Patent application number | Description | Published |
20090059668 | Virtual ground array memory and programming method thereof - A method for programming a virtual ground array memory, which includes a first cell and a second cell adjacent to first cell, includes the following steps. First, the first cell is selected as a target cell, wherein the second cell has been programmed to have data. Next, the second cell is read and the data is recorded in a register. Then, the target cell is programmed. Next, a program verifying operation is performed on the second cell. Afterwards, the data recorded in the register is programmed back to the second cell when the program verifying operation performed on the second cell fails. | 03-05-2009 |
20090059698 | METHOD FOR TESTING MEMORY - A method for testing a memory includes the following steps. First, data is read from the memory and stored to a first temporary memory. Meanwhile, expected data corresponding to the data from the memory is written into a second temporary memory from a tester. Thereafter, the data in the first temporary memory and the expected data in the second temporary memory are compared with each other to judge whether the memory has an enough operation window. | 03-05-2009 |
20090154233 | NAND TYPE MEMORY AND PROGRAMMING METHOD THEREOF - A memory includes many memory regions. The memory regions have multiple multi-level cells. Each memory region includes a first bit line, a second bit line, a data buffer and a protecting unit. The first bit line is coupled to a first column of the multi-level cells. The second bit line is coupled to a second column of the multi-level cells. The data buffer is coupled to the first bit line and the second bit line and for storing data to be programmed into the multi-level cells. The protecting unit is coupled to the first bit line, the second bit line and the data buffer and is for preventing a programming error from occurring. | 06-18-2009 |
20090201060 | CLOCK SYNCHRONIZING CIRCUIT - A clock synchronizing circuit applied in a SMD block is provided. The clock synchronizing circuit includes a number of stages of clock synchronizing units. The clock synchronizing circuit can achieve the purpose of clock synchronizing by using a novel circuit design of the forward delay unit, the mirror control unit or the backward delay unit in each stage of clock synchronizing unit or by using a short-pulse generation circuit to generate a short pulse for triggering out an output clock of each stage of forward delay unit. | 08-13-2009 |
20090201725 | MULTI-LEVEL MEMORY CELL PROGRAMMING METHODS - A method for programming a plurality of multi-level memory cells described herein includes iteratively changing a bias voltage applied to a first memory cell to program the first memory cell to a first threshold state and detecting when the first cell reaches a predetermined threshold voltage. The bias voltage applied to the first memory cell upon reaching the predetermined threshold voltage is recorded. A second memory cell is programmed to a second threshold state by applying an initial bias voltage to the second memory cell which is function of the recorded bias voltage. | 08-13-2009 |
20110085380 | Method of Programming a Memory - A method of programming a memory, wherein the memory includes many memory regions having multiple multi-level cells. Each memory region includes a first bit line, a second bit line, a data buffer and a protecting unit. The protecting unit, coupled to the first and second bit lines, and the data buffer, prevents a programming error from occurring. In an embodiment of the programming method, corresponding data are inputted to the data buffers respectively. The data corresponding to an n | 04-14-2011 |
20110128786 | MEMORY DEVICE - A memory device includes a memory sector including a memory sector, a row of select transistors and a number of drivers. The memory sector includes a plurality of word lines each couples to a plurality of memory cells. The row of select transistors select the memory sector and separate the memory sector from an immediately adjacent memory sector in the memory device. Each of the number of drivers is coupled to one of the plurality of word lines, wherein a first one of the drivers is coupled to a first one of the word lines to receive a first control signal to conduct the first word line and a voltage source, and a second one of the drivers is coupled to a second one of the word lines to receive a second control signal to disconnect the second word line from the voltage source. | 06-02-2011 |
20110149675 | Local Word Line Driver - A two transistor word line driver is disclosed. An example disclosed word line driver is simplified with common signals on the gates of the p-type and the n-type transistors. An example disclosed word line driver consumes less power by applying a negative voltage to a word line driver selected from multiple word line drivers. | 06-23-2011 |
20120075943 | Method and Apparatus for Memory Repair With Redundant Columns - A first redundant column is used to repair multiple defects in an array of memory cells. The defects include at least a first defect and a second defect in different main columns of a plurality of main columns in the array. However, all of the multiple defects repaired by the first redundant column are not required to be in different main columns. The array is arranged into a plurality of rows accessed by row addresses and the plurality of main columns accessed by column addresses. | 03-29-2012 |
20120210193 | MEMORY AND METHOD FOR CHECKING READING ERRORS THEREOF - A method for checking reading errors of a memory includes the following steps. A first data fragment is received. A first count index according to the first data fragment is generated, wherein the first count index is corresponding to a quantity of one kind of binary value in the first data fragment. The first data fragment is written into the memory. The first data fragment is read from the memory as a second data fragment. A second count index is generated according to the second data fragment. The first count index is compared with the second count index. | 08-16-2012 |
20130242665 | Method and Apparatus for Shortened Erase Operation - A nonvolatile memory array has a multiple erase procedures of different durations. A block of memory cells of the array can be erased by one of the different erase procedures. | 09-19-2013 |
20140062543 | DYNAMIC DRIVER CIRCUIT - A circuit usable as a word line driver includes a driver that switches in response to a voltage on a control node, and a circuit supplying a voltage to the control node. The circuit that applies a voltage to control node provides a first static current tending to pull the control node up to a first source voltage, and provides a fighting current pulse in response to a signal selecting the driver to pull the control node down to a second source voltage, overcoming the first static current. In addition, a circuit provides a pull-up boost current on a transition of the signal selecting the driver that turns off the fighting current, and applies a boosting current pulse to the control node to assist pulling the control node quickly to the first source voltage. | 03-06-2014 |