Patent application number | Description | Published |
20080307173 | Efficient Encoding for Detecting Load Dependency on Store with Misalignment - In one embodiment, an apparatus comprises a queue comprising a plurality of entries and a control unit coupled to the queue. The control unit is configured to allocate a first queue entry to a store memory operation, and is configured to write a first even offset, a first even mask, a first odd offset, and a first odd mask corresponding to the store memory operation to the first entry. A group of contiguous memory locations are logically divided into alternately-addressed even and odd byte ranges. A given store memory operation writes at most one even byte range and one adjacent odd byte range. The first even offset identifies a first even byte range that is potentially written by the store memory operation, and the first odd offset identifies a first odd byte range that is potentially written by the store memory operation. The first even mask identifies bytes within the first even byte range that are written by the store memory operation, and wherein the first odd mask identifies bytes within the first odd byte range that are written by the store memory operation. | 12-11-2008 |
20090080268 | Integrated Circuit with Separate Supply Voltage for Memory That is Different from Logic Circuit Supply Voltage - In one embodiment, an integrated circuit comprises at least one logic circuit supplied by a first supply voltage and at least one memory circuit coupled to the logic circuit and supplied by a second supply voltage. The memory circuit is configured to be read and written responsive to the logic circuit even if the first supply voltage is less than the second supply voltage during use. In another embodiment, a method comprises a logic circuit reading a memory cell, the logic circuit supplied by a first supply voltage; and the memory cell responding to the read using signals that are referenced to the first supply voltage, wherein the memory cell is supplied with a second supply voltage that is greater than the first supply voltage during use. | 03-26-2009 |
20100162262 | Split Scheduler - In an embodiment, a scheduler implements a first dependency array that tracks dependencies on instruction operations (ops) within a distance N of a given op and which are short execution latency ops. Other dependencies are tracked in a second dependency array. The first dependency array may evaluate quickly, to support back-to-back issuance of short execution latency ops and their dependent ops. The second array may evaluate more slowly than the first dependency array. | 06-24-2010 |
20100169619 | Efficient Encoding for Detecting Load Dependency on Store with Misalignment - In one embodiment, an apparatus comprises a queue comprising a plurality of entries and a control unit coupled to the queue. The control unit is configured to allocate a first queue entry to a store memory operation, and is configured to write a first even offset, a first even mask, a first odd offset, and a first odd mask corresponding to the store memory operation to the first entry. A group of contiguous memory locations are logically divided into alternately-addressed even and odd byte ranges. A given store memory operation writes at most one even byte range and one adjacent odd byte range. The first even offset identifies a first even byte range that is potentially written by the store memory operation, and the first odd offset identifies a first odd byte range that is potentially written by the store memory operation. The first even mask identifies bytes within the first even byte range that are written by the store memory operation, and wherein the first odd mask identifies bytes within the first odd byte range that are written by the store memory operation. | 07-01-2010 |
20100238745 | Integrated Circuit with Separate Supply Voltage for Memory That is Different from Logic Circuit Supply Voltage - In one embodiment, an integrated circuit comprises at least one logic circuit supplied by a first supply voltage and at least one memory circuit coupled to the logic circuit and supplied by a second supply voltage. The memory circuit is configured to be read and written responsive to the logic circuit even if the first supply voltage is less than the second supply voltage during use. In another embodiment, a method comprises a logic circuit reading a memory cell, the logic circuit supplied by a first supply voltage; and the memory cell responding to the read using signals that are referenced to the first supply voltage, wherein the memory cell is supplied with a second supply voltage that is greater than the first supply voltage during use. | 09-23-2010 |
20110198941 | Power Switch Ramp Rate Control Using Daisy-Chained Flops - In an embodiment, an integrated circuit may include one or more power managed blocks and a power manager circuit. The power manager circuit may be configured to generate a block enable for each power managed block and a block enable clock. The power managed block may generate local block enables to various power switches in the power managed block, staggering the block enables over two or more block enable clock cycles. In particular, the power managed block may include a set of series-connected flops that receive the block enable from the power manager circuit. The output of each flop may be coupled to a respective set of power switches and may enabled those switches. The change in current flow due to enabling and/or disabling the power managed block may thus be controlled. In an embodiment, the frequency of the block enable clock may be set to a defined value independent of process, voltage, and temperature conditions in the integrated circuit. | 08-18-2011 |
20110234287 | FREQUENCY DETECTION MECHANISM FOR A CLOCK GENERATION CIRCUIT - A frequency detection mechanism for a clock generation unit on an integrated circuit includes a clock generation unit and a detection unit. The clock generation unit may generate an output clock signal at a predetermined frequency that corresponds to a frequency multiple of a reference clock signal provided as an input to the clock generation unit. The detection unit may determine whether the output clock signal is at the predetermined frequency. As such, the detection unit includes a first counter that may generate a first count value based upon the reference clock signal and a second counter that may generate a second count value based upon the output clock signal. The detection unit also includes comparison logic that may perform a plurality of multiplication operations on the first and second count values and generate a final result that indicates whether the output clock signal is at the predetermined frequency. | 09-29-2011 |
20110235442 | Integrated Circuit with Separate Supply Voltage for Memory That is Different from Logic Circuit Supply Voltage - In one embodiment, an integrated circuit includes at least one logic circuit supplied by a first supply voltage and at least one memory circuit coupled to the logic circuit and supplied by a second supply voltage. The memory circuit is configured to be read and written responsive to the logic circuit even if the first supply voltage is less than the second supply voltage during use. In another embodiment, a method includes a logic circuit reading a memory cell, the logic circuit supplied by a first supply voltage; and the memory cell responding to the read using signals that are referenced to the first supply voltage, wherein the memory cell is supplied with a second supply voltage that is greater than the first supply voltage during use. | 09-29-2011 |
