Patent application number | Description | Published |
20140035664 | VOLTAGE PROVIDING CIRCUIT - A voltage providing circuit includes a first circuit, a second circuit coupled with the first circuit, and a third circuit coupled with the second circuit. The first circuit is configured to receive a first input signal and to generate a first output signal. The second circuit is configured to receive the first input signal and the first output signal as inputs and to generate a second output signal. The third circuit is configured to receive the second output signal and to generate an output voltage. | 02-06-2014 |
20140036608 | TRACKING SIGNALS IN MEMORY WRITE OR READ OPERATION - A signal generating circuit includes a first circuit, a tracking circuit, and a delay circuit coupled with the first circuit and the tracking circuit. The first circuit is configured to receive a first clock signal and an output signal from an output of the delay circuit and to generate a second clock signal and at least one first tracking signal. The tracking circuit is configured to receive the at least one first tracking signal and to generate a second tracking signal. The delay circuit is configured to receive the second clock signal and the second tracking signal and to generate the output signal. | 02-06-2014 |
20140084374 | CELL DESIGN - One or more techniques or systems for designing a cell are provided. The cell generally includes one or more transistors, such as a pass gate transistor, a pull up transistor, or a pull down transistor, respectively associated one or more gate to gate distances. In some embodiments, a second gate to gate distance is selected based on a first gate to gate distance. For example, the first gate to gate distance and the second gate to gate distance are associated with a first transistor. In another example, the first gate to gate distance is associated with a first transistor and the second gate to gate distance is associated with a second transistor. In this manner, a cell design is provided to improve a static noise margin (SNM) or a write margin (WM) for the cell, for example. | 03-27-2014 |
20140269110 | ASYMMETRIC SENSING AMPLIFIER, MEMORY DEVICE AND DESIGNING METHOD - A sensing amplifier for a memory device includes first and second nodes, an input device and an output device. The memory device includes first and second bit lines, and at least one memory cell coupled to the bit lines. The first and second nodes are coupled to the first and second bit lines, respectively. The input device is coupled to the first and second nodes and generates a first current pulling the first node toward a predetermined voltage in response to a first datum read out from the memory cell, and to generate a second current pulling the second node toward the predetermined voltage in response to a second datum read out from the memory cell. The output device is coupled to the first node to output the first or second datum read out from the memory cell. The first current is greater than the second current. | 09-18-2014 |
20140269114 | CIRCUIT FOR MEMORY WRITE DATA OPERATION - A pulsed dynamic LCV circuit for improving write operations for SRAM. The pulsed dynamic LCV circuit includes voltage adjustment circuitry having a plurality of selectable reduced supply voltages and timing adjustment circuitry having a plurality of selectable logical state transition timings for adjustably controlling the voltage and timing of a transition from a selected reduced supply voltage back to a nominal supply voltage. The voltage adjustment circuitry has a plurality of selectable transistors that when individually selected have a cumulative effect to pull the reduced supply voltage down further. The timing adjustment circuitry has a plurality of selectable multiplexers that when individually selected for a delayed voltage transition have a cumulative effect to delay return of voltage supplied to SRAM from a reduced supply voltage to a nominal supply voltage. | 09-18-2014 |
20150092502 | CIRCUIT TO GENERATE A SENSE AMPLIFIER ENABLE SIGNAL - A circuit includes a tracking bit line, a tracking unit connected to the tracking bit line and a detection unit. The tracking unit is configured to receive a first control signal and configured to selectively charge or discharge a voltage on the tracking bit line in response to the first control signal. The detection unit is coupled to the tracking bit line and configured to generate a sense amplifier enable (SAE) signal in response to the voltage level on the tracking bit line. | 04-02-2015 |
20150102853 | WAKE UP BIAS CIRCUIT AND METHOD OF USING THE SAME - A wake up circuit includes a bias signal control block configured to receive a sleep signal and to generate a plurality of bias control signals. The wake up circuit further includes a bias supply block configured to receive each bias control signal of the plurality of bias control signals and to generate a header bias signal. The bias supply block includes a first bias stage configured to receive a first bias control signal of the plurality of bias control signals, and to control the header bias signal to be equal to a first voltage. The bias supply block further includes a second bias stage configured to receive a second bias control signal of the plurality of bias control signals, and to control the header bias signal to be equal to a second voltage different from the first voltage. The wake up circuit further includes a header configured to receive the header bias signal, and to selectively connect a supply voltage to a load based on the header bias signal. | 04-16-2015 |
20150138902 | THREE-DIMENSIONAL (3-D) WRITE ASSIST SCHEME FOR MEMORY CELLS - An integrated circuit that includes an array of memory cells and an array of write logic cells. The integrated circuit also includes a write address decoder comprising a plurality of write outputs. The array of write logic cells is electrically connected to the plurality of write outputs. The array of write logic cells is electrically connected to the array of memory cells. The array of write logic cells is configured to set an operating voltage of the memory cells. | 05-21-2015 |