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Deai

Hiroyuki Deai, Yamaguchi JP

Patent application numberDescriptionPublished
20080268613Semiconductor Substrate And Method For Production Thereof - Hetero-semiconductor structures possessing an SOI structure containing a silicon-germanium mixed crystal are produced at a low cost and high productivity. The semiconductor substrates comprise a first layer formed of silicon having germanium added thereto, a second layer formed of an oxide and adjoined to the first layer, and a third layer derived from the same source as the first layer, but having an enriched content of germanium as a result of thermal oxidation and thinning of the third layer.10-30-2008

Hiroyuki Deai, Hikari JP

Patent application numberDescriptionPublished
20120032229Silicon Wafer And Production Method Thereof - A silicon wafer contains: a silicon substrate; a first epitaxial layer on the silicon wafer, wherein the absolute value of the difference between donor and acceptor concentrations is ≧1×1002-09-2012

Takayuki Deai, Osaka JP

Patent application numberDescriptionPublished
20100177608OPTICAL DISC AND METHOD FOR CONTROLLING THE SAME - In an optical disc having a multilayer structure in which recording layers are bonded to each other, the number of times additional writing can be performed is increased. A method for controlling an optical disc device according to the present invention comprises steps of calculating a displacement amount generated when the recording layers are bonded to each other; and identifying the size of a recordable area in a non-usable area predetermined on the recording layer based on the displacement amount.07-15-2010
20100329095METHOD FOR DETERMINING RECORDING CONDITION OR REPRODUCING CONDITION, INTEGRATED CIRCUIT, AND OPTICAL DISK DEVICE - A process which is performed by a recording/reproducing device configured to irradiate an optical recording medium including a plurality of recording layers with laser light to record and reproduce data, and is for determining at least one of a recording condition at the time of recording user data on any one recording object recording layer of the plurality of recording layers, or a reproducing condition at the time of reproducing the data from the recording object recording layer, where record management data indicating a recorded area on the recording layers is recorded on the optical recording medium. The process includes: acquiring a remaining capacity of a test recording area for each of the recording layers based on the record management data; and determining a recording layer on which test recording is intended to be made based on the remaining capacities of the test recording area acquired for the recording layers.12-30-2010