Patent application number | Description | Published |
20080273405 | Multi-bit programming device and method of multi-bit programming - A multi-bit programming device and method for a non-volatile memory are provided. In one example embodiment, a multi-bit programming device may include a multi-bit programming unit configured to multi-bit program original multi-bit data to a target memory cell in a memory cell array, and a backup programming unit configured to select backup memory cells in the memory cell array with respect to each bit of the original multi-bit data, and program each bit of the original multi-bit data to a respective one of the selected backup memory cells. | 11-06-2008 |
20080276149 | Error control code apparatuses and methods of using the same - An Error Control Code (ECC) apparatus may include a control signal generator that generates an ECC control signal based on channel information. The ECC apparatus also may include: a plurality of ECC encoding controllers that output data respectively inputted via storage elements corresponding to the ECC control signal; and/or an encoding unit that encodes, using a plurality of data outputted from the plurality of ECC encoding controllers, encoding input data into a number of subdata corresponding to the ECC control signal. In addition or in the alternative, the ECC apparatus may include: a plurality of ECC decoding controllers that output data respectively inputted via the storage elements corresponding to the ECC control signal; and/or a decoding unit that decodes, using a plurality of data outputted from the plurality of ECC decoding controllers, a number of decoding input data corresponding to the ECC control signal into one piece of output data. | 11-06-2008 |
20080276150 | ERROR CONTROL CODE APPARATUSES AND METHODS OF USING THE SAME - An Error Control Code (ECC) apparatus applied to a memory of a Multi-Level Cell (MLC) method may include: a bypass control signal generator generating a bypass control signal; and an ECC performing unit that may include at least two ECC decoding blocks, determining whether to bypass a portion of the at least two ECC decoding blocks based on the bypass control signal, and/or performing an ECC decoding. In addition or in the alternative, the ECC performing unit may include at least two ECC encoding blocks, determining whether to bypass a portion of the at least two ECC encoding blocks based on the bypass control signal, and/or performing an ECC encoding. An ECC method applied to a memory of a MLC method and a computer-readable recording medium storing a program for implementing an EEC method applied to a memory of a MLC method are also disclose. | 11-06-2008 |
20080285340 | Apparatus for reading data and method using the same - Disclosed are an apparatus and a method for reading data. The method for reading data according to example embodiments includes comparing a threshold voltage of a memory cell with a first boundary voltage, comparing the threshold voltage with a second boundary voltage having a higher voltage level than that of the first boundary voltage, and determining data of the memory cell based on the threshold voltage, the first boundary voltage, and the second boundary voltage. | 11-20-2008 |
20080320064 | Method and apparatus for controlling reading level of memory cell - A method and apparatus for controlling a reading level of a memory cell are provided. The method of controlling a reading level of a memory cell may include: receiving metric values calculated based on given voltage levels and reference levels; generating summed values for each of the reference levels by summing metric values corresponding to levels of a received signal from among the received metric values; selecting the reference level having the greatest value of the generated summed values from the reference levels; and controlling the reading level of the memory cell based on the selected reference level. | 12-25-2008 |
20090196097 | Device for reading memory data and method using the same - Provided are a device for reading memory data and a method using the same. The device for reading memory data comprises a memory cell which stores multi-bit information, an information detection unit which detects as much bit information as a predetermined number of bits from among multi-bit information, a source-line voltage control unit which controls a source-line voltage of the memory cell based on the detected bit information from the information detection unit, and a remaining bit information read unit which reads remaining bit information stored in the memory cell by using the controlled source-line voltage. | 08-06-2009 |
20110213930 | Multi-level cell memory device and method thereof - A Multi-Level Cell (MLC) memory device and method thereof are provided. The example MLC memory device may be configured to perform data operations, and may include an MLC memory cell, a first coding device performing a first coding function, the first coding function being one of an encoding function and a decoding function, a second coding device performing a second coding function, the second coding function being one of an encoding function and a decoding function and a signal module configured to perform at least one of instructing the MLC memory cell to store data output by the second coding device if the first and second coding functions are encoding functions, and generating a demapped bit stream based on data retrieved from the MLC memory cell if the first and second coding functions are decoding functions. | 09-01-2011 |
20130294158 | MULTI-LEVEL CELL MEMORY DEVICES AND METHODS OF STORING DATA IN AND READING DATA FROM THE MEMORY DEVICES - A multi-level cell (MLC) memory device may include ‘a’ number of m-bit MLC memory cells; an encoder that encodes ‘k’ bits of data at a code rate of k/n to generate an encoded bit stream; and a signal mapping module that applies pulses to the MLC memory cells in order to write the encoded bit stream in the MLC memory cells. In the device, ‘a’ and ‘m’ may be integers greater than or equal to 2, ‘k’ and ‘n’ may be integers greater than or equal to 1, and ‘n’ may be greater than ‘k’. A method of storing data in the device may include encoding ‘k’ bits of data at a code rate of k/n to generate an encoded bit stream. A method of reading data from the device may include decoding ‘n’ bits of data at a code rate of n/k to generate a decoded bit stream. | 11-07-2013 |
20150023108 | NONVOLATILE MEMORY DEVICE AND RELATED PROGRAMMING METHOD - A nonvolatile memory device comprises a memory cell array comprising multiple memory cells disposed at intersections of corresponding word lines and bitlines, and multiple page buffers connected to the bitlines, respectively, and performing consecutive verify read operations on selected memory cells programmed in first to N-th logic states (N>2), wherein, in the consecutive verify read operations, the bitlines are placed in a precharged state by precharging them to a first level during a verification period of memory cells programmed in the first logic state, are maintained in the precharged state during verification periods of memory cells programmed in the second to (N−1)-th logic states, and are discharged after a verification period of memory cells programmed in the N-th logic state. | 01-22-2015 |
20150063030 | METHOD OF TESTING NON-VOLATILE MEMORY DEVICE AND METHOD OF MANAGING NON-VOLATILE MEMORY DEVICE - A method of testing a non-volatile memory device and a method of managing the non-volatile memory device are provided. The method of testing the non-volatile memory device includes calculating first and second values based on program loop frequencies corresponding to word lines of a memory area. A characteristic value of the memory area may be calculated based on the first and second values, and may be compared to a reference value to determine whether the memory area is defective. | 03-05-2015 |