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Cho, Hsinchu City
Chun-Ming Cho, Hsinchu City TW
| Patent application number | Description | Published |
|---|---|---|
| 20100083074 | Block Code Decoding Method And Device Thereof - A block code decoding method and device thereof are provided. The procedure of the bounded distance decoding is simplified and the number of correlation calculating is reduced via a set of pre-established XOR masks. The decoding method includes: picking up the source code part of the received message; executing a XOR calculating for the source code part with the XOR masks, and encoding the results thereof to produce a set of compared codes; executing a correlation calculating for the set of compared codes and the received message; and determining a compared code having the maximum correlation result as the decision. | 04-01-2010 |
Hsun-Jung Cho, Hsinchu City TW
| Patent application number | Description | Published |
|---|---|---|
| 20100161204 | Method for identification of traffic lane boundary - The invention provides a method for identification of traffic lane boundary. Firstly the microwave signal is received, and the noise reduction is treated for the microwave signal. Then the frequency domain information is employed to calculate the legal set of closed interval, in order to form the frequency span information. Finally, the probability density function model is employed to calculate the frequency span information in order to identify the traffic lane boundary. | 06-24-2010 |
Shu-Ying Cho, Hsinchu City TW
| Patent application number | Description | Published |
|---|---|---|
| 20090195327 | TRANSMITTING RADIO FREQUENCY SIGNAL IN SEMICONDUCTOR STRUCTURE - A semiconductor device for transmitting a radio frequency signal along a signal line includes a signal line that extends along a principal axis. On one side of the signal line is a first dielectric, and on the opposite side of the signal line is a second dielectric. First and second ground lines are proximate to the first and second dielectrics, respectively, and the ground lines are approximately parallel to the signal line. The device has a transverse cross-section that varies along the principal axis. | 08-06-2009 |
Wen-Hao Cho, Hsinchu City TW
| Patent application number | Description | Published |
|---|---|---|
| 20090098307 | MANUFACTURING METHOD FOR FAR-INFRARED IRRADIATING SUBSTRATE - A manufacturing method for a far-infrared irradiating substrate is provided. The manufacturing method comprises steps of providing a substrate, providing a far-infrared irradiating material and evaporating the far-infrared irradiating material to form a thin film onto the substrate. The far-infrared irradiating substrate provided by the present invention not only has a high emission coefficient of far-infrared ray, but also do not cause a potential exposure of an ionizing radiation. | 04-16-2009 |
| 20090246514 | ANTIREFLECTION STRUCTURE AND MANUFACTURING METHOD THEREOF - An antireflection structure is provided. The antireflection structure includes a substrate layer having a substrate refractive index; a first inorganic layer disposed on the substrate layer and having a first refractive index different from the substrate refractive index, where a thickness of the first inorganic layer is in a range of 1 to 40 nm; and a second inorganic layer disposed on the first inorganic layer and having a second refractive index different from the first refractive index. | 10-01-2009 |
| 20090246553 | REFLECTIVE FILM AND METHOD FOR MANUFACTURING THE SAME - A reflective film is provided. The reflective film includes a substrate; a middle layer disposed on the substrate and mainly having a crystallized transition metal; and a metal layer disposed on the middle layer. | 10-01-2009 |
Yi Fang Cho, Hsinchu City TW
| Patent application number | Description | Published |
|---|---|---|
| 20090114714 | RFID REAL-TIME INFORMATION SYSTEM ACCOMMODATED TO SEMICONDUCTOR SUPPLY CHAIN - This invention provides an RFID real-time information system accommodated to a semiconductor supply chain for exchanging real-time information. The RFID real-time information system is characterized by comprising an RFID middleware module for generating a stock and logistic information corresponding to a plurality of carriers and wafers from a tag information; a manufacturing information module for storing an object information corresponding to the plurality of wafers; a real-time information module for integrating the RFID middleware module with the manufacturing information module to generate real-time information corresponding to the plurality of wafers and carriers; and a business-to-business (B2B) e-commerce module comprising a plurality of B2B servers respectively disposed in vendors in the semiconductor supply chain for connecting and exchanging the real-time information through a standard protocol of e-commerce. | 05-07-2009 |
| 20090237098 | WAFER TESTING SYSTEM INTEGRATED WITH RFID TECHNIQUES AND THESTING METHOD THEREOF - This invention provides a wafer testing system and testing method thereof. The wafer testing system comprises a wafer storage section, a prober, a tester, an RFID middleware unit, an EDA system and an MES system. The wafer storage section stores a multiplicity of carriers, each of which is provided with at least a RFID tag. The prober comprises a RFID reader to read a tag information. The tester sends a test signal to the prober for implementing the wafer test so as to generate a test result and calls an interface program to convert the test result into a file conformed with a specific data format. The RFID middleware unit receives the tag information and calls related applications to process the tag information so as to generate a wafer information. The EDA system receives the file of the specific data format converted from the interface program and calculates thereof to generate a wafer yield information after wafer test. The MES system integrates the wafer information from the RFID middleware unit with the yield information from the EDA system so as to allow monitoring the wafer manufacturing process and testing yield rate in a real-time manner. | 09-24-2009 |