| Patent application number | Description | Published |
|---|
| 20080282107 | Method and Apparatus for Repairing Memory - Methods and apparatuses are disclosed in which a repair instruction, such as from a tester, causes an integrated circuit undergoing testing to substitute defective locations of a first set of memory cells in the integrated circuit with a second set of memory cells in the integrated circuit, despite the repair instruction omitting the defective locations of the first set of memory cells of the integrated circuit. | 11-13-2008 |
| 20090016116 | Method of Programming and Erasing a Non-Volatile Memory Array - A method of processing an array of non-volatile memory cells to program or erase the same, by applying a voltage to the same through a program and verify pulse application circuit. The process includes a first step of selecting a voltage to be applied. Then, the maximum number of memory cells that can be processed simultaneously is determined, based on the selected voltage and characteristics of the memory cells and the circuit. The array is divided into processing groups, each group having a number of cells less than or equal to the maximum determined number. Finally, the voltage is applied to the cells. | 01-15-2009 |
| 20090021994 | MEMORY AND METHOD FOR PROGRAMMING THE SAME - A method for programming a memory, which includes multiple multi-level cells each having a left half cell and a right half cell, includes the following steps. First, a target address corresponding to 2n-group data to be stored is provided, wherein n is a positive integer. Next, the 2n-group data is sequentially programmed into the multi-level cells based upon the target address in a programming loop so that the data stored in the left half cells and the data stored in the right half cells are from different groups of the 2n-group data. | 01-22-2009 |
| 20090046521 | Memory structure, programming method and reading method therefor, and memory control circuit thereof - The memory structure improves a sensing accuracy of memory cells by dividing the main array into a number of memory units and sensing memory cells of each memory units with an appropriate set of reference currents. Each of the memory units corresponds to a reference group bit value, which indicates the appropriate set of reference currents. The appropriate set of reference currents is chosen from a number of sets of selective reference currents according to the threshold voltage distribution of each of the memory units. Thus each of the memory units of the memory structure of the present invention is sensed with its own appropriate set of reference currents correctly, and the improvement of sensing accuracy is therefore achieved. | 02-19-2009 |
| 20090063918 | APPARATUS AND METHOD FOR DETECTING WORD LINE LEAKAGE IN MEMORY DEVICES - A method for detecting word line leakage in a memory device includes coupling a first plurality of word lines in the memory device to a voltage source while grounding a second plurality of word lines. Each of the second plurality of word lines is adjacent to a corresponding one of the first plurality of word lines. The method includes waiting for a period of time to allow the word lines to reach a predetermined read voltage level. The method also includes decoupling the first plurality of word lines from the voltage source and waiting for a second predetermined period of time to allow the first plurality of word lines to discharge. The method further includes sensing a current associated with the word lines, and comparing the current with a predetermined reference current which is selected for identifying a word line leakage condition associated with the first plurality of word lines. | 03-05-2009 |
| 20090121780 | MULTIPLE-STAGE CHARGE PUMP WITH CHARGE RECYCLE CIRCUIT - A multiple-stage charge pump circuit comprises first and second pump capacitors, first and second transfer circuits, first and second driving circuits, and a charge recycle circuit. The first pump capacitor, the first transfer circuit, and the first driving circuit form a first stage circuit and the second pump capacitor, the second transfer circuit, and the second driving circuit form a second stage circuit. The first and the second stage circuits operate 180 degree out of phase with each other. The charge recycle circuit transfers the charge at the second end of the first pump capacitor to the second end of the second pump capacitor in a first time interval, and transferring the charge at the second end of the second pump capacitor to the second end of the first pump capacitor in a second time interval. | 05-14-2009 |
| 20090147799 | CIRCUIT AND METHOD FOR TRANSMITTING DATA STREAM - A circuit including a first data selection circuit and a second data selection circuit for transmitting a data stream is provided. The first data selection circuit having first controllable channels turns on a first operating channel being one of the first controllable channels in an odd-numbered period and turns off the first controllable channels in an even-numbered period adjacent to the odd-numbered period for transmitting a first bit datum of the data stream. The second data selection circuit having second controllable channels turns off the second controllable channels in the odd-numbered period and turns on a second operating channel being one of the second controllable channels in the even-numbered period for transmitting a second bit datum of the data stream. | 06-11-2009 |
