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David White, San Jose US

David White, San Jose, CA US

Patent application numberDescriptionPublished
20080216027Electronic Design for Integrated Circuits Based on Process Related Variations - An electronic design is generated for an integrated circuit that is to be fabricated in accordance with the electronic design by a process that will impart topographically induced feature dimension variations to the integrated circuit. The generating includes adjusting the electronic design based on predictions of topographical and topographical-related feature dimension variations by a pattern-dependent model. An RC extraction tool is used in conjunction with the generating and adjusting of the electronic design. The process includes a fabrication process that will impart topographical variation to the integrated circuit and a lithography or etch process. Placement attributes for elements of the integrated circuit are determined.09-04-2008
20090031271ROBUST DESIGN USING MANUFACTURABILITY MODELS - The present invention allows for a robust design using manufacturability models. A method, system and/or computer usable medium may be provided in an integrated circuit design to track sensitivity to a variation of process from wafer to wafer and/or fab to fab in order to assist the designers to anticipate the variations to improve the final yield of the products.01-29-2009
20090199139METHOD, SYSTEM, AND COMPUTER PROGRAM PRODUCT FOR IMPROVED ELECTRICAL ANALYSIS - An improved method, system, user interface, and computer program product is described for using a memory and learning component to improve capacitance and resistance estimates based on the types of layouts and devices being evaluated. According to some approaches, a learning component is implemented that uses recommended test sets from the evaluation component to automatically test the extraction estimates against the field solver. Variability models from manufacturing or electrical analysis may also be used to select a series of objects (unique conductor geometries) that make up a conduction path or net or specific conductor geometries for evaluation and additional learning improvement.08-06-2009
20110046767METHOD, SYSTEM, AND COMPUTER PROGRAM PRODUCT FOR PREPARING MULTIPLE LAYERS OF SEMICONDUCTOR SUBSTRATES FOR ELECTRONIC DESIGNS - Disclosed is an improved method, system, and computer program product for preparing multiple levels of semiconductor substrates for three-dimensional IC integration. Some embodiments utilize the process and design models to check and fabricate the insulating dielectric layer (IDL) separating the first and the second film stacks on separate substrates and then prepare the surface of the IDL to receive an additional layer of semiconductor substrate for further fabrication of the chips. Yet some other embodiments further employ the design and process models to ensure the IDL and the semiconductor substrate are sufficiently flat, or are otherwise satisfactory, so the three-dimensional integrated circuits meet the reliability, manufacturability, yield, or performance requirements. Yet some other embodiments further employ design and process models to place the vias connecting the multiple film stacks.02-24-2011
20110093826METHOD AND SYSTEM FOR MODEL-BASED ROUTING OF AN INTEGRATED CIRCUIT - Disclosed is a method, system, and computer program product for implementing model-based floorplanning, layout, placement, and routing. Models are used to guide the placement and routing of polygons on the IC layout based upon predictions of manufacturing variations.04-21-2011
20120022846METHODS, SYSTEMS, AND ARTICLES OF MANUFACTURE FOR IMPLEMENTING ELECTRONIC CIRCUIT DESIGNS WITH ELECTRO-MIGRATION AWARENESS - Disclosed are methods, systems, and articles of manufacture for implementing electronic circuit designs with electro-migration awareness. Some embodiments perform schematic level simulation(s) to determine electrical characteristics, identifies physical parasitics of a layout component, determines the electrical or physical characteristics associated to electro-migration analysis on the component, and determines whether the component meets EM related constraint(s) while implementing the physical design of the electronic circuit in some embodiments. Some embodiments further determine adjustment(s) to the component or related data where the EM related constraints are not met and/or and present the adjustment(s) in the form of hints. Various data and information, such as currents in various forms or voltages, are passed between various schematic level tools and physical level tools.01-26-2012
20120023465METHODS, SYSTEMS, AND ARTICLES OF MANUFACTURE FOR IMPLEMENTING ELECTRONIC CIRCUIT DESIGNS WITH SIMULATION AWARENESS - Disclosed are methods, systems, and articles of manufacture for implementing electronic designs with simulation awareness. A schematic is identified or created and simulated at the schematic level to characterize the functional behavior of the circuit or to ensure the circuit design meets the required design specifications. Physical data of a component of the design is identified, created, or updated, and the electrical parasitic associated with physical data is characterized. One or more electrical characteristics associated with the parasitic is further characterized and mapped to the simulator to re-simulate the circuit design to analyze the impact of parasitics. Some embodiments re-run the same simulation process incrementally in an interactive manner by accepting incremental design or parameter changes from the design environment.01-26-2012
