| Patent application number | Description | Published |
|---|
| 20080272820 | Circuit to Reduce Transient Current Swings During Mode Transitions of High Frequency/High Power Chips - A method, an apparatus, and a computer program are provided to reduce transient current swings during mode transitions. Traditionally, transient supply voltage fluctuations on a chip account for a large portion of the power supply. The number of series inductances and resistances are typically minimized, while adding large decoupling capacitances between the supply voltage and ground. However, situations may arise where reduction of series inductances and resistances cannot be accomplished. Therefore, to assist in controlling the transient current swings, reduction of clocking frequencies are performed in a controlled manner. | 11-06-2008 |
| 20080301503 | HIGH FREQUENCY DIVIDER STATE CORRECTION CIRCUIT - The present invention provides for a self-correcting state circuit. A first flip flop is configured to receive a clock input and a first data input, and to generate a first output in response to the clock input and the first data input. A second flip flop is coupled to the first flip flop and configured to receive the clock input and to receive the first output as a second data input, and to generate a second output in response to the clock input and the first output. A first correction circuit is coupled to the second flip flop and configured to generate a corrected output. A third flip flop is coupled to the first correction circuit and configured to receive the clock input and to receive the corrected output as a third data input, and to generate a third output in response to the clock input and the third data input. | 12-04-2008 |
| 20090108889 | Precision Integrated Phase Lock Loop Circuit Loop Filter - A loop filter in a phase lock loop circuit comprising a reference precision resistor, a first FET and a second FET, wherein the gate of the first FET is tied to the gate of the second FET, and a filter capacitor connected to the first FET for producing a capacitor voltage. The capacitor voltage is applied to the source of the first FET, the source of the second FET, and to the bottom of the reference precision resistor acting as a virtual ground. The capacitor voltage generated by the filter capacitor sets the bias point of the second FET such that the second FET comprises characteristics of an integrated precision resistor. A predetermined voltage generated by the second FET is applied to the gate of the first FET to set the bias point of the first FET such that the first FET comprises characteristics of an integrated precision resistor. | 04-30-2009 |
| 20090108922 | Method and System for Managing Voltage Swings Across Field Effect Transistors - A circuit for managing voltage swings across FETs comprising a reference precision resistor, a first FET and a second FET, wherein a gate of the first FET is tied to a gate of the second FET, wherein a drain to source resistance of the second FET is substantially equal to or is a multiple of a resistance of the reference precision resistor, and wherein a gate voltage of the second FET is applied to a gate of the first FET to set a bias point of the first FET, and a third FET cascoded to the first FET, wherein a source of the first FET is coupled to the drain of the third FET to extend a voltage range in which respective gate voltages of the first FET and the third FET maintain a linear relationship with respective drain to source voltages of the first FET and the third FET. | 04-30-2009 |
| 20090108923 | Structure for Precision Integrated Phase Lock Loop Circuit Loop Filter - A design structure for a loop filter in a phase lock loop circuit comprising a reference precision resistor, a first and second FET, wherein the gate of the first FET is tied to the gate of the second FET, and a filter capacitor connected to the first FET for producing a capacitor voltage. The capacitor voltage is applied to the source of the first FET, the source of the second FET, and the bottom of the reference precision resistor acting as a virtual ground. The capacitor voltage generated by the filter capacitor sets the bias point of the second FET such that the second FET comprises characteristics of an integrated precision resistor. A predetermined voltage generated by the second FET is applied to the gate of the first FET to set the bias point of the first FET such that the first FET comprises characteristics of an integrated precision resistor. | 04-30-2009 |
