Patent application number | Description | Published |
20110037631 | DAC CALIBRATION - Mechanisms to calibrate a digital to analog converter (DAC) of an SDM (sigma delta modulator) are disclosed. An extra DAC element in addition to the DAC is used to function in place of a DAC element under calibration. A signal (e.g., a random sequence of −1 and +1) is injected to the DAC element under calibration, and the estimated error and compensation are acquired. | 02-17-2011 |
20110037632 | ADC CALIBRATION - An analog to digital convertor (ADC) includes a plurality of comparators one of which is referred to as an auxiliary comparator (e.g., comparator “Aux”). This comparator Aux is calibrated in the background while other comparators function as usual. Once having been calibrated, the comparator Aux replaces a first comparator, which becomes a new comparator Aux, is calibrated, and replaces the second comparator. This second comparator becomes the new comparator Aux, is calibrated, and replaces the third comparator, etc., until all comparators are calibrated. In effect, at any one point in time, a comparator may be calibrated as desire while other comparators and thus the ADC are operating as usual. | 02-17-2011 |
20120133536 | DAC CALIBRATION - Mechanisms to calibrate a digital to analog converter (DAC) of an SDM (sigma delta modulator) are disclosed. An extra DAC element in addition to the DAC is used to function in place of a DAC element under calibration. A signal (e.g., a random sequence of −1 and +1) is injected to the DAC element under calibration, and the estimated error and compensation are acquired. | 05-31-2012 |
20120212361 | SWITCHED-CAPACITOR CIRCUIT WITH LOW SIGNAL DEGRADATION - A switched-capacitor circuit is disclosed. The switched-capacitor circuit includes a comparator having a first and second input, a first and second sampling capacitor, and a first and second switching circuitry. The first switching circuitry charges the first and second sampling capacitor with an input signal. The second switching circuitry selectively couples the first sampling capacitor with a reference voltage and selectively couples the second sampling capacitor and the first and second input of the comparator to a common voltage. The comparator performs a compare of the input signals against the reference voltage, and outputs a signal. | 08-23-2012 |
20120249351 | ADC CALIBRATION - An analog-to-digital converter (ADC) including a plurality of comparators connected to the ADC. The ADC further includes a first pair of terminals and a second pair of terminals connected to each of the plurality of comparators. The ADC further includes a first pair of switches coupled to each of the first pair of terminals and a second pair of switches coupled to each of the second pair of terminals, where the first and second pair of switches are configured to alternate a corresponding comparator between normal operation and a calibration configuration. Comparators other than the corresponding comparator are configured for normal operation if the corresponding comparator is configured to be calibrated. | 10-04-2012 |
20130015876 | APPARATUS AND METHOD FOR MEASURING DEGRADATION OF CMOS VLSI ELEMENTSAANM LAI; Fang-Shi JordanAACI Chia YiAACO TWAAGP LAI; Fang-Shi Jordan Chia Yi TWAANM LU; Chih-ChengAACI Tainan CityAACO TWAAGP LU; Chih-Cheng Tainan City TWAANM LIN; Yung-FuAACI Hsinchu CityAACO TWAAGP LIN; Yung-Fu Hsinchu City TWAANM HSUEH; Hsu-FengAACI Tainan CityAACO TWAAGP HSUEH; Hsu-Feng Tainan City TWAANM CHANG; Chin-HaoAACI Hsinchu CityAACO TWAAGP CHANG; Chin-Hao Hsinchu City TWAANM WENG; Cheng YenAACI Hsinchu CityAACO TWAAGP WENG; Cheng Yen Hsinchu City TWAANM MHALA; Manoj M.AACI HsinchuAACO TWAAGP MHALA; Manoj M. Hsinchu TW - The reliability of an integrated circuit is inferred from the operational characteristics of sample metal oxide semiconductor (MOS) devices switchably coupled to drain/source bias and gate input voltages that are nominal, versus voltage and current conditions that elevate stress and cause temporary or permanent degradation, e.g., hot carrier injection (HCI), bias temperature instability (BTI, NBTI, PBTI), time dependent dielectric breakdown (TDDB). The MOS devices under test (preferably both PMOS and NMOS devices tested concurrently or in turn) are configured as current sources in the supply of power to a ring oscillator having cascaded inverter stages, thereby varying the oscillator frequency as a measure of the effects of stress on the devices under test, but without elevating the stress applied to the inverter stages. | 01-17-2013 |
20130141260 | PIPELINE ANALOG-TO-DIGITAL CONVERTER - A pipelined ADC includes a first, second, and third pairs of comparators. The first pair of comparators compare an input voltage to a first positive reference voltage and to a first negative reference voltage. The second pair of comparators compare the input voltage to a second positive reference voltage and to a second negative reference voltage. Each comparator of the first and second pairs of comparators outputs a digital signal to an encoder. A third pair of comparators compares the input voltage to a third positive reference voltage and to a third negative reference voltage, and a comparator compares the input voltage to ground. The comparator and each comparator of the third pair of comparators is configured to output respective digital signals to an encoder. A multiplying digital-to-analog converter outputs a voltage based on the input voltage, an output from the encoder, and an output of the random number generator. | 06-06-2013 |
20150097710 | ADC CALIBRATION - An analog-to-digital converter (ADC) includes a plurality of comparators connected to the ADC. The ADC further includes a plurality of switches, wherein switches connected to a corresponding comparator of the plurality of comparators are configured to alternate the corresponding comparator between normal operation and a calibration configuration. The ADC further includes at least one comparator of the plurality of comparators other than the corresponding comparator is configured for normal operation if the corresponding comparator is configured for calibration. | 04-09-2015 |