTABLE CARRIER FOR ELECTRONIC DEVICE TESTING - A conveyor mountable carrier is adapted to test an electronic device that has electrical leads. The carrier includes a body having a clamping area defined by a base surface and at least one lateral stop surface. The body also defines a pneumatic channel for directing pressurized air toward the clamping area. A clamp is movably connected to the body and has an engaging portion that is positioned opposite the stop surface of the body. The clamp is moveable between an engaged position in which the electronic device is securable to the body and a disengaged position in which the electronic device is releasable from the body. | 10-04-2012 |
20120318639 | Shallow Angle Vertical Rotary Loader For Electronic Device Testing - A rotary loader taught herein comprises a rotatable load plate including a plurality of component pockets arranged about a rotational axis of the load plate, the load plate inclined with respect to a horizontal surface at an angle of inclination of less than 50 degrees and a load wall arranged about a lower portion of the load plate adjacent certain ones of the plurality of component pockets and extending above a height of the load plate. The load wall includes a retention surface extending in a direction parallel to an outer peripheral edge of the load plate and a loading surface inclined with respect a line perpendicular to a top surface of the load plate in a direction away from the retention surface at an angle of inclination of less than 45 degrees. | 12-20-2012 |
20120319712 | Probe Module With Interleaved Serpentine Test Contacts For Electronic Device Testing - A probe module for testing an electronic device comprises at least two contacts, each contact including a first end portion extending in a first direction along a first line, a second end portion extending linearly in a second direction opposite from the first direction and along a second line, and a third curved portion extending between the first end portion and the second end portion. The first line is spaced apart from and in parallel with the second line, and the at least two contacts are spaced apart from each other in a direction perpendicular to the first line and the second line. Methods for making such a probe module are also taught. | 12-20-2012 |
20130014473 | CONFIGURATIONS OF ELECTRONIC COMPONENT-CARRYING APERTURES IN A TERMINATION BELT - A miniature component carrier includes a thin, resilient mask through which are formed multiple spaced-apart apertures each of which is sized and shaped to compliantly receive and hold a miniature component in a controlled orientation during termination processing such that the side margins of the aperture primarily contact and grip the corner regions of the miniature component. At least some of the apertures have side margins that form rhomboidal or elliptical apertures. The shape and size of the multiple spaced-apart apertures confine within an operational tolerance contact between the side margins of the aperture and the side or end wall surfaces of the electronic component. This reduces mechanical damage to the side and end wall surfaces that results from their contact with the side margins during receipt and gripping of the miniature component in the aperture. | 01-17-2013 |
20140116922 | CONFIGURATIONS OF APERTURES IN A MINIATURE ELECTRONIC COMPONENT CARRIER MASK - A miniature component carrier includes a thin, resilient mask through which are formed multiple spaced-apart apertures each of which is sized and shaped to compliantly receive and hold a miniature component in a controlled orientation during termination processing such that the side margins of the aperture primarily contact and grip the corner regions of the miniature component. At least some of the apertures have side margins that form rhomboidal or elliptical apertures. The shape and size of the multiple spaced-apart apertures confine within an operational tolerance contact between the side margins of the aperture and the side or end wall surfaces of the electronic component. This reduces mechanical damage to the side and end wall surfaces that results from their contact with the side margins during receipt and gripping of the miniature component in the aperture. | 05-01-2014 |
20140190875 | SYSTEMS AND METHODS FOR HANDLING ELECTRICAL COMPONENTS - A component handler ( | 07-10-2014 |