Dietze
Kai P. Dietze, San Francisco, CA US
Patent application number | Description | Published |
---|---|---|
20140250309 | PREDICTIVE SELF CALIBRATED POWER CONTROL - A method of controlling power in a circuit includes characterizing a power behavior of the circuit, from a circuit input to a circuit output during a manufacturing process of the circuit, wherein the characterizing may be at one or more of a wafer, chip or circuit board level, predicting the power behavior of the circuit on the basis of the characterizing, and controlling the power of signals transmitted from the output of the circuit on the basis of the predicting. An apparatus for controlling signal power in a circuit includes a transmitter to transmit an output signal, a receiver coupled to the transmitter by a loopback path, and a digital signal processor coupled to the transmitter and receiver, wherein the signal processor predicts and adjusts a power level of the output signal from the transmitter based on characterizing a loopback signal and known response characteristics of the circuit. | 09-04-2014 |
Robert H. Dietze, Brighton, MI US
Patent application number | Description | Published |
---|---|---|
20110258845 | Method of Assembling Electric Storage Battery Packs - A method of assembling a battery assembly includes forming battery packs, each pack including battery cells and cooling passages extending along a length of the pack, connecting terminals of each pack to a dc source and charging each pack to a desired state of charge, installing battery packs on a tray located on an automatically guided cart, using the cart to carry the battery assembly to locations where method steps are performed including performing testing for fluid leaks in a cooling circuit comprising interconnected passages of each pack on the tray and installing electric circuits in the assembly. | 10-27-2011 |
Uwe Dietze, Austin, TX US
Patent application number | Description | Published |
---|---|---|
20120211024 | METHOD AND APPARATUS FOR TREATING SUBSTRATES - The application describes several methods and an apparatus for treatment of at least partial areas of a substrate. In said methods, at least one liquid is applied to at least one partial area of the substrate and electromagnetic radiation is introduced into this liquid, in order to achieve a desired effect in accordance with the respective method. In one method, radicals are generated in the liquid by means of UV radiation prior to application of the liquid, wherein generation of the radicals occurs directly before applying the liquid to the substrate, such that at least a portion of the radicals reaches the substrate. In one method, in which ions are removed from at least partial areas of the surface of a substrate and near surface layers of said substrate, a liquid, which is heated above ambient temperature is applied to the substrate, in order to form a liquid film on at least a partial area of said substrate, wherein electromagnetic radiation is introduced into said liquid film such that at least a portion of the radiation reaches the substrate surface. In another method for changing the surface characteristics of a substrate having an at least partially hydrophobic substrate surface such that at least a portion of said hydrophobic surface gets a hydrophilic surface characteristic, a liquid is applied to at least the partial area of the surface of the substrate, whose surface characteristic is to be changed, and UV radiation of a predetermined range of wavelength is guided through said liquid onto at least the partial area of the surface of said substrate, whose surface characteristic is to be changed. The methods may be performed in a common apparatus in any desired order in series and/or in parallel. | 08-23-2012 |
Wolfgang Dietze, Maienfeld CH
Patent application number | Description | Published |
---|---|---|
20140230576 | Sub-Millinewton Capacitive Mems Force Sensor for Mechanical Testing on a Microscope - Most mechanical tests (compression testing, tensile testing, flexure testing, shear testing) of samples in the sub-mm size scale are performed under the observation with an optical microscope or a scanning electron microscope. However, the following problems exist with prior art force sensors as e.g they cannot be used for in-plane mechanical testing (a- and b-direction) of a sample; they cannot be used for vertical testing (c-direction) of a sample. In order to overcome the before mentioned drawbacks the invention comprises the following basic working principle: A force is applied to the probe ( | 08-21-2014 |