20120023467METHODS, SYSTEMS, AND ARTICLES OF MANUFACTURE FOR IMPLEMENTING ELECTRONIC CIRCUIT DESIGNS WITH ELECTRICAL AWARENESS - Disclosed are a method, system, and computer program product for implementing electronic circuit designs with electrical awareness. The method or the system updates the schematic level tool(s) and physical design tool(s) with electrical parasitic data or electrical characteristic data associated with electrical parasitics so both schematic and physical design tools are aware of the electrical parasitic or characteristic data in performing their functions such as extraction based simulations. The methods or systems are also aware of EM or IR-drop constraint(s) while implementing or creating a partial layout less than a complete layout. The method or the system also provides a user interface for a design tool to provide in situ, customizable, real-time information for implementing electronic circuit designs with electrical awareness. The methods or systems also support constraint verification for electronic circuit design implementation with electrical awareness.01-26-2012
20120023468METHODS, SYSTEMS, AND ARTICLES OF MANUFACTURE FOR CONSTRAINT VERIFICATION FOR IMPLEMENTING ELECTRONIC CIRCUIT DESIGNS WITH ELECTRICAL AWARENESS - Disclosed are methods, systems, and articles of manufacture for constraint verification for implementing electronic circuit designs with electrical awareness. Some embodiments identify or set parasitic constraint(s) and compare the electrical parasitic(s) with corresponding parasitic constraint(s) to determine whether the parasitic constraints are met. Some embodiments first identify, determine, or update the physical data of a component of a partial layout and characterize the electrical parasitics associated with the physical data of the component. Some embodiments identify or determine some schematic level performance constraints and estimate parasitic constraints based on schematic simulation results and the performance constraints; the estimated parasitic constraints are then compared with the corresponding electrical parasitics to determine whether the constraints are satisfied. Some embodiments further map schematic level parasitic constraints to a physical design representation and then compares the mapped parasitic constraints with corresponding electrical constraints to determine whether the mapped constraints are met.01-26-2012
20120023471METHOD, APPARATUS, AND ARTICLE OF MANUFACTURE FOR PROVIDING IN SITU, CUSTOMIZABLE INFORMATION IN DESIGNING ELECTRONIC CIRCUITS WITH ELECTRICAL AWARENESS - Disclosed are a method, system, and computer program product for providing customizable information in designing electronic circuits with electrical awareness. The method or the system displays a portion of a physical design of an electronic circuit in a first display area. The method or the system receives or identifies a user's or a system's manipulation of the portion of the physical design of the electronic circuit. The method or the system then determines and displays an in situ response to the manipulation in the first display area. The method or the system may further display, in the first display area or in another display area, result(s) relating to the physical data of a component, electrical parasitic(s) associated with the physical data, electrical characteristic(s) associated with the physical data or the electrical characteristic(s), or other element(s) of the physical design that is impacted by the manipulation.01-26-2012
20120023472METHOD, APPARATUS, AND ARTICLE OF MANUFACTURE FOR PROVIDING IN SITU, CUSTOMIZABLE INFORMATION IN DESIGNING ELECTRONIC CIRCUITS WITH ELECTRICAL AWARENESS - Disclosed are a method, system, and computer program product for providing customizable information in designing electronic circuits with electrical awareness. The method or the system displays a portion of a physical design of an electronic circuit in a first display area. The method or the system receives or identifies a user's or a system's manipulation of the portion of the physical design of the electronic circuit. The method or the system then determines and displays an in situ response to the manipulation in the first display area. The method or the system may further display, in the first display area or in another display area, result(s) relating to the physical data of a component, electrical parasitic(s) associated with the physical data, electrical characteristic(s) associated with the physical data or the electrical characteristic(s), or other element(s) of the physical design that is impacted by the manipulation.01-26-2012

Patent applications by David White, San Jose, CA US