| Patent application number | Description | Published |
|---|
| 20090169111 | SYSTEM AND METHOD FOR FINDING EDGE POINTS OF AN OBJECT - A method for finding edge points of an object is disclosed. The method includes receiving an electronic image of an object, selecting one or more edge points in the image of the object, creating an image template for each edge point in the object image. The method further includes receiving a command to measure a second object of the same kind as the object and obtaining a measured object image, reading the image templates for the same kind of object from the storage device, and finding a matched sub-image to each image template from the measured object image according to an image matching algorithm, obtaining a central point of each matched sub-image and displaying coordinates of the central point of the matched sub-image. | 07-02-2009 |
| 20100053191 | SYSTEM AND METHOD FOR COMPUTING AND DISPLAYING A ROUNDNESS ERROR OF AN OBJECT - A method and system for computing and displaying a roundness error of an object specifies different colors that respectively represents an error range of points. The method and system receives a point cloud of the object and fits a circle based on the point cloud. The method and system computes an error of each point in the point cloud by computing a distance between the each point and the circle, colorizes the points in the point cloud according to the errors and the specified colors, and generates and outputting a graphic roundness error analysis report. | 03-04-2010 |
| 20100096539 | CALIBRATION PLATE AND CALIBRATION METHOD - A calibration plate is configured for revising an image capture apparatus of a vision measuring system. The vision measuring system includes a worktable which is configured for supporting the calibration plate. The calibration plate includes a quadrate portion. A calibration area and a zero marker are formed on the quadrate portion. The calibration area includes a plurality of regions having the same shape. | 04-22-2010 |
| 20100165086 | LIGHT SOURCE FOR VISION MEASURING INSTRUMENT AND POSITIONING SYSTEM USING THE SAME - A light source is configured to be mounted to a vision measuring instrument that includes a primary image capture unit capturing an image of an object to be measured, and an auxiliary image capture unit providing a means to aim the primary image capture unit at a determined position. The light source includes a main body defining a through hole for receiving the primary image capture unit, and a mounting hole for readily mounting an auxiliary image capture unit. A luminescent surface is formed on an inner wall bounding the through hole of the main body. A number of light-emitting diodes (LEDs) is disposed on the luminescent surface. | 07-01-2010 |
| 20100182487 | SYSTEM AND METHOD FOR AUTOMATICALLY FOCUSING AN OPTICAL LENS OF AN IMAGE MEASURING MACHINE - A system and method for automatically focusing an optical lens controls the light generated by a light-emitting device of an image measuring machine to penetrate a glass sheet, so as to project a picture of the glass sheet onto an object. The system and method further moves an optical lens along a Z-axis of the image measuring machine to capture one or more digital images of the object, and computes a definition value of each captured digital image. Furthermore, the system and method obtains a focus position corresponding to the highest definition value of the captured digital image. | 07-22-2010 |
| 20100238406 | FOCUS ASSISTING DEVICE - A focus assisting device is configured to assist a vision measuring system to focus on an object with smooth low-contrast surfaces. The focus assisting device includes a plurality of transparent portion and a plurality of nontransparent portion. | 09-23-2010 |
| 20110069383 | MEASUREMENT APPARATUS - A measurement apparatus includes a lamp mount including a first mount and a second mount. The first mount has a first cavity to mount an observation module. The second mount has a second cavity to mount an image capture module. The measurement apparatus further includes a plurality of light modules mounted on an undersurface of the lamp mount. The second mount is disposed with an included angle relative to a first axis of the first cavity so that a second axis of the second cavity and the first axis converge on a point. The undersurface of the lamp mount is concave so that light from the light modules tilts toward the first axis, and the light and the first axis also converge on the point. | 03-24-2011 |
| 20110128427 | FOCUS APPARATUS OF IMAGE MEASURING SYSTEM - A focus apparatus comprises a first illuminator for emitting light onto an object, an optical apparatus, an image capture apparatus for receiving an image of the object through the optical apparatus, and converting the image into electronic signals, a spectroscope, a coaxial light apparatus and a patterned light apparatus. The coaxial light apparatus and the patterned light apparatus are perpendicularly mounted to a spectroscope. The coaxial light apparatus is perpendicular to the patterned light apparatus. The spectroscope refracts patterned light from the patterned light apparatus and coaxial light from the coaxial light apparatus to the optical apparatus. | 06-02-2011 |
| 20110149546 | FOCUS APPARATUS OF IMAGE MEASURING SYSTEM - A focus apparatus comprises a light apparatus emits the light onto an object, an optical apparatus, an image capture apparatus for receiving an image of the object through the optical apparatus, and converting the image into electronic signals, and a adapter. The adapter connects the light apparatus and the optical apparatus. The light apparatus transfers thermal energy generated by the light apparatus to the air of the surrounding environment, and scatters the light to make the light propagate uniformly. | 06-23-2011 |
| 20110161876 | COMPUTER AND METHOD FOR GENERATIING EDGE DETECTION COMMANDS OF OBJECTS - A computer and a method for generation commands include loading a data exchange format (DXF) image, and selecting a measurement tool and selecting a DXF feature of the DXF image. The generation commands method further includes generating an edge detection command of the selected DXF feature according to the measurement tool when the size of the selected DXF feature is not larger than the size of an image area. And an edge detection command corresponding to each of the reselected measurement tools is generated when the size of the selected DXF feature is larger than the size of the image area. | 06-30-2011 |
