Patent application number | Description | Published |
20120206180 | LEVEL-UP SHIFTER CIRCUIT - A level-up shifter circuit is suitable for high speed and low power applications. The circuit dissipates almost no static power, or leakage current, compared to conventional designs and can preserve the signal's duty cycle even at high data rates. This circuit can be used with a wide range of power supplies while maintaining operational integrity. | 08-16-2012 |
20120206181 | MULTI-FUNCTION DELAY LOCKED LOOP - A delay circuit provides a quadrature-delayed strobe, a tightly controlled quadrature DLL and write/read leveling delay lines by using the same physical delay line pair. By multiplexing different usage models, the need for multiple delay lines is significantly reduced to only two delay lines per byte. As a result, the delay circuit provides substantial saving in terms of layout area and power. | 08-16-2012 |
20120210179 | MEMORY INTERFACE WITH SELECTABLE EVALUATION MODES - A memory interface enables AC characterization under test conditions without requiring the use of automated test equipment (ATE) and functional patterns. The memory controller may be configured to generate output patterns through the test interface and create a loopback path for input specification testing using an external stressed-eye random number generator and checker. As a result, the memory interface may be evaluated for electrical and timing specifications under a relatively simple test setup and test procedure through the test interface (JTAG), as opposed to a complex processor program that sets up a similar memory access pattern on Automated Test Equipment (ATE). | 08-16-2012 |
20140084985 | LEVEL-UP SHIFTER CIRCUIT - A level-up shifter circuit is suitable for high speed and low power applications. The circuit dissipates almost no static power, or leakage current, compared to conventional designs and can preserve the signal's duty cycle even at high data rates. This circuit can be used with a wide range of power supplies while maintaining operational integrity. | 03-27-2014 |
20150088437 | Memory Interface With Integrated Tester - In an embodiment, a memory interface includes integrated circuitry to verify the integrity of the memory interface. The circuitry propagates a test pattern through different paths of the memory interface, and checks the result against a reference value to determine whether the components of the paths are operating within an acceptable tolerance. The memory interface can also communicate with ATE to initiate such tests and return the results to the ATE. | 03-26-2015 |
20150091631 | Method and Apparatus for Reference Voltage Calibration in a Single-Ended Receiver - According to at least one example embodiment, a method and corresponding system, or circuit, for calibrating a reference voltage of a single-ended receiver, include applying a clock signal and a reference voltage signal as inputs to the differential amplifier of the single-ended receiver. The differential amplifier provides an output signal, the output signal is processed, and an indication of a duty cycle associated with an output signal of the amplifier is evaluated. Based on the evaluated indication of the duty cycle, a control logic module, or circuit, adjusts a level of the reference voltage signal. The process of evaluating the indication of the duty cycle and adjusting the reference voltage level is repeated for a number of iterations. | 04-02-2015 |
20150092510 | Method and Apparatus for Amplifier Offset Calibration - According to at least one example embodiment, a method and corresponding system for calibrating an amplifier offset include applying an input value to both input leads of an amplifier. The amplifier includes one or more digital-to-analog converters (DACs) used to calibrate an offset of the amplifier. A digital value, provided as input to the DAC, is updated over a number of iterations, by a control logic coupled to the amplifier, based on an output of the amplifier. A final value of the digital value being updated, e.g., associated with the last iteration, is employed as input to the DAC of the one or more DACs in the amplifier for calibrating the offset of the amplifier during a data reception phase. | 04-02-2015 |
20150092889 | Method and Apparatus for Calibrating an Input Interface - According to at least one example embodiment a two phase calibration approach is employed for calibrating an input/output interface having multiple single-ended receivers. During a first phase, amplifier offset calibration is applied to each of the multiple single-ended receivers. During a second phase, reference voltage calibration is applied to a single-ended receiver of the multiple single-ended receivers to determine a calibration reference voltage value. The calibration reference voltage value is then employed in each of the multiple single-ended receivers during an active phase of the input/output interface. | 04-02-2015 |