| 20090108924 | Structure for Managing Voltage Swings Across Field Effect Transistors - A design structure of a circuit for managing voltage swings across FETs comprising a reference precision resistor, a first and second FET, wherein a gate of the first FET is tied to a gate of the second FET, wherein a drain to source resistance of the second FET is substantially equal to or is a multiple of a resistance of the reference precision resistor, and wherein a gate voltage of the second FET is applied to a gate of the first FET to set a bias point of the first FET, and a third FET cascoded to the first FET, wherein a source of the first FET is coupled to the drain of the third FET to extend a voltage range in which respective gate voltages of the first and third FETs maintain a linear relationship with respective drain to source voltages of the first and third FETs. | 04-30-2009 |
| 20090112555 | Design Structure For A Duty Cycle Measurement Apparatus That Operates In A Calibration Mode And A Test Mode - A design structure for an on-chip duty cycle measurement system may be embodied in a machine readable medium for designing, manufacturing or testing an integrated circuit. The design structure may embody an apparatus that measures the duty cycle of a reference clock signal that a clock circuit supplies to a duty cycle measurement (DCM) circuit. The design structure may specify that the DCM circuit includes a capacitor driven by a charge pump and that a reference clock signal drives the charge pump. The design structure may specify that the clock circuit varies the duty cycle of the reference clock signal among a number of known duty cycle values. The design structure may specify that the DCM circuit stores resultant capacitor voltage values corresponding to each of the known duty cycle values in a data store. The DCM circuit may apply a test clock signal having an unknown duty cycle to the capacitor via the charge pump, thus charging the capacitor to a new voltage value that corresponds to the duty cycle of the test clock signal. The design structure may specify that control software accesses the data store to determine the duty cycle to which the test clock signal corresponds. | 04-30-2009 |
| 20090174468 | Thermal Sensing Circuit Using Bandgap Voltage Reference Generators Without Trimming Circuitry - Methods, systems and thermal sensing apparatus are provided that use bandgap voltage reference generators that do not use trimming circuitry. Further, circuits, systems, and methods in accordance with the present invention are provided that do not use large amounts of chip real estate and do not require a separate thermal sensing element. | 07-09-2009 |
| 20090322311 | Method and Apparatus for On-Chip Testing of High Speed Frequency Dividers - Embodiments of the disclosure provide systems and methods for using a PLL and a high frequency generator outside the loop to obtain the fmax of the divider. The divider in the PLL loop is fed by a VCO and its operation range is characterized by measuring the PLL lock range. An identical copy of the same divider is used outside the PLL loop and it is fed by a higher frequency clock. The high frequency clock is generated by the multiple phase of the VCO. By characterizing the outputs from both dividers, the fmax of the divider is obtained. | 12-31-2009 |
| 20090326862 | Clock Duty Cycle Measurement with Charge Pump Without Using Reference Clock Calibration - Embodiments of the disclosure provide systems and methods for clock duty cycle measurement. A clock signal and a complement of the clock signal are provided to a charge pump during first and second predetermined timing windows. A charge pump is operable to generate first and second output voltages in response to the clock signal and the complement of the clock signal during the first and second timing windows, respectively. In addition a predetermined positive voltage and a ground voltage are applied to the charge pump during predetermined third and fourth timing windows, respectively. The charge pump is operable to generate third and fourth output voltage signals corresponding to the predetermined positive and ground voltages during the third and fourth timing windows, respectively. The first, second, third and fourth voltages are then used to calculate the duty cycle of the clock. | 12-31-2009 |
| 20100164580 | HIGH SPEED CLOCK SIGNAL DUTY CYCLE ADJUSTMENT - A clock signal duty cycle adjustment circuit includes a duty cycle correction circuit that receives a clock input signal that may need duty cycle correction. The duty cycle correction circuit may derive first and second differential clock signals from the clock input signal. The first and second differential clock signals may exhibit respective voltage offsets. The duty cycle correction circuit includes a voltage offset shift circuit that may shift the voltage offset that one of the first and second differential clock signals exhibits to adjust the effective duty cycle of a clock output signal. The duty cycle adjustment circuit derives the clock output signal from the voltage offset adjusted first and second differential clock signals in response to a duty cycle error signal. | 07-01-2010 |