| 20090201731 | Method and Apparatus for Accessing Memory With Read Error By Changing Comparison - In response to a disagreement between a previously generated check code associated with previously programmed data bits and a more recently generated check code generated in response to a read command, the comparison process is changed, between i) a value representing accessed data and ii) a reference applied to such accesses to distinguish between logical levels. For example, the read bias arrangement and/or a read reference of a memory integrated circuit is changed. | 08-13-2009 |
| 20090273999 | SENSE AMPLIFIER AND DATA SENSING METHOD THEREOF - A data sensing method for sensing data stored in first and second memory cells includes the steps of: setting a first voltage according to a bit-line voltage corresponding to the first memory cell in response to an enabled level of a first clock signal; providing the first voltage as a sensing voltage in response to a disabled level of the first clock signal; comparing the sensing voltage with a reference voltage to generate a first output voltage; setting a second voltage according to a bit-line voltage corresponding to the second memory cell in response to an enabled level of a second clock signal, a phase difference between the first and second clock signals being 180 degrees; providing the second voltage as the sensing voltage in response to a disabled level of the second clock signal; and comparing the sensing voltage with the reference voltage to generate a second output voltage. | 11-05-2009 |
| 20090296506 | SENSE AMPLIFIER AND DATA SENSING METHOD THEREOF - A data sensing method for sensing storage data stored in a memory cell includes the steps of: biasing a sensing node and a reference node to a first voltage in response to a first control signal; discharging the sensing node and the reference node via the memory cell and a reference memory cell, respectively; enabling a latch circuit to amplify a voltage difference between the sensing node and the reference node. | 12-03-2009 |
| 20090310423 | METHOD OF PROGRAMMING AND ERASING A NON-VOLATILE MEMORY ARRAY - A method of processing an array of non-volatile memory cells to program or erase the same, by applying a voltage to the same through a program and verify pulse application circuit. The process includes a first step of selecting a voltage to be applied. Then, the maximum number of memory cells that can be processed simultaneously is determined, based on the selected voltage and characteristics of the memory cells and the circuit. The array is divided into processing groups, each group having a number of cells less than or equal to the maximum determined number. Finally, the voltage is applied to the cells. | 12-17-2009 |
| 20100007380 | LEVEL SHIFTER AND LEVEL SHIFTING METHOD THEREOF - A level shifter includes a first level-switching device and a second level-switching device. The first level-switching device includes a first switch device, a second switch device, a first control switch and a third switch device. The first switch device is for receiving the input voltage and outputting a first voltage. The second switch device is coupled to the first switch device for outputting a first operational voltage as the output voltage according to the first voltage. The first control switch is coupled to the first switch device for receiving the first voltage. The third switch device is coupled between the first control switch and the first operational voltage and controlled by the output voltage. The second level-switching device is coupled to the first level-switching device for receiving the input voltage and accordingly outputting a second operational voltage as the output voltage. | 01-14-2010 |
| 20100054045 | Memory and Reading Method Thereof - A memory includes many memory regions each including a target memory cell, a source line, a bit line and a reading control circuit. The source line is coupled to a first terminal of the target memory cell. The bit line is coupled to a second terminal of the target memory cell. The reading control circuit is for selectively applying a working voltage to the source line. | 03-04-2010 |
| 20100061174 | Y-DECODER AND DECODING METHOD THEREOF - AY-decoder includes a selection unit and a Y-MUX. The selection unit is coupled to the memory array for selecting the column lines. The Y-MUX is coupled to the selection unit for supplying a voltage to the selected column line. The Y-MUX includes a first switch, a second switch, a third switch and a fourth switch coupled in parallel. The first switch and the second switch are respectively for receiving a first shielding voltage and a second shielding voltage. The third switch and the fourth switch are respectively for receiving a first sensing voltage and a second sensing voltage. | 03-11-2010 |
| 20100082880 | PRE-CODE DEVICE, AND PRE-CODE SYSTEM AND PRE-CODING METHOD THEREROF - A pre-code device includes firstly memory circuit, an address decoder, and an alternative logic circuit. The first memory circuit includes a number of memory blocks and at east a replacing block. The memory blocks are pointed by a number of respective physical addresses. The replacing block is pointed by a replacing address. The address decoder decodes an input address to provide a pre-code address. The alternative logic circuit looks up an address mapping table, which maps defect physical address among the physical addresses to the replacing address, to map the pre-code address to the replacing address when the pre-code address corresponds to the defect physical address. The alternative logic circuit correspondingly pre-codes the pre-code data to the replacing block. | 04-01-2010 |