20120019301 | FREQUENCY DETECTION MECHANISM FOR A CLOCK GENERATION CIRCUIT - A frequency detection mechanism for a clock generation unit on an integrated circuit includes a clock generation unit and a detection unit. The clock generation unit may generate an output clock signal at a predetermined frequency that corresponds to a frequency multiple of a reference clock signal provided as an input to the clock generation unit. The detection unit may determine whether the output clock signal is at the predetermined frequency. As such, the detection unit includes a first counter that may generate a first count value based upon the reference clock signal and a second counter that may generate a second count value based upon the output clock signal. The detection unit also includes comparison logic that may perform a plurality of multiplication operations on the first and second count values and generate a final result that indicates whether the output clock signal is at the predetermined frequency. | 01-26-2012 |
20120290818 | Split Scheduler - In an embodiment, a scheduler implements a first dependency array that tracks dependencies on instruction operations (ops) within a distance N of a given op and which are short execution latency ops. Other dependencies are tracked in a second dependency array. The first dependency array may evaluate quickly, to support back-to-back issuance of short execution latency ops and their dependent ops. The second array may evaluate more slowly than the first dependency array. | 11-15-2012 |
20120314516 | Performing Stuck-At Testing Using Multiple Isolation Circuits - A memory may include a memory array, a plurality of control circuits, and a plurality of isolation circuits. The plurality of control circuits may be configured to generate control signals for the memory array. For example, the plurality of control circuits may include a plurality of word line driver circuits. The plurality of isolation circuits may be configured to receive the control signals from the plurality of control circuits and a plurality of isolation signals. A first isolation signal may correspond to the plurality of word line driver circuits and at least one second isolation signal may correspond to other ones of the plurality of control circuits. The first isolation signal and the second isolation signal may be independently controlled during memory tests to detect stuck-at faults associated with the plurality of isolation signals. | 12-13-2012 |
20130016575 | Integrated Circuit with Separate Supply Voltage for Memory That is Different from Logic Circuit Supply Voltage - In one embodiment, an integrated circuit includes at least one logic circuit supplied by a first supply voltage and at least one memory circuit coupled to the logic circuit and supplied by a second supply voltage. The memory circuit is configured to be read and written responsive to the logic circuit even if the first supply voltage is less than the second supply voltage during use. In another embodiment, a method includes a logic circuit reading a memory cell, the logic circuit supplied by a first supply voltage; and the memory cell responding to the read using signals that are referenced to the first supply voltage, wherein the memory cell is supplied with a second supply voltage that is greater than the first supply voltage during use. | 01-17-2013 |
20130111191 | PROCESSOR INSTRUCTION ISSUE THROTTLING | 05-02-2013 |
20130182493 | Integrated Circuit With Separate Supply Voltage For Memory That Is Different From Logic Circuit Supply Voltage - In one embodiment, an integrated circuit includes at least one logic circuit supplied by a first supply voltage and at least one memory circuit coupled to the logic circuit and supplied by a second supply voltage. The memory circuit is configured to be read and written responsive to the logic circuit even if the first supply voltage is less than the second supply voltage during use. In another embodiment, a method includes a logic circuit reading a memory cell, the logic circuit supplied by a first supply voltage; and the memory cell responding to the read using signals that are referenced to the first supply voltage, wherein the memory cell is supplied with a second supply voltage that is greater than the first supply voltage during use. | 07-18-2013 |
20140092676 | Integrated Circuit With Separate Supply Voltage For Memory That Is Different From Logic Circuit Supply Voltage - In one embodiment, an integrated circuit includes at least one logic circuit supplied by a first supply voltage and at least one memory circuit coupled to the logic circuit and supplied by a second supply voltage. The memory circuit is configured to be read and written responsive to the logic circuit even if the first supply voltage is less than the second supply voltage during use. In another embodiment, a method includes a logic circuit reading a memory cell, the logic circuit supplied by a first supply voltage; and the memory cell responding to the read using signals that are referenced to the first supply voltage, wherein the memory cell is supplied with a second supply voltage that is greater than the first supply voltage during use. | 04-03-2014 |
20140362639 | Integrated Circuit With Separate Supply Voltage For Memory That Is Different From Logic Circuit Supply Voltage - In one embodiment, an integrated circuit includes at least one logic circuit supplied by a first supply voltage and at least one memory circuit coupled to the logic circuit and supplied by a second supply voltage. The memory circuit is configured to be read and written responsive to the logic circuit even if the first supply voltage is less than the second supply voltage during use. In another embodiment, a method includes a logic circuit reading a memory cell, the logic circuit supplied by a first supply voltage; and the memory cell responding to the read using signals that are referenced to the first supply voltage, wherein the memory cell is supplied with a second supply voltage that is greater than the first supply voltage during use. | 12-11-2014 |
20140380071 | Dynamic Voltage and Frequency Management based on Active Processors - In an embodiment, a system may include multiple processors and an automatic power state controller (APSC) configured to switch the processors between various operating points. The operating points may be described by data programmed into the APSC, and the APSC may include a register that is programmable with a target operating point request identifying a target operating point for the processors from among the described operating points. The data describing the operating points may also include an indication of whether or not the number of processors that may be concurrently active at the operating point is limited. Based on the indication and the number of active processors, the APSC may override the requested operating point with a reduced operating point. In some embodiments, a digital power estimator (DPE) may monitor operation of the processors and may throttle the processors when high power consumption is detected. | 12-25-2014 |