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Cui, JP
Baochun Cui, Kanagawa JP
| Patent application number | Description | Published |
|---|---|---|
| 20090236607 | ELECTRONIC CIRCUIT - An electronic circuit formed on an insulating substrate and having thin-film transistors (TFTs) comprising semiconductor layers. The thickness of the semiconductor layer is less than 1500 Å, e.g., between 100 and 750 Å. A first layer consisting mainly of titanium and nitrogen is formed on the semiconductor layer. A second layer consisting of aluminum is formed on top of the first layer. The first and second layers are patterned into conductive interconnects. The bottom surface of the second layer is substantially totally in intimate contact with the first layer. The interconnects have good contacts with the semiconductor layer. | 09-24-2009 |
| 20110133201 | ELECTRONIC CIRCUIT - An electronic circuit formed on an insulating substrate and having thin-film transistors (TFTs) comprising semiconductor layers. The thickness of the semiconductor layer is less than 1500 Å, e.g., between 100 and 750 Å. A first layer consisting mainly of titanium and nitrogen is formed on the semiconductor layer. A second layer consisting of aluminum is formed on top of the first layer. The first and second layers are patterned into conductive interconnects. The bottom surface of the second layer is substantially totally in intimate contact with the first layer. The interconnects have good contacts with the semiconductor layer. | 06-09-2011 |
Changzhi Cui, Utsunomiya-Shi JP
| Patent application number | Description | Published |
|---|---|---|
| 20120026610 | OPTICAL APPARATUS - The optical apparatus includes a first optical unit and a second optical unit that are movable in an optical axis direction, actuators that respectively move the first and second optical units in the optical axis direction, and a linking mechanism that is configured to link the first and second optical units with each other such that, in a state where the optical axis direction is tilted with respect to a horizontal direction and thereby an obliquely downward force caused by gravity acts on each of the first and second optical units in an obliquely downward direction, one of the first and second optical units works as a counterweight to provide an obliquely upward force acting on the other of the first and second optical units in an obliquely upward direction. | 02-02-2012 |
Chuanyong Cui, Ibaraki JP
| Patent application number | Description | Published |
|---|---|---|
| 20080260570 | Heat-Resistant Superalloy - Disclosed is a novel heat-resistant superalloy for turbine disks having a chemical composition consisting of, in mass %, 19.5-55% of cobalt, 2-25% of chromium, 0.2-7% of aluminum, 3-15% of titanium and the balance of nickel and inevitable impurities. | 10-23-2008 |
| 20110194971 | HEAT-RESISTANT SUPERALLOY - Disclosed is a novel heat-resistant superalloy for turbine disks having a chemical composition consisting of, in mass %, 19.5-55% of cobalt, 2-25% of chromium, 0.2-7% of aluminum, 3-15% of titanium and the balance of nickel and inevitable impurities. | 08-11-2011 |
Hailong Cui, Tokyo JP
| Patent application number | Description | Published |
|---|---|---|
| 20100074405 | Test Method - To provide a method and device for testing the size and conductivity of a foreign material adhered to a substrate for a liquid crystal display device, there is provided a method of testing whether a foreign material including a metal element is adhered to a substrate for a liquid crystal display device, the method including a first test step of detecting the size and position of the foreign material adhered to the substrate and a second test step of testing whether the foreign material includes the metal element at the position detected in the first test step. | 03-25-2010 |
| 20110080998 | Test Method and Test Device - To provide a method and device for testing the size and conductivity of a foreign material adhered to a substrate for a liquid crystal display device, there is provided a method of testing whether a foreign material including a metal element is adhered to a substrate for a liquid crystal display device, the method including a first test step of detecting the size and position of the foreign material adhered to the substrate and a next step of testing whether the foreign material includes the metal element at the position detected in the first test step. | 04-07-2011 |
Qian Cui, Ibaraki JP
| Patent application number | Description | Published |
|---|---|---|
| 20100216907 | ONE-PACKAGE TYPE TOOTH SURFACE COATING MATERIAL - [Problems] To provide a one-package type tooth surface coating material that is capable of forming, on the surface of a tooth, a cured film having not only a very high strength of adhesion to the tooth surface but also excellent properties such as long-term adhesion, long-term durability, dentinal tubule occlusion and aesthetic appearance, and that has excellent storage stability and can be stored in the form of one package. | 08-26-2010 |
Ying Cui, Saitama JP
| Patent application number | Description | Published |
|---|---|---|
