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Diepenbrock
James Diepenbrock, Beaverton, OR US
| Patent application number | Description | Published |
|---|---|---|
| 20120005921 | CUSHIONING SOLE FOR SHOE - A sole in accordance with the present invention may include a sole for attachment to an outside of a shoe. Moreover, a sole of the present invention may include a sole for insertion within an inner cavity formed by an upper of a shoe. In exemplary aspects the sole includes a base and a plurality of protrusions projecting from the base and integrally constructed with the base. Protrusions may include a side extending at an angle from the base. In addition, protrusions may include a side extending near perpendicular from the base. A plurality of protrusions may be arranged at ball portions of the sole. In addition, a plurality of protrusions may be arranged at a heel portion of the sole. | 01-12-2012 |
James E. Diepenbrock, Aloha, OR US
| Patent application number | Description | Published |
|---|---|---|
| 20110277352 | DEVICE FOR DISPLAYING IMAGE ON APPAREL - An image displaying device includes a background layer that is substantially opaque. The device also includes a display layer that is semi-transparent. The display layer includes an inner surface facing the background layer, and the inner surface is substantially smooth. The display layer further includes an outer surface facing away from the background layer, and the outer surface includes a plurality of raised areas and a plurality of recessed areas. The display layer has increased light transmissivity through the recessed areas and decreased light transmissivity through the raised areas such that a contrast of light transmissivity between the raised and recessed areas generates an image. | 11-17-2011 |
Joseph Curtis Diepenbrock, Raleigh, NC US
| Patent application number | Description | Published |
|---|---|---|
| 20100036632 | SYSTEM AND METHOD FOR EVALUATING HIGH FREQUENCY TIME DOMAIN IN EMBEDDED DEVICE PROBING - A system and associated method for evaluating a high-frequency signal at a point of interest on a signal path from a remote signal at a remote pickup point on the signal path. The point of interest is located on a device under test that is coupled to test equipment via the signal path. The high-frequency signal at the point of interest is calculated from the remote signal at the remote pickup point with an inverse transfer function that eliminates degradation effects on the high-frequency signal that is transferred through the signal path. The inverse transfer function may be calculated from measurements acquired in a test signal transfer through a reference path that simulates electrical properties of the signal path, or configured to a predetermined function if electrical properties of the signal path are known. | 02-11-2010 |
| 20110238349 | EVALUATING HIGH FREQUENCY TIME DOMAIN IN EMBEDDED DEVICE PROBING - A system and associated method for evaluating a high-frequency signal at a point of interest on a signal path from a remote signal at a remote pickup point on the signal path. The point of interest is located on a device under test that is coupled to test equipment via the signal path. The high-frequency signal at the point of interest is calculated from the remote signal at the remote pickup point with an inverse transfer function that eliminates degradation effects on the high-frequency signal that is transferred through the signal path. The inverse transfer function may be calculated from measurements acquired in a test signal transfer through a reference path that simulates electrical properties of the signal path, or configured to a predetermined function if electrical properties of the signal path are known. | 09-29-2011 |