| 20100103738 | MEMORY AND OPERATING METHOD THEREOF - A method of programming data stored in a memory, which comprises a number of user-defined blocks, a number of manufacture-defined blocks, and an information block, includes the following steps. A programming address pointing to a user-defined block in the memory and programming data is obtained. After that, it is determined whether there is an empty manufacture-defined block among a number of user-defined blocks in the memory. If so, an information block in the memory is programmed to store the programming address and a replacing address pointing to the empty manufacture-defined block. The empty manufacture-defined block is programmed to store the programming data. | 04-29-2010 |
| 20100149893 | METHOD AND APPARATUS FOR PROTECTION OF NON-VOLATILE MEMORY IN PRESENCE OF OUT-OF-SPECIFICATION OPERATING VOLTAGE - A method and apparatus for protecting non-volatile memory is described. A write command is processed only when an operating voltage is between specified operating limits and when a data pattern stored in the non-volatile memory is repeatedly read successfully. | 06-17-2010 |
| 20100182834 | TWISTED DATA LINES TO AVOID OVER-ERASE CELL RESULT COUPLING TO NORMAL CELL RESULT - Over-erasure induced noise on a data line in a nonvolatile memory that couples into an adjacent data line is mitigated by using twisted data lines and differential sensing amplifiers. Noise coupled into data lines is compensated by similar noise coupled into reference data lines and cancelled in the differential sensing amplifiers. | 07-22-2010 |
| 20100182842 | Sense Amplifier and Data Sensing Method Thereof - A data sensing method for sensing data stored in first and second memory cells includes the steps of: setting a first voltage according to a bit-line voltage corresponding to the first memory cell in response to an enabled level of a first clock signal; providing the first voltage as a sensing voltage in response to a disabled level of the first clock signal; comparing the sensing voltage with a reference voltage to generate a first output voltage; setting a second voltage according to a bit-line voltage corresponding to the second memory cell in response to an enabled level of a second clock signal, a phase difference between the first and second clock signals being 180 degrees; providing the second voltage as the sensing voltage in response to a disabled level of the second clock signal; and comparing the sensing voltage with the reference voltage to generate a second output voltage. | 07-22-2010 |
| 20100301918 | Level Shifter and Level Shifting Method Thereof - A level shifter includes a first level-switching device and a second level-switching device. The first level-switching device includes a first switch device, a second switch device, a first control switch and a third switch device. The first switch device is for receiving the input voltage and outputting a first voltage. The second switch device is coupled to the first switch device for outputting a first operational voltage as the output voltage according to the first voltage. The first control switch is coupled to the first switch device for receiving the first voltage. The third switch device is coupled between the first control switch and the first operational voltage and controlled by the output voltage. The second level-switching device is coupled to the first level-switching device for receiving the input voltage and accordingly outputting a second operational voltage as the output voltage. | 12-02-2010 |
| 20110016291 | Serial Memory Interface for Extended Address Space - An integrated circuit memory device has a memory array and control logic with at least a first addressing mode in which the instruction includes a first instruction code and an address of a first length; and a second addressing mode in which the instruction includes the first instruction code and an address of a second length. The first length of the address is different from the second length of the address. | 01-20-2011 |
| 20110019456 | SENSE AMPLIFIER WITH SHIELDING CIRCUIT - A sense amplifier comprises a sense node, a reference node, a memory input stage circuit, a reference input stage circuit, an output stage circuit, and a shielding circuit. The memory input stage circuit comprises first input node for maintaining a first sense voltage established by a cell current and establishes a second sense voltage on the sense node in response to the first sense voltage. The reference input stage circuit comprises an output node and a second input node, which is for maintaining a first reference voltage established by the reference current and establishes a second reference voltage on the reference node in response to the first reference voltage. The output stage circuit obtains a sense result in response to the second reference voltage and the second sense voltage. The first shielding circuit shields the output node from being interfered with the second reference voltage on the reference node. | 01-27-2011 |
| 20110019473 | MEMORY ARRAY AND METHOD OF OPERATING ONE OF A PLURALITY OF MEMORY CELLS - An embodiment of the invention provides a memory array including a plurality of bit lines, a plurality of memory cells and a device. Each of the plurality of memory cells has a first node, a second node and a third node, wherein the third node is coupled to one of the plurality of bit lines. The device couples the plurality of bit lines together to form a common node for one of the plurality of memory cells. | 01-27-2011 |