| 20090036559 | POROUS MONODISPERSED PARTICLES AND METHOD FOR PRODUCTION THEREOF, AND USE THEREOF - To provide porous monodispersed particles obtained by preparing, as seed particles, poly(methyl methacrylate) particles or acrylic resin particles comprising 70% by mass or more of methyl methacrylate as a copolymerization component, swelling the seed particles 20 to 80 times the size of the original seed particles by mass using a swelling solution comprising an oil-soluble polymerization initiator and a monomer mixture containing 70% by mass or more of methyl methacrylate and 3 to 8% by mass of divinylbenzene, and polymerizing the monomers. The particles are porous particles with a diameter of the order of micrometers and a narrow particle-size distribution and are monodispersed. Colored monodispersed particles obtained by agglomerating a pigment in the porous monodispersed particles are monodispersed and spherical, and contain a large amount of pigment therein. | 02-05-2009 |
Zhenlong Cui, Tokyo JP
| Patent application number | Description | Published |
|---|---|---|
| 20090257458 | CLOCK SYNCHRONIZATION SYSTEM - A clock synchronization system includes a master node; a PSN (Packet Switched Network); and a slave node configured to synchronize a recovery clock signal in the slave node with a clock signal in the master node by using packets periodically received from the master node through the PSN. The slave node includes: a buffer section having a buffer and configured to temporarily store the packets received from the master node in the buffer, to monitor and output a buffer accumulation amount, and to output data of the packets from the buffer in response to the recovery clock signal; a maximum extracting section configured to receive the buffer accumulation amount from the buffer and to extract a maximum value for each time period from the buffer accumulation amount; a control section configured to generate a control voltage such that the maximum values from the maximum extracting section are held at a reference value; and a VCO (Voltage Controlled Oscillator) configured to adjust a frequency of the recovery clock signal based on the control voltage from the control section. | 10-15-2009 |
| 20100220612 | QUALITY MEASURING SYSTEM, QUALITY MEASURING APPARATUS, QUALITY MEASURING METHOD, AND PROGRAM - An exemplary object of the present invention lies in a point of providing a technology capable of measuring a transmission quality of an Ethernet network in order to utilize Ethernet as carrier-grade communication. The present invention includes an error bit number measurer for measuring the number of error bits that have occurred for a frame of Ethernet, being a target of monitoring, within a monitoring period, a transmitted bit number measurer for measuring the number of total transmitted bits of Ethernet frames that a device facing it has transmitted within the foregoing monitoring period, and a bit error rate operator for obtaining a bit error rate of a transmission path by employing a measurement result by the foregoing error bit number measurer and the foregoing transmitted bit number measurer. | 09-02-2010 |
| 20100309934 | CLOCK SYNCHRONIZATION SYSTEM, ITS METHOD AND PROGRAM - The clock synchronization accuracy between a master node and a slave node is stably measured. The slave node synchronizes its own clock with the clock of the master node by means of the packets transmitted from the master node. It reproduces the clock of the slave node by means of the transmitted packets, accumulates information on the transmitted packets and the clock of the slave node and performs clock synchronization on the basis of the accumulated information. | 12-09-2010 |
| 20110228834 | PACKET-FILTER-USED CLOCK SYNCHRONIZATION SYSTEM, APPARATUS, METHOD AND PROGRAM THEREOF - A clock synchronization system synchronizes a clock of a slave node with a clock of a master node. The master node includes a packet transmitting unit that transmits a packet including a time stamp (TS) to the slave node. The slave node includes: a packet receiving unit that receives the packet transmitted from the master node; a packet filter unit that calculates as a value of delay of the packet a difference between a TS on the clock of the slave node when the packet is received and the TS of the packet received, corrects the value of the delay of the packet or a threthold for the delay of the packet, and performs filter processing on the packet received from the packet receiving unit based on the value of the delay of the packet and the threshold for the delay of the packet; and a phase synchronization unit that outputs the clock of the slave node based on the TS included in the packet employed. | 09-22-2011 |
| 20120020232 | COMMUNICATION APPARATUS, COMMUNICATION SYSTEM AND COMMUNICATION METHOD - A communication apparatus including: a counter storage unit storing a reception counter value of the apparatus when a specific frame is received; a measurement unit measuring the number of frame losses occurring between the apparatus and the preceding apparatus on the basis of the reception counter value of the apparatus, a transmission counter value of a source apparatus of the specific frame included in the specific frame and the total number of frame losses between the source apparatus and the preceding apparatus of the apparatus, when the specific frame is received; a transmission unit transmitting the specific frame; and a frame control unit adding, to the specific frame, loss information associating the number of frame losses occurring between the apparatus and the preceding apparatus with an identifier of the apparatus and forwarding the specific frame to the transmission unit, when the frame loss occurs, and forwarding the specific frame to the transmission unit without adding the loss information to the specific frame, when no frame loss occurs. | 01-26-2012 |