Inventors list |
Assignees list |
Classification tree browser |
Top 100 Inventors |
Top 100 Assignees |
Davidi
Michael Perez Davidi, Savion IL
| Patent application number | Description | Published |
|---|---|---|
| 20080226728 | Antimicrobial Nanoparticulate Additives Forming Non-Leachable Sustained Antimicrobial Polymeric Compositions - The present invention provides a particle comprising at least one aliphatic polymer having anti-microbially active quaternary ammonium groups chemically bound thereto. The particle of the invention may be used to inhibit populations of microorganisms and biofilms. Also provided are methods for the preparation of such particles and uses thereof for the inhibition of microorganisms. | 09-18-2008 |
Oren Davidi, Ramat Gan IL
| Patent application number | Description | Published |
|---|---|---|
| 20090201123 | SENSOR NETWORK FOR LIQUID DRAINAGE SYSTEMS - A manhole monitoring unit includes a housing mountable to walls of a closed manhole, without breaching an insulating layer on the walls, a data processor to receive data from monitoring sensors in the manhole, and a communication unit at least for transmitting wirelessly the data to an external network unit located above ground. A manhole monitoring and control unit includes a housing mountable to walls of a closed sewage manhole, without breaching the walls, a data processor to receive data from monitoring sensors in the manhole and to control actuators according to high level network commands, and a communication unit for transmitting wirelessly the data to an external network unit located above ground and receiving commands. | 08-13-2009 |
Yaakov Davidi, Nof Ayelon IL
| Patent application number | Description | Published |
|---|---|---|
| 20100309308 | INSPECTION OF A SUBSTRATE USING MULTIPLE CAMERAS - Apparatus for inspection includes an imaging assembly, including a plurality of cameras, which are mounted in different, respective locations in the imaging assembly and are configured to capture respective images of a sample. A motion assembly is configured to move at least one of the imaging assembly and the sample so as to cause the imaging assembly to scan the sample with a scan accuracy that is limited by a predetermined position tolerance. An image processor is coupled to receive and process the images captured by the cameras so as to locate a defect in the sample with a position accuracy that is finer than the position tolerance. | 12-09-2010 |