| 20110019487 | APPARATUS AND METHOD FOR DETECTING WORD LINE LEAKAGE IN MEMORY DEVICES - According to an embodiment of the present invention, a method for detecting word line leakage in a memory device includes coupling a first word line in the memory device to a voltage source while coupling a second word line in the memory device to a ground level voltage. Next, the first word line is decoupled from the voltage source. The method also includes comparing a current of the first word line with a predetermined reference current for determining a leakage condition of the word line. | 01-27-2011 |
| 20110060962 | Method and Apparatus for Accessing Memory With Read Error By Changing Comparison - In response to a disagreement between a previously generated check code associated with previously programmed data bits and a more recently generated check code generated in response to a read command, the comparison process is changed, between i) a value representing accessed data and ii) a reference applied to such accesses to distinguish between logical levels. For example, the ratio of resistances characterizing input circuits of a sense amplifier and/or the read bias arrangement and/or a read reference of a memory integrated circuit is/are changed. | 03-10-2011 |
| 20110069544 | METHOD AND APPARATUS FOR PROGRAMMING A MULTI-LEVEL MEMORY - A method of programming a memory device comprising a plurality of memory cells may include verifying a first memory cell targeted to a first level with a first preliminary voltage of a first program phase (PPV | 03-24-2011 |
| 20110069571 | Word Line Decoder Circuit Apparatus and Method - One embodiment of the technology is an apparatus, a memory integrated circuit. The memory integrated circuit has word line address decoding circuitry. The circuit allows selection of a single word line to have an erase voltage. A decoder circuit includes an inverter and logic. The inverter has an input, and an output controlling a word line to perform the erase operation. A voltage range of the input extends between a first voltage reference and a second voltage reference. Examples of voltages references are a voltage supply and a ground. In some embodiments, this wide voltage range results from the input being free of a threshold voltage drop from preceding circuitry limiting the voltage range of the input. The logic of the decoder is circuit is controlled by a word line address to determine a value of the input of the inverter during the erase operation. | 03-24-2011 |
| 20110122721 | Y-Decoder and Decoding Method Thereof - A Y-decoder includes a selection unit and a Y-MUX. The selection unit is coupled to the memory array for selecting the column lines. The Y-MUX is coupled to the selection unit for supplying a voltage to the selected column line. The Y-MUX includes a first switch, a second switch, a third switch and a fourth switch coupled in parallel. The first switch and the second switch are respectively for receiving a first shielding voltage and a second shielding voltage. The third switch and the fourth switch are respectively for receiving a first sensing voltage and a second sensing voltage. | 05-26-2011 |
| 20110133804 | CLOCK INTEGRATED CIRCUIT - The clock circuit of an integrated circuit operates with variations such as temperature, ground noise, and power noise. Various aspects of an improved clock integrated circuit address one or more of the variations in temperature, ground noise, and power noise. | 06-09-2011 |
| 20110138213 | Clock Integrated Circuit - The clock circuit of an integrated circuit operates with variations such as temperature, ground noise, and power noise. Various aspects of an improved clock integrated circuit address one or more of the variations in temperature, ground noise, and power noise. | 06-09-2011 |
| 20110138216 | Clock Integrated Circuit - The clock circuit of an integrated circuit operates with variations such as temperature, ground noise, and power noise. Various aspects of an improved clock integrated circuit address one or more of the variations in temperature, ground noise, and power noise. | 06-09-2011 |
| 20110149669 | Sense Amplifier and Data Sensing Method Thereof - A data sensing method for sensing storage data stored in a memory cell includes the steps of: biasing a sensing node and a reference node to a first voltage in response to a first control signal; discharging the sensing node and the reference node via the memory cell and a reference memory cell, respectively; enabling a latch circuit to amplify a voltage difference between the sensing node and the reference node. | 06-23-2011 |
| 20110161750 | Pre-Code Device, and Pre-Code System and Pre-Coding Method Thereof - A pre-code device includes firstly memory circuit, an address decoder, and an alternative logic circuit. The first memory circuit includes a number of memory blocks and at east a replacing block. The memory blocks are pointed by a number of respective physical addresses. The replacing block is pointed by a replacing address. The address decoder decodes an input address to provide a pre-code address. The alternative logic circuit looks up an address mapping table, which maps defect physical address among the physical addresses to the replacing address, to map the pre-code address to the replacing address when the pre-code address corresponds to the defect physical address. The alternative logic circuit correspondingly pre-codes the pre-code data to the replacing block. | 06-30-2011 |
