Concetta
Concetta Beneduce, Zuerich CH
Patent application number | Description | Published |
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20080227647 | Current lead with high temperature superconductor for superconducting magnets in a cryostat - A cryostat assembly ( | 09-18-2008 |
Concetta Beninati, Messina IT
Patent application number | Description | Published |
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20110076301 | ANTIGENIC PROTEIN FRAGMENTS OF STREPTOCOCCUS PNEUMONIAE - Antigenic protein fragments of | 03-31-2011 |
Concetta Bubici, Chicago, IL US
Patent application number | Description | Published |
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20080247956 | IDENTIFICATION OF NOVEL FACTORS THAT BLOCK PROGRAMMED CELL DEATH OR APOPTOSIS BY TARGETING JNK - Methods and compositions for modulating apoptosis by acting on the c-Jun-N-terminal kinase (JNK) pathway and assays for the isolation of agents capable of modulating apoptosis, including modulators of the JNK pathway are disclosed. A method of modulating JNK pathway independent of Gadd46β is disclosed. Methods and compositions are presented for the preparation and use of novel therapeutic compositions for modulating diseases and conditions associated with elevated or decreased apoptosis. | 10-09-2008 |
Concetta Riccobene, Mountain View, CA US
Patent application number | Description | Published |
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20140169113 | Enhancing Memory Yield Through Memory Subsystem Repair - A memory system and a memory repair method for the memory system are disclosed. The method includes the steps of: organizing at least one repair block to serve as a shared repair resource for the plurality of memory blocks in the tiled memory; identifying a defective memory unit among the plurality of memory blocks in the tiled memory; identifying a replacement unit in the repair block for replacement of the defective memory unit; retrieving a set of memory blocks from the plurality of memory blocks in the tiled memory in response to a data access request, wherein the set of memory blocks retrieved containing the defective memory unit; retrieving the replacement unit from the repair block in response to the data access request; and replacing the defective memory unit in the set of memory blocks with the replacement unit. | 06-19-2014 |